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    Method for manufacturing a stator core for an axial air-gap electronic motor
    5.
    发明申请
    Method for manufacturing a stator core for an axial air-gap electronic motor 有权
    制造用于轴向气隙电子马达的定子芯的方法

    公开(公告)号：US20070214632A1

    公开(公告)日：2007-09-20

    申请号：US11717079

    申请日：2007-03-13

    申请人： Tomonori Kojima ,  Hisao Igarashi ,  Hitoshi Kurita ,  Norio Tosu

    发明人： Tomonori Kojima ,  Hisao Igarashi ,  Hitoshi Kurita ,  Norio Tosu

    IPC分类号： H02K1/04 ,  H02K21/12 ,  B23P13/04

    CPC分类号： H02K15/022 ,  H02K21/24 ,  H02K2201/15 ,  Y10T29/49009 ,  Y10T29/49012 ,  Y10T29/49995

    摘要： There is provided a method for manufacturing a stator core for an axial air-gap electronic motor, in which core sheets are laminatedly fixed while being shifted with predetermined intervals. The method includes a step in which first side surfaces in the circumferential direction (first slot surfaces 25) of the first to nth (n is a positive integer) core sheets are blanked out of a mother sheet 60 by moving first blanking punches 360 with predetermined intervals via a first control means 700; and a second blanking step in which second side surfaces in the circumferential direction (second slot surfaces 26) of the first to nth (n is a positive integer) core sheets are blanked in succession by moving a second blanking punch 460 with predetermined intervals via a second control means 700.

    摘要翻译： 提供了一种用于制造用于轴向气隙电子电动机的定子铁心的方法，其中芯片以预定间隔移动而层叠固定。 该方法包括以下步骤：将第一至第n（n为正整数）芯片的圆周方向（第一槽表面25）的第一侧表面从母片60中冲出，通过以预定的方式移动第一冲裁冲头360 经由第一控制装置700的间隔; 以及第二冲裁步骤，其中通过经由一个第二冲裁步骤以预定的间隔移动第二冲裁冲头460，使第一至第n（n为正整数）芯片的圆周方向上的第二侧面（第二槽表面26） 第二控制装置700。

    Method for manufacturing a stator core for an axial air-gap electronic motor
    6.
    发明授权
    Method for manufacturing a stator core for an axial air-gap electronic motor 有权
    制造用于轴向气隙电子马达的定子芯的方法

    公开(公告)号：US08042257B2

    公开(公告)日：2011-10-25

    申请号：US11717079

    申请日：2007-03-13

    申请人： Tomonori Kojima ,  Hisao Igarashi ,  Hitoshi Kurita ,  Norio Tosu

    发明人： Tomonori Kojima ,  Hisao Igarashi ,  Hitoshi Kurita ,  Norio Tosu

    IPC分类号： H02K15/02 ,  H02K1/16 ,  H02K1/18

    CPC分类号： H02K15/022 ,  H02K21/24 ,  H02K2201/15 ,  Y10T29/49009 ,  Y10T29/49012 ,  Y10T29/49995

    摘要： There is provided a method for manufacturing a stator core for an axial air-gap electronic motor, in which core sheets are laminatedly fixed while being shifted with predetermined intervals. The method includes a step in which first side surfaces in the circumferential direction (first slot surfaces 25) of the first to nth (n is a positive integer) core sheets are blanked out of a mother sheet 60 by moving first blanking punches 360 with predetermined intervals via a first control means 700; and a second blanking step in which second side surfaces in the circumferential direction (second slot surfaces 26) of the first to nth (n is a positive integer) core sheets are blanked in succession by moving a second blanking punch 460 with predetermined intervals via a second control means 700.

    摘要翻译： 提供了一种用于制造用于轴向气隙电子电动机的定子铁心的方法，其中芯片以预定间隔移动而层叠固定。 该方法包括以下步骤：将第一至第n（n为正整数）芯片的圆周方向（第一槽表面25）的第一侧表面从母片60中冲出，通过以预定的方式移动第一冲裁冲头360 经由第一控制装置700的间隔; 以及第二冲裁步骤，其中通过经由一个第二冲裁步骤以预定的间隔移动第二冲裁冲头460，使第一至第n（n为正整数）芯片的圆周方向上的第二侧面（第二槽表面26） 第二控制装置700。

    Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
    7.
    发明授权
    Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method 有权
    探针装置，设置有探针装置的晶片检查装置和晶片检查方法

    公开(公告)号：US07446544B2

    公开(公告)日：2008-11-04

    申请号：US10593830

    申请日：2005-03-30

    申请人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    发明人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    IPC分类号： G01R31/02

    CPC分类号： G01R1/07364 ,  G01R1/07314 ,  G01R1/07371 ,  G01R1/07378

    摘要： A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.

    摘要翻译： 一种探针装置，包括具有大量检查电极的用于检查的电路板，具有多个端子电极的连接用电路板的探针卡和接触构件，配置在检查用电路基板之间的各向异性导电性连接器， 用于将各个检查电极连接到各个端子电极的电路板，以及用于调整用于检查的电路板的平行度的平行度调节机构和用于连接到晶片的电路板。 平行度调节机构包括相对位移用于检查的电路板或用于在各向异性导电连接器的厚度方向上连接的电路板的位置变化机构。 晶片检查装置可以包括探针装置。

    Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
    8.
    发明申请
    Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method 有权
    探针装置，设置有探针装置的晶片检查装置和晶片检查方法

    公开(公告)号：US20070178727A1

    公开(公告)日：2007-08-02

    申请号：US10593830

    申请日：2005-03-30

    申请人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    发明人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    IPC分类号： H01R4/58

    CPC分类号： G01R1/07364 ,  G01R1/07314 ,  G01R1/07371 ,  G01R1/07378

    摘要： A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.

    摘要翻译： 一种探针装置，包括具有大量检查电极的用于检查的电路板，具有多个端子电极的连接用电路板的探针卡和接触构件，配置在检查用电路基板之间的各向异性导电性连接器， 用于将各个检查电极连接到各个端子电极的电路板，以及用于调整用于检查的电路板的平行度的平行度调节机构和用于连接到晶片的电路板。 平行度调节机构包括相对位移用于检查的电路板或用于在各向异性导电连接器的厚度方向上连接的电路板的位置变化机构。 晶片检查装置可以包括探针装置。

    Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
    9.
    发明申请
    Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method 有权
    各向异性导电连接器，导电膏组合物，探针构件，晶片检查装置和晶圆检查方法

    公开(公告)号：US20060211280A1

    公开(公告)日：2006-09-21

    申请号：US10548832

    申请日：2004-03-23

    申请人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    发明人： Hisao Igarashi ,  Katsumi Sato ,  Kazuo Inoue

    IPC分类号： H01R4/58

    CPC分类号： G01R1/0735 ,  H01L23/49827 ,  H01L2924/0002 ,  H01R13/2414 ,  H01L2924/00

    摘要： Disclosed herein are an anisotropically conductive connector, by which good conductivity is retained over a long period of time even when it is used in electrical inspection of a plurality of integrated circuits formed on a wafer repeatedly over a great number of times, and thus high durability and long service life are achieved, and applications thereof. The anisotropically conductive connector of the invention comprises elastic anisotropically conductive films, in each of which a plurality of conductive parts for connection containing conductive particles and extending in a thickness-wise direction of the film have been formed. The conductive particles contained in the conductive parts for connection in the anisotropically conductive connector are obtained by laminating surfaces of core particles exhibiting magnetism with a coating layer formed of a high-conductive metal, and the coating layer is a coating layer having a high hardness.

    摘要翻译： 这里公开了各向异性导电连接器，即使在多次重复地形成在晶片上的多个集成电路的电气检查中，长时间保持良好的导电性，因此具有高耐久性 使用寿命长，使用寿命长。 本发明的各向异性导电连接器包括弹性各向异性导电膜，其中每个导电膜已形成多个用于连接的导电部件，其中包含导电颗粒并在膜的厚度方向上延伸。 包含在各向异性导电连接器中用于连接的导电部件中的导电颗粒通过将表现出磁性的芯颗粒的表面与由高导电性金属形成的涂层层压而获得，并且涂层是具有高硬度的涂层。

    Sheet-like probe, method of producing the probe, and application of the probe
    10.
    发明授权
    Sheet-like probe, method of producing the probe, and application of the probe 有权
    片状探针，探针的制造方法和探针的应用

    公开(公告)号：US07671609B2

    公开(公告)日：2010-03-02

    申请号：US11587485

    申请日：2005-04-26

    申请人： Katsumi Sato ,  Kazuo Inoue ,  Hitoshi Fujiyama ,  Mutsuhiko Yoshioka ,  Hisao Igarashi

    发明人： Katsumi Sato ,  Kazuo Inoue ,  Hitoshi Fujiyama ,  Mutsuhiko Yoshioka ,  Hisao Igarashi

    IPC分类号： G01R31/02

    CPC分类号： A63H29/22 ,  A63H30/04 ,  A63H31/00 ,  F16H48/08 ,  G01R1/06711 ,  G01R1/0735 ,  G01R3/00 ,  H01L51/5012 ,  H05B33/14 ,  Y10T29/49155

    摘要： A sheet-like probe has a porous film. In the sheet-like probe, a contact film is penetratingly supported at each position of through-holes formed in the porous film, and a peripheral edge of the contact film and the porous film are integrated such that a flexible resin insulation layer is included in a fine hole of the porous film. Electrode structure bodies are supported in a penetrating manner in the insulation layer. Each electrode structure body includes a surface electrode section exposed to the front surface of the insulation layer and projecting from the front surface of the insulation layer, a back surface electrode section exposed to the back surface of the insulation layer, a short-circuit section continuously extending from the base end of the front surface electrode section, penetrating the insulation layer in its thickness direction, and connected to the back surface electrode section, a holding section extending outward, along the front surface of the insulation layer, from the base end section of the front surface electrode section, and a supporting body supporting the insulation layer.

    摘要翻译： 片状探针具有多孔膜。 在片状探针中，在形成于多孔膜的贯通孔的各位置上，充分地将接触膜支撑在接触膜的周缘和多孔膜的一体，使得柔性树脂绝缘层包含在 多孔膜的细孔。 电极结构体以穿透方式被支撑在绝缘层中。 每个电极结构体包括暴露于绝缘层的前表面并从绝缘层的前表面突出的表面电极部分，暴露于绝缘层的背面的背面电极部分，连续的短路部分 从前表面电极部分的基端部延伸穿过绝缘层的厚度方向，并与背面电极部分连接，沿着绝缘层的前表面向外延伸的保持部分从基端部分 和支撑绝缘层的支撑体。