公开(公告)号：US08750454B2

公开(公告)日：2014-06-10

申请号：US13033590

申请日：2011-02-23

申请人： Tsahi Gozani ,  Joseph Bendahan ,  Craig Mathew Brown ,  Willem Gerhardus Johannes Langeveld ,  John David Stevenson

发明人： Tsahi Gozani ,  Joseph Bendahan ,  Craig Mathew Brown ,  Willem Gerhardus Johannes Langeveld ,  John David Stevenson

IPC分类号： G01N23/087 ,  G01N23/20

CPC分类号： G01N23/087 ,  G01N23/10 ,  G01N23/20083 ,  G01N23/203 ,  G01V5/0016 ,  G01V5/0025

摘要： The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

摘要翻译： 本申请公开了用于识别被扫描物体的材料组成的用于X射线扫描的系统和方法。 该系统包括至少一个用于在物体上投射X射线束的X射线源，其中投影的X射线束的至少一部分透射穿过物体，以及用于测量所述X射线束的能量谱的检测器阵列 透射X射线。 测量的能谱用于确定物体的原子序号，用于识别物体的材料组成。 X射线扫描系统还可以具有准直的高能量背散射X射线检测器阵列，用于以大于90度的角度测量由物体散射的X射线的能谱，其中测量的能谱结合使用 用传输能谱来确定用于识别物体的材料组成的物体的原子序号。

公开(公告)号：US20110235777A1

公开(公告)日：2011-09-29

申请号：US13033590

申请日：2011-02-23

申请人： Tsahi Gozani ,  Joseph Bendahan ,  Craig Mathew Brown ,  Willem Gerhardus Johannes Langeveld ,  John David Stevenson

发明人： Tsahi Gozani ,  Joseph Bendahan ,  Craig Mathew Brown ,  Willem Gerhardus Johannes Langeveld ,  John David Stevenson

IPC分类号： G01N23/06

CPC分类号： G01N23/087 ,  G01N23/10 ,  G01N23/20083 ,  G01N23/203 ,  G01V5/0016 ,  G01V5/0025

摘要： The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

摘要翻译： 本申请公开了用于识别被扫描物体的材料组成的用于X射线扫描的系统和方法。 该系统包括至少一个用于在物体上投射X射线束的X射线源，其中投影的X射线束的至少一部分透射穿过物体，以及用于测量所述X射线束的能量谱的检测器阵列 透射X射线。 测量的能谱用于确定物体的原子序号，用于识别物体的材料组成。 X射线扫描系统还可以具有准直的高能量背散射X射线检测器阵列，用于以大于90度的角度测量由物体散射的X射线的能谱，其中测量的能谱结合使用 用传输能谱来确定用于识别物体的材料组成的物体的原子序号。