HETERODYNE GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM
    1.
    发明申请
    HETERODYNE GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM 有权
    异位测量干涉仪位移测量系统

    公开(公告)号:US20150338205A1

    公开(公告)日:2015-11-26

    申请号:US14441821

    申请日:2013-10-28

    IPC分类号: G01B11/14 G01B9/02

    摘要: A displacement measurement system of heterodyne grating interferometer, comprises a reading head, a measurement grating and an electronic signal processing component. Laser light emitted from the laser tube is collimated, passes through the first polarization spectroscope, and then emits two light beams with a vertical polarization direction and a vertical propagation direction; the two light beams pass through two acousto-optic modulators and respectively generate two first-order diffraction light beams with different frequencies, which are later divided into reference light and measurement light; two parallel reference light beams form a beat frequency electric signal with positive and negative first-order diffraction measurement light respectively after passing through a measurement signal photo-electric conversion unit; the beat frequency signals are transmitted to the electronic signal processing component for signal processing, thus the output of linear displacement in two directions is realized.

    摘要翻译: 外差光栅干涉仪的位移测量系统,包括读头,测量光栅和电子信号处理部件。 从激光管发射的激光被准直,通过第一偏振光谱仪,然后发射具有垂直偏振方向和垂直传播方向的两个光束; 两个光束通过两个声光调制器,并分别产生两个不同频率的一级衍射光束,后来分为参考光和测量光; 两个平行参考光束在通过测量信号光电转换单元之后分别形成具有正和负一阶衍射测量光的拍频电信号; 拍频信号被发送到用于信号处理的电子信号处理部件,从而实现两个方向上的线性位移的输出。

    HIGH-RESOLUTION PHASE DETECTION METHOD AND SYSTEM BASED ON PLANE GRATING LASER INTERFEROMETER

    公开(公告)号:US20220196383A1

    公开(公告)日:2022-06-23

    申请号:US17601179

    申请日:2020-04-02

    IPC分类号: G01B9/02015 G01B11/02

    摘要: A high-resolution phase detection method and system based on a plane grating laser interferometer. The method uses a dual-frequency interferometer to measure the displacement, and the measurement signal processing comprises an integral part and a decimal portion, a phase equation set of a displacement measurement signal is constructed according to a measurement optical path principle of a heterodyne plane grating laser interferometer; a non-linear equation set for which the unknowns are instantaneous phase, interval phase and signal amplitude is established; and the equation sets above are solved by using the least squares method, so as to realize phase discrimination, thereby realizing precise displacement measurement. The method can solve the problems in the traditional time measurement-based phase detection technology, such as low measurement accuracy, and failing to satisfy small measuring range measurement. The measurement method can be applied to systems such as precision manufacturing equipment and lithography machine.

    A METHOD FOR CALIBRATING AN ERROR OF INSTALLATION OF AN INTERFEROMETER IN A MULTI-AXIS LASER DISPLACEMENT MEASUREMENT SYSTEM

    公开(公告)号:US20210033383A1

    公开(公告)日:2021-02-04

    申请号:US16759294

    申请日:2018-10-25

    IPC分类号: G01B11/02 G01B9/02

    摘要: Provided is a method for calibrating an error of installation of an interferometer in a multi-axis laser displacement measurement system, including: adding one or more redundant interferometers in a laser interferometer displacement measurement system; then establishing displacement calculating equations containing installation error of the laser interferometer and obtaining redundant measurement information by continuously measuring displacement information of multiple points, wherein the number of the combined displacement calculating equations is equal to the number of unknown quantities; and further solving the equation set to obtain the installation error of the interferometer. With a redundant arrangement of the laser interferometer, self-calibration of the installation error thereof can be achieved. A problem of difficulty in calibration of the installation error of the multi-axis interferometer in industrial application can be solved without assistance of other displacement sensors with higher precision.

    MAGNETICALLY SUSPENDED COARSE MOTION AND FINE MOTION INTEGRATED RETICLE STAGE DRIVEN BY PLANAR MOTOR
    7.
    发明申请
    MAGNETICALLY SUSPENDED COARSE MOTION AND FINE MOTION INTEGRATED RETICLE STAGE DRIVEN BY PLANAR MOTOR 有权
    平面电机驱动的磁悬浮运动和精细运动综合版

    公开(公告)号:US20170052461A1

    公开(公告)日:2017-02-23

    申请号:US15307797

    申请日:2015-04-17

    IPC分类号: G03F7/20

    摘要: A magnetically suspended coarse motion and fine motion integrated reticle stage driven by a planar motor comprises a movable platform (100), a balance mass (200), a drive motor, a mask plate (101), a base (001), a vibration isolation system (500), and a measuring system, wherein, the vibration isolation system is located between the balance mass and the base, and the mask plate is mounted on the movable platform. The drive motor of the movable platform is a moving-iron type planar motor (300). The reticle stage can lower the design complexity of the drive motor of the movable platform. Compared with a linear motor, the planar motor can provide push forces in more directions, the number of motors is reduced, the structure of the movable platform is more compact, the inherent frequency and the control bandwidth of the movable platform are improved, and thus control precision is improved.

    摘要翻译: 由平面电动机驱动的磁悬浮的粗略运动和精细运动的集成标线片台包括可移动平台(100),平衡块(200),驱动马达,掩模板(101),基座(001),振动 隔离系统(500)和测量系统,其中,隔振系统位于平衡块和基座之间,并且掩模板安装在可移动平台上。 可移动平台的驱动马达是移动式平面马达(300)。 标线台可以降低可移动平台的驱动电机的设计复杂性。 与线性电动机相比,平面电机可以在更多方向上提供推力,减少电机数量,可移动平台的结构更紧凑,提高了可移动平台的固有频率和控制带宽,从而 控制精度提高。

    THREE-DOF HETERODYNE GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM
    8.
    发明申请
    THREE-DOF HETERODYNE GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM 有权
    三自由度异位测量干涉仪位移测量系统

    公开(公告)号:US20160153764A1

    公开(公告)日:2016-06-02

    申请号:US14900111

    申请日:2014-06-05

    IPC分类号: G01B9/02 G01B11/14

    摘要: A three-DOF (Degree of Freedom) heterodyne grating interferometer displacement measurement system comprises a dual-frequency laser, a grating interferometer, a measurement grating, receivers and an electronic signal processing component; the grating interferometer comprises a polarizing spectroscope, a reference grating and dioptric elements; the measurement system realizes displacement measurement on the basis of grating diffraction, the optical Doppler Effect and the optical beat frequency principle. Three linear displacements can be output by the system when the grating interferometer and the measurement grating perform a three-DOF linear relative motion. The measurement system can reach sub-nanometer and even higher resolution and precision, and can simultaneously measure three linear displacements. The measurement system has the advantages of being environmentally insensitive, high in measurement precision, small in size, light in weight, etc., and is capable of improving the overall performances of an ultra-precision stage of a lithography machine as a position measurement system for this stage.

    摘要翻译: 三自由度(自由度)外差光栅干涉仪位移测量系统包括双频激光器,光栅干涉仪,测量光栅,接收器和电子信号处理部件; 光栅干涉仪包括偏振光谱仪,参考光栅和折射元件; 测量系统基于光栅衍射,光学多普勒效应和光拍频率原理实现位移测量。 当光栅干涉仪和测量光栅执行三自由度线性相对运动时,系统可以输出三个线性位移。 测量系统可以达到亚纳米,甚至更高的分辨率和精度,并可同时测量三个线性位移。 该测量系统具有环境不敏感,测量精度高,体积小,重量轻等优点,能够提高作为位置测量系统的光刻机的超精密级的整体性能 在这个阶段

    FIVE-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY SYSTEM

    公开(公告)号:US20210262834A1

    公开(公告)日:2021-08-26

    申请号:US17257173

    申请日:2019-06-26

    IPC分类号: G01D5/353 G01D5/34

    摘要: A five-degree-of-freedom heterodyne grating interferometry system comprises: a single-frequency laser for emitting single-frequency laser light, the single-frequency laser light can be split into a reference light beam and a measurement light beam; an interferometer lens set and a measurement grating for converting the reference light and the measurement light into a reference interference signal and a measurement interference signal; and multiple optical fiber bundles, respectively receiving the measurement interference signal and the reference interference signal, wherein each optical fiber bundle has multiple multi-mode optical fibers respectively receiving interference signals at different positions on the same plane. The measurement system is not over-sensitive to the environment, is small and light, and is easy to arrange. Six-degree-of-freedom ultra-precision measurement can be achieved by arranging multiple five-degree-of-freedom interferometry systems and using redundant information, thereby meeting the needs of a lithography machine workpiece table for six-degree-of-freedom position and orientation measurement.

    TWO-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY MEASUREMENT SYSTEM

    公开(公告)号:US20210164772A1

    公开(公告)日:2021-06-03

    申请号:US17257219

    申请日:2019-06-26

    IPC分类号: G01B11/06 G01B9/02

    摘要: A two-degree-of-freedom heterodyne grating interferometry measurement system, comprising: a single-frequency laser device for emitting a single-frequency laser, and the single-frequency laser can be split into a beam of reference light and a beam of measurement light; an interferometer mirror group and a measurement grating for forming a reference interference signal and a measurement interference signal from the reference light and the measurement light; and a receiving optical fiber for receiving the reference interference signal and the measurement interference signal, wherein a core diameter of the receiving optical fiber is smaller than a width of an interference fringe of the reference interference signal and the measurement interference signal, so that the receiving optical fiber receives a part of the reference interference signal and the measurement interference signal. The measurement system has advantages of insensitivity to grating rotation angle error, small volume, light weight, and a facilitating arrangement.