公开(公告)号：US07919824B2

公开(公告)日：2011-04-05

申请号：US12403881

申请日：2009-03-13

申请人： Syotaro Ono ,  Wataru Saito ,  Nana Hatano ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Miho Watanabe

发明人： Syotaro Ono ,  Wataru Saito ,  Nana Hatano ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Miho Watanabe

IPC分类号： H01L27/088

CPC分类号： H01L29/66712 ,  H01L21/266 ,  H01L29/0615 ,  H01L29/0634 ,  H01L29/0638 ,  H01L29/0696 ,  H01L29/0878 ,  H01L29/1095 ,  H01L29/402 ,  H01L29/7395 ,  H01L29/7811

摘要： A semiconductor device includes a super junction region that has a first-conductivity-type first semiconductor pillar region and a second-conductivity-type second semiconductor pillar region alternately provided on the semiconductor substrate. The first semiconductor pillar region and the second semiconductor pillar region in a termination region have a lamination form resulting from alternate lamination of the first semiconductor pillar region and the second semiconductor pillar region on the top surface of the semiconductor substrate. The first semiconductor pillar region and/or the second semiconductor pillar region at a corner part of the termination region exhibit an impurity concentration distribution such that a plurality of impurity concentration peaks appear periodically. The first semiconductor pillar region and/or the second semiconductor pillar region at a corner part of the termination region have an impurity amount such that it becomes smaller as being closer to the circumference of the corner part.

摘要翻译： 半导体器件包括具有交替设置在半导体衬底上的第一导电型第一半导体柱区域和第二导电型第二半导体柱区域的超结区域。 终端区域中的第一半导体柱区域和第二半导体柱区域具有由半导体衬底的顶表面上的第一半导体柱区域和第二半导体柱区域的交替层叠形成的叠层形式。 终端区域的角部处的第一半导体柱区域和/或第二半导体柱区域显示杂质浓度分布，使得多个杂质浓度峰值周期性出现。 终端区域的角部处的第一半导体柱区域和/或第二半导体柱区域具有使得随着角部更靠近圆周而变小的杂质量。

公开(公告)号：US08030706B2

公开(公告)日：2011-10-04

申请号：US12540192

申请日：2009-08-12

申请人： Miho Watanabe ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Wataru Saito ,  Syotaro Ono ,  Nana Hatano

发明人： Miho Watanabe ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Wataru Saito ,  Syotaro Ono ,  Nana Hatano

IPC分类号： H01L29/66

CPC分类号： H01L29/7811 ,  H01L29/0634 ,  H01L29/1095 ,  H01L29/7802

摘要： A semiconductor device according to an embodiment of the present invention includes a device part and a terminal part. The device includes a first semiconductor layer, and second and third semiconductor layers formed on the first semiconductor layer, and alternately arranged along a direction parallel to a surface of the first semiconductor layer, wherein the device part is provided with a first region and a second region, each of which includes at least one of the second semiconductor layers and at least one of the third semiconductor layers, and with regard to a difference value ΔN (=NA−NB) obtained by subtracting an impurity amount NB per unit length of each of the third semiconductor layers from an impurity amount NA per unit length of each of the second semiconductor layers, a difference value ΔNC1 which is the difference value ΔN in the first region of the device part, a difference value ΔNC2 which is the difference value ΔN in the second region of the device part, and a difference value ΔNT which is the difference value ΔN in the terminal part satisfy a relationship of ΔNC1>ΔNT>ΔNC2.

摘要翻译： 根据本发明实施例的半导体器件包括器件部分和端子部分。 该器件包括第一半导体层，以及形成在第一半导体层上的第二和第三半导体层，并且沿着与第一半导体层的表面平行的方向交替布置，其中器件部分设置有第一区域和第二半导体层 区域，其中每一个包括第二半导体层和至少一个第三半导体层中的至少一个，并且关于通过从每单位长度减去杂质量NB获得的差值Dgr; N（= NA-NB） 从每个第二半导体层的每单位长度的杂质量NA中的每个第三半导体层的差分值＆Dgr; NC1，其是器件部分的第一区域中的差值＆Dgr; N，差值＆Dgr ;作为装置部分的第二区域中的差值Dgr; N的NC2，作为终端部分中的差值Dgr; N的差值＆Dgr; NT满足关系 的＆Dgr; NC1>＆Dgr; NT>＆Dgr; NC2。

公开(公告)号：US07989910B2

公开(公告)日：2011-08-02

申请号：US12252872

申请日：2008-10-16

申请人： Wataru Saito ,  Syotaro Ono ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Nana Hatano

发明人： Wataru Saito ,  Syotaro Ono ,  Masaru Izumisawa ,  Yasuto Sumi ,  Hiroshi Ohta ,  Wataru Sekine ,  Nana Hatano

IPC分类号： H01L29/66

CPC分类号： H01L29/0634 ,  H01L29/0615 ,  H01L29/0638 ,  H01L29/0696 ,  H01L29/1095 ,  H01L29/402 ,  H01L29/41741 ,  H01L29/7811

摘要： A semiconductor device includes an n+ type semiconductor substrate 1 and a super junction region that has, on the top of the substrate 1, an n and p type pillar regions 2 and 3 provided alternately. The device also includes, in the top surface of the super junction region, a p type base region 4 and an n type source layer 5. The device also includes a gate electrode 7 on the region 4 and layer 5 via a gate-insulating film 6, a drain electrode 9 on the bottom of the substrate 1, and a source electrode 8 on the top of the substrate 1. In the top surface of the super junction region in the terminal region, a RESURF region 10 is formed. The RESURF region has a comb-like planar shape with repeatedly-formed teeth having tips facing the end portion of the terminal region.

摘要翻译： 半导体器件包括n +型半导体衬底1和超结区，其在衬底1的顶部上交替设置n和p型柱状区域2,3。 该器件还在超结区域的顶表面中包括ap型基极区域4和n型源极层5.该器件还包括位于区域4上的栅电极7和通过栅极绝缘膜6的层5 ，基板1底部的漏电极9以及基板1顶部的源极8.在端子区域的超结区域的上表面形成有RESURF区域10。 RESURF区域具有梳状平面形状，具有重复形成的齿，其尖端面向终端区域的端部。

公开(公告)号：US08610210B2

公开(公告)日：2013-12-17

申请号：US12840201

申请日：2010-07-20

申请人： Hiroshi Ohta ,  Yasuto Sumi ,  Kiyoshi Kimura ,  Wataru Sekine ,  Wataru Saito ,  Syotaro Ono ,  Munehisa Yabuzaki ,  Nana Hatano ,  Miho Watanabe

发明人： Hiroshi Ohta ,  Yasuto Sumi ,  Kiyoshi Kimura ,  Wataru Sekine ,  Wataru Saito ,  Syotaro Ono ,  Munehisa Yabuzaki ,  Nana Hatano ,  Miho Watanabe

IPC分类号： H01L29/66

CPC分类号： H01L29/66712 ,  H01L29/0619 ,  H01L29/0634 ,  H01L29/0638 ,  H01L29/0696 ,  H01L29/1095 ,  H01L29/402 ,  H01L29/7811

摘要： According to one embodiment, a power semiconductor device includes a first semiconductor layer, and first, second and third semiconductor regions. The first semiconductor layer has a first conductivity type. The first semiconductor regions have a second conductivity type, and are formed with periodicity in a lateral direction in a second semiconductor layer of the first conductivity type. The second semiconductor layer is provided on a major surface of the first semiconductor layer in a device portion with a main current path formed in a vertical direction generally perpendicular to the major surface and in a terminal portion provided around the device portion. The second semiconductor region has the first conductivity type and is a portion of the second semiconductor layer sandwiched between adjacent ones of the first semiconductor regions. The third semiconductor regions have the second conductivity type and are provided below the first semiconductor regions in the terminal portion.

摘要翻译： 根据一个实施例，功率半导体器件包括第一半导体层以及第一，第二和第三半导体区域。 第一半导体层具有第一导电类型。 第一半导体区域具有第二导电类型，并且在第一导电类型的第二半导体层中在横向方向上形成周期性。 第二半导体层设置在器件部分的第一半导体层的主表面上，其主电流通道形成在大体上垂直于主表面的垂直方向上，以及设置在器件部分周围的端子部分中。 第二半导体区域具有第一导电类型，并且是夹在相邻的第一半导体区域中的第二半导体层的一部分。 第三半导体区域具有第二导电类型并且设置在端子部分中的第一半导体区域的下方。

公开(公告)号：US07737469B2

公开(公告)日：2010-06-15

申请号：US11748869

申请日：2007-05-15

申请人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

发明人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

IPC分类号： H01L29/74

CPC分类号： H01L29/872 ,  H01L29/0619 ,  H01L29/0623 ,  H01L29/0634 ,  H01L29/0696 ,  H01L29/0878 ,  H01L29/402 ,  H01L29/404 ,  H01L29/41741 ,  H01L29/7395 ,  H01L29/7397 ,  H01L29/7722 ,  H01L29/7806 ,  H01L29/7811 ,  H01L29/8611

摘要： A semiconductor device includes: a semiconductor layer of a first conductivity type; a first semiconductor pillar region of the first conductivity type provided on a major surface of the semiconductor layer; a second semiconductor pillar region of a second conductivity type provided adjacent to the first semiconductor pillar region on the major surface of the semiconductor layer, the second semiconductor pillar region forming a periodic arrangement structure substantially parallel to the major surface of the semiconductor layer together with the first semiconductor pillar region; a first main electrode; a first semiconductor region of the second conductivity type; a second semiconductor region of the first conductivity type; a second main electrode; a control electrode; and a high-resistance semiconductor layer provided on the semiconductor layer in an edge termination section surrounding the first semiconductor pillar region and the second semiconductor pillar region. The high-resistance semiconductor layer has a lower dopant concentration than the first semiconductor pillar region. A boundary region is provided between a device central region and the edge termination section. The first semiconductor pillar region and the second semiconductor pillar region adjacent to the high-resistance semiconductor layer in the boundary region have a depth decreasing stepwise toward the edge termination section.

摘要翻译： 半导体器件包括：第一导电类型的半导体层; 设置在半导体层的主表面上的第一导电类型的第一半导体柱区域; 第二导电类型的第二半导体柱区域，与半导体层的主表面上的第一半导体柱区域相邻设置，第二半导体柱区域形成基本上平行于半导体层的主表面的周期性排列结构以及 第一半导体柱区域; 第一主电极; 第二导电类型的第一半导体区域; 第一导电类型的第二半导体区域; 第二主电极; 控制电极; 以及设置在包围第一半导体柱区域和第二半导体柱区域的边缘终端部分的半导体层上的高电阻半导体层。 高电阻半导体层的掺杂浓度低于第一半导体柱区域。 边界区域设置在设备中心区域和边缘终端部分之间。 边界区域中与高电阻半导体层相邻的第一半导体柱区域和第二半导体柱区域具有沿着边缘终止部分逐步减小的深度。

公开(公告)号：US20080290403A1

公开(公告)日：2008-11-27

申请号：US12123072

申请日：2008-05-19

申请人： Syotaro ONO ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

发明人： Syotaro ONO ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

IPC分类号： H01L29/78

CPC分类号： H01L29/7811 ,  H01L29/0634 ,  H01L29/0638 ,  H01L29/0878 ,  H01L29/7395 ,  H01L29/861 ,  H01L29/868 ,  H01L29/872

摘要： A semiconductor apparatus includes a first semiconductor layer, a second semiconductor layer provided on a major surface of the first semiconductor layer, a third semiconductor layer provided on the major surface and being adjacent to the second semiconductor layer, a termination semiconductor layer provided on the major surface of the first semiconductor layer in a termination region outside the device region, a channel stop layer, and a channel stop electrode. The channel stop layer is provided in contact with the termination semiconductor layer on the major surface of the first semiconductor layer in an outermost peripheral portion outside the termination semiconductor layer and has a higher impurity concentration than the termination semiconductor layer. The channel stop electrode is provided on at least part of a surface of the channel stop layer and projects toward the termination semiconductor layer beyond at least a superficial portion of the channel stop layer.

摘要翻译： 半导体装置包括第一半导体层，设置在第一半导体层的主表面上的第二半导体层，设置在主表面上并与第二半导体层相邻的第三半导体层，设置在主体上的端接半导体层 在器件区域外的终端区域中的第一半导体层的表面，沟道阻挡层和沟道停止电极。 沟道阻挡层设置成与终端半导体层外部的最外周部分中的第一半导体层的主表面上的端接半导体层接触，并且具有比端接半导体层更高的杂质浓度。 通道阻挡电极设置在通道阻挡层的表面的至少一部分上，并且朝向端子半导体层突出超过通道阻挡层的至少表面部分。

公开(公告)号：US07622771B2

公开(公告)日：2009-11-24

申请号：US12123072

申请日：2008-05-19

申请人： Syotaro Ono ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

发明人： Syotaro Ono ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

IPC分类号： H01L31/119 ,  H01L21/336

CPC分类号： H01L29/7811 ,  H01L29/0634 ,  H01L29/0638 ,  H01L29/0878 ,  H01L29/7395 ,  H01L29/861 ,  H01L29/868 ,  H01L29/872

摘要： A semiconductor apparatus includes a first semiconductor layer, a second semiconductor layer provided on a major surface of the first semiconductor layer, a third semiconductor layer provided on the major surface and being adjacent to the second semiconductor layer, a termination semiconductor layer provided on the major surface of the first semiconductor layer in a termination region outside the device region, a channel stop layer, and a channel stop electrode. The channel stop layer is provided in contact with the termination semiconductor layer on the major surface of the first semiconductor layer in an outermost peripheral portion outside the termination semiconductor layer and has a higher impurity concentration than the termination semiconductor layer. The channel stop electrode is provided on at least part of a surface of the channel stop layer and projects toward the termination semiconductor layer beyond at least a superficial portion of the channel stop layer.

摘要翻译： 半导体装置包括第一半导体层，设置在第一半导体层的主表面上的第二半导体层，设置在主表面上并与第二半导体层相邻的第三半导体层，设置在主体上的端接半导体层 在器件区域外的终端区域中的第一半导体层的表面，沟道阻挡层和沟道停止电极。 沟道阻挡层设置成与终端半导体层外部的最外周部分中的第一半导体层的主表面上的端接半导体层接触，并且具有比端接半导体层更高的杂质浓度。 通道阻挡电极设置在通道阻挡层的表面的至少一部分上，并且朝向端子半导体层突出超过通道阻挡层的至少表面部分。

公开(公告)号：US08013360B2

公开(公告)日：2011-09-06

申请号：US12764763

申请日：2010-04-21

申请人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

发明人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta ,  Wataru Sekine

IPC分类号： H01L29/66

CPC分类号： H01L29/872 ,  H01L29/0619 ,  H01L29/0623 ,  H01L29/0634 ,  H01L29/0696 ,  H01L29/0878 ,  H01L29/402 ,  H01L29/404 ,  H01L29/41741 ,  H01L29/7395 ,  H01L29/7397 ,  H01L29/7722 ,  H01L29/7806 ,  H01L29/7811 ,  H01L29/8611

摘要： A semiconductor device includes: a semiconductor layer of a first conductivity type; a first semiconductor pillar region of the first conductivity type provided on a major surface of the semiconductor layer; a second semiconductor pillar region of a second conductivity type provided adjacent to the first semiconductor pillar region on the major surface of the semiconductor layer, the second semiconductor pillar region forming a periodic arrangement structure substantially parallel to the major surface of the semiconductor layer together with the first semiconductor pillar region; a first main electrode; a first semiconductor region of the second conductivity type; a second semiconductor region of the first conductivity type; a second main electrode; a control electrode; and a high-resistance semiconductor layer provided on the semiconductor layer in an edge termination section surrounding the first semiconductor pillar region and the second semiconductor pillar region. The high-resistance semiconductor layer has a lower dopant concentration than the first semiconductor pillar region. A boundary region is provided between a device central region and the edge termination section. The first semiconductor pillar region and the second semiconductor pillar region adjacent to the high-resistance semiconductor layer in the boundary region have a depth decreasing stepwise toward the edge termination section.

摘要翻译： 半导体器件包括：第一导电类型的半导体层; 设置在半导体层的主表面上的第一导电类型的第一半导体柱区域; 第二导电类型的第二半导体柱区域，与半导体层的主表面上的第一半导体柱区域相邻设置，第二半导体柱区域形成基本上平行于半导体层的主表面的周期性排列结构以及 第一半导体柱区域; 第一主电极; 第二导电类型的第一半导体区域; 第一导电类型的第二半导体区域; 第二主电极; 控制电极; 以及设置在包围第一半导体柱区域和第二半导体柱区域的边缘终端部分的半导体层上的高电阻半导体层。 高电阻半导体层的掺杂浓度低于第一半导体柱区域。 边界区域设置在设备中心区域和边缘终端部分之间。 边界区域中与高电阻半导体层相邻的第一半导体柱区域和第二半导体柱区域具有沿着边缘终止部分逐步减小的深度。

公开(公告)号：US08907420B2

公开(公告)日：2014-12-09

申请号：US12789008

申请日：2010-05-27

申请人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta

发明人： Wataru Saito ,  Syotaro Ono ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta

IPC分类号： H01L29/66 ,  H01L29/78 ,  H01L29/94 ,  H01L29/10 ,  H01L29/08 ,  H01L29/06

CPC分类号： H01L29/7811 ,  H01L29/0634 ,  H01L29/0696 ,  H01L29/0878 ,  H01L29/1095 ,  H01L29/66712 ,  H01L2924/0002 ,  H01L2924/00

摘要： A power semiconductor device includes: a first semiconductor layer of a first conductivity type; a second semiconductor layer of the first conductivity type and a third semiconductor layer of a second conductivity type formed on the first semiconductor layer and alternately arranged along at least one direction parallel to a surface of the first semiconductor layer; a first main electrode; a fourth semiconductor layer of the second conductivity type selectively formed in a surface of the second semiconductor layer and a surface of the third semiconductor layer; a fifth semiconductor layer of the first conductivity type selectively formed in a surface of the fourth semiconductor layer; a second main electrode; and a control electrode. At least one of the second and the third semiconductor layers has a dopant concentration profile along the one direction, the dopant concentration profile having a local minimum at a position except both ends thereof.

摘要翻译： 功率半导体器件包括：第一导电类型的第一半导体层; 第一导电类型的第二半导体层和形成在第一半导体层上的第二导电类型的第三半导体层，并且沿着平行于第一半导体层的表面的至少一个方向交替布置; 第一主电极; 选择性地形成在第二半导体层的表面和第三半导体层的表面上的第二导电类型的第四半导体层; 选择性地形成在第四半导体层的表面中的第一导电类型的第五半导体层; 第二主电极; 和控制电极。 第二和第三半导体层中的至少一个具有沿着一个方向的掺杂剂浓度分布，掺杂剂浓度分布在其两端以外的位置处具有局部最小值。

公开(公告)号：US20080135926A1

公开(公告)日：2008-06-12

申请号：US11936412

申请日：2007-11-07

申请人： Syotaro Ono ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta

发明人： Syotaro Ono ,  Wataru Saito ,  Masakatsu Takashita ,  Yasuto Sumi ,  Masaru Izumisawa ,  Hiroshi Ohta

IPC分类号： H01L27/06

CPC分类号： H01L29/7811 ,  H01L29/0615 ,  H01L29/0634 ,  H01L29/0696 ,  H01L29/1095

摘要： A semiconductor device includes: a drift layer having a superjunction structure; a semiconductor base layer selectively formed in a part of one surface of the drift layer; a first RESURF layer formed around a region having the semiconductor base layer formed thereon; a second semiconductor RESURF layer of a conductivity type which is opposite to a conductivity type of the first semiconductor RESURF layer; a first main electrode connected to a first surface of the drift layer; and a second main electrode connected to a second surface of the drift layer. The first RESURF layer is connected to the semiconductor base layer. The second semiconductor RESURF layer is in contact with the first semiconductor RESURF layer.

摘要翻译： 一种半导体器件包括：具有超结构结构的漂移层; 选择性地形成在所述漂移层的一个表面的一部分中的半导体基层; 在其上形成有半导体基底层的区域周围形成的第一RESURF层; 与第一半导体RESURF层的导电类型相反的导电类型的第二半导体RESURF层; 连接到所述漂移层的第一表面的第一主电极; 以及连接到漂移层的第二表面的第二主电极。 第一RESURF层连接到半导体基层。 第二半导体RESURF层与第一半导体RESURF层接触。