公开(公告)号：US07534999B2

公开(公告)日：2009-05-19

申请号：US11587031

申请日：2004-12-21

申请人： Shushi Suzuki ,  Wang-Jae Chun ,  Kiyotaka Asakura ,  Masaharu Nomura

发明人： Shushi Suzuki ,  Wang-Jae Chun ,  Kiyotaka Asakura ,  Masaharu Nomura

IPC分类号： G12B21/24 ,  G01B11/30

CPC分类号： G01Q60/24 ,  G01Q30/02

摘要： A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surface and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change in interaction force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.

摘要翻译： 量子束辅助原子力显微镜和量子束辅助原子力显微镜，可以同时使用原子力显微镜进行原子级配置观察和元素分析，进一步可以对样品表面的化学状态进行分析， 可以在液体中操作，可以实现具有原子级分辨能力的生物样品的元素分析和化学状态分析。 因此，样品表面的原子被量子束照射，例如具有给定的元素的电子跃迁能量特性的带电粒子，电子和光子，并且已经用量子束照射样品表面的原子之间的相互作用力的任何变化，以及 检测探头的远端。

公开(公告)号：US20070215804A1

公开(公告)日：2007-09-20

申请号：US11587031

申请日：2004-12-21

申请人： Shushi Suzuki ,  Wang-Jae Chun ,  Kiyotaka Asakura ,  Masaharu Nomura

发明人： Shushi Suzuki ,  Wang-Jae Chun ,  Kiyotaka Asakura ,  Masaharu Nomura

IPC分类号： G01N23/22

CPC分类号： G01Q60/24 ,  G01Q30/02

摘要： A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surface and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change in interaction force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.

摘要翻译： 量子束辅助原子力显微镜和量子束辅助原子力显微镜，可以同时使用原子力显微镜进行原子级配置观察和元素分析，进一步可以对样品表面的化学状态进行分析， 可以在液体中操作，可以实现具有原子级分辨能力的生物样品的元素分析和化学状态分析。 因此，样品表面的原子被量子束照射，例如具有给定的元素的电子跃迁能量特性的带电粒子，电子和光子，并且已经用量子束照射样品表面的原子之间的相互作用力的任何变化，以及 检测探头的远端。