利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

35 条记录 (耗时 0.025 秒)

    OPTICAL IMAGE MEASUREMENT DEVICE
    4.
    发明申请
    OPTICAL IMAGE MEASUREMENT DEVICE 有权
    光学图像测量装置

    公开(公告)号：US20080151256A1

    公开(公告)日：2008-06-26

    申请号：US11961195

    申请日：2007-12-20

    申请人： Tsutomu KIKAWA ,  Hiroaki Okada ,  Takefumi Hayashi ,  Hisashi Tsukada ,  Yasufumi Fukuma

    发明人： Tsutomu KIKAWA ,  Hiroaki Okada ,  Takefumi Hayashi ,  Hisashi Tsukada ,  Yasufumi Fukuma

    IPC分类号： G01B11/02

    CPC分类号： G01B9/02068 ,  A61B3/10 ,  A61B3/102 ,  A61B3/12 ,  G01B9/0203 ,  G01B9/02044 ,  G01B9/02064 ,  G01B9/02089 ,  G01B9/02091 ,  G01B2290/65

    摘要： An optical image measurement device comprises: a light source configured to emit a low-coherence light; an interference-light generator configured to generate an interference light, by splitting the low-coherence light into a signal light and a reference light, and superimposing the signal light passed through a measurement object and the reference light passed through a reference object; a changer configured to change a difference in optical path length; a detector configured to detect the interference light; an image forming part configured to form an image of the measurement object within a predetermined frame based on the result of the detection; an analyzer configured to analyze the image, and specify a position of the image within the frame; and a controller configured to control the changer based on the specified position to change the difference so that an image newly formed is placed in a predetermined position within the frame.

    摘要翻译： 光学图像测量装置包括：被配置为发射低相干光的光源; 干涉光发生器，被配置为通过将低相干光分解为信号光和参考光来产生干涉光，并且叠加通过测量对象的信号光和通过参考对象的参考光; 更换器，被配置为改变光路长度的差异; 检测器，被配置为检测干涉光; 图像形成部，被配置为基于检测结果在预定帧内形成测量对象的图像; 分析器，其被配置为分析所述图像，并且指定所述图像在所述帧内的位置; 以及控制器，其被配置为基于所述指定位置来控制所述更换器以改变所述差异，使得新形成的图像被放置在所述帧内的预定位置。

    Optical image measurement device
    6.
    发明授权
    Optical image measurement device 有权
    光学图像测量装置

    公开(公告)号：US07643154B2

    公开(公告)日：2010-01-05

    申请号：US11961195

    申请日：2007-12-20

    申请人： Tsutomu Kikawa ,  Hiroaki Okada ,  Takefumi Hayashi ,  Hisashi Tsukada ,  Yasufumi Fukuma

    发明人： Tsutomu Kikawa ,  Hiroaki Okada ,  Takefumi Hayashi ,  Hisashi Tsukada ,  Yasufumi Fukuma

    IPC分类号： G01B11/02

    CPC分类号： G01B9/02068 ,  A61B3/10 ,  A61B3/102 ,  A61B3/12 ,  G01B9/0203 ,  G01B9/02044 ,  G01B9/02064 ,  G01B9/02089 ,  G01B9/02091 ,  G01B2290/65

    摘要： An optical image measurement device comprises: a light source configured to emit a low-coherence light; an interference-light generator configured to generate an interference light, by splitting the low-coherence light into a signal light and a reference light, and superimposing the signal light passed through a measurement object and the reference light passed through a reference object; a changer configured to change a difference in optical path length; a detector configured to detect the interference light; an image forming part configured to form an image of the measurement object within a predetermined frame based on the result of the detection; an analyzer configured to analyze the image, and specify a position of the image within the frame; and a controller configured to control the changer based on the specified position to change the difference so that an image newly formed is placed in a predetermined position within the frame.

    摘要翻译： 光学图像测量装置包括：被配置为发射低相干光的光源; 干涉光发生器，被配置为通过将低相干光分解为信号光和参考光来产生干涉光，并且叠加通过测量对象的信号光和通过参考对象的参考光; 更换器，被配置为改变光路长度的差异; 检测器，被配置为检测干涉光; 图像形成部，被配置为基于检测结果在预定帧内形成测量对象的图像; 分析器，其被配置为分析所述图像，并且指定所述图像在所述帧内的位置; 以及控制器，其被配置为基于所述指定位置来控制所述更换器以改变所述差异，使得新形成的图像被放置在所述帧内的预定位置。

    Refractometer with deflecting element
    9.
    发明授权
    Refractometer with deflecting element 失效
    带偏转元件的折射仪

    公开(公告)号：US5886780A

    公开(公告)日：1999-03-23

    申请号：US887264

    申请日：1997-07-02

    申请人： Yasufumi Fukuma ,  Takefumi Hayashi ,  Kazuhiko Tamura

    发明人： Yasufumi Fukuma ,  Takefumi Hayashi ,  Kazuhiko Tamura

    IPC分类号： A61B3/103 ,  G01N21/41 ,  G02C1/04

    CPC分类号： A61B3/103

    摘要： A refractometer comprising an optical pattern-beam projection system for projecting a pattern,light beam onto the fundus of a tested eye to measure refractive power of the tested eye, and an optical light-receiving system for receiving the pattern light beam reflected at the fundus to compute the refractive power of the tested eye. A deflecting member is inserted into an optical path of the optical pattern-beam projection system for deflecting the pattern light beam with respect to an optical axis of the optical pattern-beam projection system and then projecting the deflected pattern light beam onto the fundus.

    摘要翻译： 一种折射计，包括用于将图案投射到测试眼睛的眼底上的光学图案光束投射系统，以测量被测眼睛的屈光度;以及光接收系统，用于接收在眼底反射的图案光束 以计算被测眼睛的屈光度。 偏转构件插入到光学图案束投影系统的光路中，用于相对于光学图案束投影系统的光轴偏转图案光束，然后将偏转的图案光束投射到眼底上。