公开(公告)号：US06147889A

公开(公告)日：2000-11-14

申请号：US232894

申请日：1999-01-15

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G03H1/26 ,  G11B7/0065 ,  G11C13/04 ,  G11C11/42

CPC classification number: G11C13/042 ,  G11B7/0065

Abstract: A high memory capacity with relatively low demands on the optical quality of the components used is possible in accordance with the invention by the means to generate the at least two light rays and/or the memory element and/or means to guide the light rays are designed in such a way that the spatial orientation of the interference sample generated in the memory element by the light rays can be changed in any spatial direction over the spatial orientation of an interference pattern stored in the memory element and/or a light diffracting structure present in the memory element. The invention further relates to a device for the readout of optical information and a method for the optical recording and for the optical readout of information.

Abstract translation: 根据本发明，通过产生至少两个光线和/或存储元件的手段和/或引导光线的装置，对于所使用的部件的光学质量要求相对较低的高存储器容量是可能的 设计成使得存储元件中由光线产生的干涉样本的空间取向可以在存储在存储元件中的干涉图案的空间取向和/或存在的光衍射结构的任何空间方向上改变 在内存元素中。 本发明还涉及一种用于光学信息读出的装置以及用于光学记录和光学读出信息的方法。

公开(公告)号：US20130202172A1

公开(公告)日：2013-08-08

申请号：US13639618

申请日：2011-04-07

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G06T7/00

CPC classification number: G06T7/0012 ,  A61B6/037 ,  A61B6/583 ,  G06T5/003 ,  G06T11/008 ,  G06T2207/10081 ,  G06T2207/10104

Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom. Based on the definition of the virtual tomograph and the determination of the imaging properties of different tomographs, the methods according to the invention then allow conversion and subsequently standardized and quantitatively comparable representation of the image data recorded by the different tomographs or systems as if all measurements were acquired equally by the virtual system. The method according to the invention therefore supports the quantitative evaluation of image data in multicentric studies.

Abstract translation: 正电子发射断层扫描，可能与计算机断层摄影相结合，允许除了医学诊断成像以外的各种参数的定量确定。 使用断层摄影术的定量测量显示对相应断层摄影术的成像特性的严重和不可避免的依赖性，这使得难以对结果进行定量评估。 这特别涉及多中心医学研究，这些研究强制要求参与中心测量的数据进行定量可比性。 本文所要求的方法包括具有确定的成像特性的虚拟断层摄影机的定义。 所要求保护的方法还包括基于合适的参考测量并且可能通过使用校准体模来确定不同断层摄影机的成像特性。 基于虚拟断层摄影机的定义和不同断层摄影术的成像特性的确定，根据本发明的方法然后允许不同层析成像仪或系统记录的图像数据的转换和随后的标准化和定量可比较的表示，如同所有测量 被虚拟系统平等地收购。 因此，根据本发明的方法支持多中心研究中图像数据的定量评估。

公开(公告)号：US07161683B2

公开(公告)日：2007-01-09

申请号：US10502195

申请日：2003-01-21

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/02

CPC classification number: G01B9/02081 ,  G01B9/02022 ,  G01B11/22 ,  G01B2290/30 ,  G01B2290/70

Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus having a light source, generating a phase shift, measuring the intensity of the interference signals, selectively measuring the intensity of the interference signal and determining the phase angles and/or a relative phase shift of the intensity of the interference signals. In accordance with the invention, the generating of a phase shift between components of different polarization directions in at least one of the branches of the interferometer includes a diffraction grating. The selective determination of the intensity of the interference signal in dependence on the polarization moreover permits determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.

Abstract translation: 本发明涉及一种具有光源的光谱色散干涉光学装置，产生相移，测量干涉信号的强度，选择性地测量干涉信号的强度并确定相位角和/或相位相移 干扰信号的强度。 根据本发明，在干涉仪的至少一个分支中产生不同偏振方向的分量之间的相移包括衍射光栅。 根据偏振选择性地确定干涉信号的强度，此外可以确定相对于衍射光栅坐标系的TE分量和干涉信号的TM分量的相应强度。

公开(公告)号：US08885906B2

公开(公告)日：2014-11-11

申请号：US13639618

申请日：2011-04-07

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G06K9/00 ,  G06T7/00 ,  G06T5/00 ,  G06T11/00

CPC classification number: G06T7/0012 ,  A61B6/037 ,  A61B6/583 ,  G06T5/003 ,  G06T11/008 ,  G06T2207/10081 ,  G06T2207/10104

Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom. Based on the definition of the virtual tomograph and the determination of the imaging properties of different tomographs, the methods according to the invention then allow conversion and subsequently standardized and quantitatively comparable representation of the image data recorded by the different tomographs or systems as if all measurements were acquired equally by the virtual system. The method according to the invention therefore supports the quantitative evaluation of image data in multicentric studies.

Abstract translation: 正电子发射断层扫描，可能与计算机断层摄影相结合，允许除了医学诊断成像以外的各种参数的定量确定。 使用断层摄影术的定量测量显示对相应断层摄影术的成像特性的严重和不可避免的依赖性，这使得难以对结果进行定量评估。 这特别涉及多中心医学研究，这些研究强制要求参与中心测量的数据进行定量可比性。 本文所要求的方法包括具有确定的成像特性的虚拟断层摄影机的定义。 所要求保护的方法还包括基于合适的参考测量并且可能通过使用校准体模来确定不同断层摄影机的成像特性。 基于虚拟断层摄影机的定义和不同断层摄影术的成像特性的确定，根据本发明的方法然后允许不同层析成像仪或系统记录的图像数据的转换和随后的标准化和定量可比较的表示，如同所有测量 被虚拟系统平等地收购。 因此，根据本发明的方法支持多中心研究中图像数据的定量评估。

公开(公告)号：US07466421B2

公开(公告)日：2008-12-16

申请号：US10521516

申请日：2002-07-15

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/02

CPC classification number: G01J3/453

Abstract: A diffractive interferometric optical device is provided for measuring spectral properties of light. The device includes means for coupling in a single spatial mode of an incoming light field to be examined, means for splitting the single spatial mode of incoming light field into at least two partial fields, means for changing one of a shape or a direction of propagation of the wavefront of at least one of the at least two partial fields in dependence on the wavelength and means for generating an interference pattern superimposing the at least two partial fields. The device further comprises detection means to record and evaluate the interference pattern at a plurality of discrete spatial positions in order to derive spectral properties of the incoming light field.

Abstract translation: 提供了用于测量光的光谱性质的衍射干涉光学装置。 该装置包括用于以待检查的入射光场的单个空间模式耦合的装置，用于将入射光场的单个空间模式分成至少两个局部场的装置，用于改变传播形状或传播方向之一的装置 根据所述波长的所述至少两个部分场中的至少一个的波阵面以及用于产生叠加所述至少两个部分场的干涉图案的装置。 该装置还包括用于在多个离散空间位置记录和评估干涉图案的检测装置，以便导出入射光场的光谱特性。

公开(公告)号：US20050248769A1

公开(公告)日：2005-11-10

申请号：US10521516

申请日：2002-07-15

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G01J3/32 ,  G01J3/36 ,  G01J3/45 ,  G01J3/453 ,  G01B9/02

CPC classification number: G01J3/453

Abstract: The present invention relates to an apparatus and a method for optical spectroscopy and for optical sensory technology and to the use of the apparatus. An apparatus having high spectral resolution with simultaneously comparatively low demands on the quality of the optical components is provided in that the apparatus for optical spectroscopy comprises means for the generation of an interference pattern, means for the coupling of the incoming light field to be examined such that only one or several individual spatial modes of the field are permitted, and a detector which can record the intensity of the generated interference pattern at a plurality of spatially different positions, with the wavefronts and/or the propagation direction of at least one of the light fields involved in the interference pattern being changed by spectrally dispersive or diffractive optical elements in dependence on the wavelength. The present invention furthermore relates to a method of determining the optical spectrum and/or of other measurands encoded or transmitted by an optical spectrum by analysis of the interference pattern measured using an apparatus in accordance with the invention or using an apparatus in accordance with the invention.

Abstract translation: 本发明涉及一种用于光学光学和光学感测技术的装置和方法以及该装置的使用。 提供了一种具有高光谱分辨率并且对光学部件的质量要求相对较低的要求的装置，其特征在于，用于光学光学的装置包括用于产生干涉图案的装置，用于耦合待检测的入射光场的装置 允许场的只有一个或几个单独的空间模式，以及可以在多个空间不同的位置记录生成的干涉图案的强度的检测器，其中波前和/或传播方向至少是 根据波长，通过光谱色散或衍射光学元件改变涉及干涉图案的光场。 本发明还涉及一种通过分析使用根据本发明的装置或使用根据本发明的装置测量的干涉图案来确定由光谱编码或传输的其他被测量的光谱和/或其他被测量的方法 。

公开(公告)号：US20120105861A1

公开(公告)日：2012-05-03

申请号：US13145391

申请日：2009-01-20

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/02 ,  G01B11/02

CPC classification number: G01N21/4795 ,  A61B5/0059 ,  A61B5/0066 ,  A61B5/7207 ,  G01B9/02004 ,  G01B9/02032 ,  G01B9/02079 ,  G01B9/02091 ,  G01B2290/45 ,  G01N21/39 ,  G01N2021/1787

Abstract: The present invention relates to a method for determining optical path length differences and for optical coherence tomography, having the steps of: generating spatially coherent light by a light source (SQ, BQ) emitting a spatial monomode, or the emission thereof being limited to a single spatial mode by suitable means (F); dividing at least a part of the light coming from said light source into two spatially separated paths; placing a sample (P) to be measured in the measurement path; using as at least two detectors (D) or one detector (D, A) having at least two detector elements (D) and further means (S, T, BP, F, Q, L, G, Z) for guiding beams, said means bringing light from a reference path and a measurement path together to the detectors/detector elements (D) and bringing said light to interference; receiving and analyzing the light intensities at the detectors/detector elements (D) in order to obtain a data set; and numerically analyzing and displaying the data set such that conclusions are possible about both the spatial position and the strength of the reflection or scattering of the sample (P) or structures within the sample (P).

Abstract translation: 本发明涉及一种用于确定光路长度差异和光学相干断层摄影的方法，具有以下步骤：通过发射空间单模的光源（SQ，BQ）产生空间相干光，或将其发射限于 单一空间模式（F）; 将来自所述光源的光的至少一部分划分成两个空间上分离的路径; 将待测量的样品（P）放置在测量路径中; 使用具有至少两个检测器元件（D）的至少两个检测器（D）或一个检测器（D，A）和用于引导梁的另外的装置（S，T，BP，F，Q，L，G，Z） 所述装置将来自参考路径和测量路径的光线一起送到检测器/检测器元件（D）并使所述光干涉; 接收和分析检测器/检测器元件（D）处的光强度以获得数据集; 并对数据集进行数值分析和显示，从而得出关于样品（P）中的样品（P）或结构的反射或散射的空间位置和强度的结论是可能的结论。

公开(公告)号：US07826062B2

公开(公告)日：2010-11-02

申请号：US11825974

申请日：2007-07-09

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/02

CPC classification number: H04B10/676 ,  G01J3/453

Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.

Abstract translation: 本发明涉及一种用于检测或产生和调制光信号的装置，并且具有角度色散元件，该角度色散元件被布置成改变光信号或载波和/或引起干扰的参考光的角度。

公开(公告)号：US20080152349A1

公开(公告)日：2008-06-26

申请号：US11825974

申请日：2007-07-09

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: H04B10/00

CPC classification number: H04B10/676 ,  G01J3/453

Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.

Abstract translation: 本发明涉及一种用于检测或产生和调制光信号的装置，并且具有角度色散元件，该角度色散元件被布置成改变光信号或载波和/或引起干扰的参考光的角度。

公开(公告)号：US07330267B1

公开(公告)日：2008-02-12

申请号：US09958397

申请日：2000-04-07

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/06

CPC classification number: G01J9/02 ,  G01J3/453 ,  G01J3/457 ,  G01J2003/2866

Abstract: The invention relates to an apparatus for optical spectroscopy having means to produce an interference pattern and having a spatially resolving detector which can record the interference pattern produced. In accordance with the invention, the wavefronts of at least one of the part rays involved in the interference pattern is influenced in dependence on the wavelength by spectrally dispersive or diffractive optical elements.

Abstract translation: 本发明涉及一种用于光谱学的装置，其具有产生干涉图案的装置，并且具有可记录产生的干涉图案的空间分辨检测器。 根据本发明，涉及干涉图案的部分光线中的至少一个的波前根据光谱色散或衍射光学元件的波长而受到影响。