Position measuring device
    1.
    发明授权
    Position measuring device 有权
    位置测量装置

    公开(公告)号:US08570621B2

    公开(公告)日:2013-10-29

    申请号:US12989691

    申请日:2009-03-24

    IPC分类号: H04N1/04

    摘要: A position measuring device including a code having a sequence of code elements of equal width B that is disposed in a measurement direction and includes a first property and a second property. The sequence of codes elements includes a first set of code elements having the first property and a second set of code elements having the second property, wherein the first and second sets of code elements are each being disposed aperiodically. The position measuring device further including a scanning unit having a plurality of detectors for scanning the code and obtaining scanning signals, wherein a code word defining an absolute position is defined from the scanning signals. The position measuring device including an arrangement for forming an incremental signal from the scanning signals, wherein the arrangement includes a converter device and a collection device arranged downstream of the converter device and wherein the collection device forms respective intermittently periodic partial signals from the scanning signals derived from scanning positions in a spacing matrix.

    摘要翻译: 一种位置测量装置,包括具有沿测量方向设置的并且包括第一属性和第二属性的具有相等宽度B的代码元素序列的代码。 代码元素序列包括具有第一属性的第一组代码元素和具有第二属性的第二代码元素集合,其中第一和第二代码元素集合各自被非周期性地设置。 位置测量装置还包括扫描单元,该扫描单元具有用于扫描代码并获得扫描信号的多个检测器,其中根据扫描信号定义定义绝对位置的代码字。 所述位置测量装置包括用于根据扫描信号形成增量信号的装置,其中所述装置包括转换器装置和布置在所述转换器装置下游的收集装置,并且其中所述收集装置从衍生的扫描信号形成相应的间歇周期性部分信号 从间隔矩阵中的扫描位置。

    Position-measuring device
    2.
    发明授权
    Position-measuring device 有权
    位置测量装置

    公开(公告)号:US07473886B2

    公开(公告)日:2009-01-06

    申请号:US11801057

    申请日:2007-05-07

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01D5/34

    CPC分类号: G01D5/347

    摘要: In a position-measuring device for acquiring the relative position of a scanning unit and a reflection measuring graduation movable relative thereto in at least one measuring direction, the scanning unit includes a light source and a detector arrangement in a detection plane. In a first variant of the scanning unit, at least one optical reflector element is positioned in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between a virtual light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and the detector arrangement/detection plane on the other hand are identical. In a second variant, in the scanning unit at least one optical transmission element is disposed in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between the light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and a detector arrangement in a virtual detection plane on the other hand are identical.

    摘要翻译: 在用于获取扫描单元的相对位置的位置测量装置和在至少一个测量方向上可相对于其移动的反射测量刻度,扫描单元包括检测平面中的光源和检测器装置。 在扫描单元的第一变型中,至少一个光学反射器元件位于扫描光束路径中,其对扫描光束路径具有光学效应,使得虚拟光源与反射测量刻度之间的距离在一个 另一方面,反射测量刻度与检测器布置/检测平面之间的距离是相同的。 在第二种变型中,在扫描单元中,至少一个光传输元件被设置在扫描光束路径中,其具有对扫描光束路径的光学效应,使得一方面光源与反射测量刻度之间的距离 另一方面,虚拟检测平面中的反射测量刻度与检测器配置之间的距离相同。

    Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit
    3.
    发明申请
    Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit 有权
    扫描单元,用于使用这种扫描单元的刻度和位置测量系统的光学扫描的位置测量系统

    公开(公告)号:US20060227341A1

    公开(公告)日:2006-10-12

    申请号:US11391885

    申请日:2006-03-29

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/34715

    摘要: A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.

    摘要翻译: 一种扫描单元,用于对刻度进行光学扫描的位置测量系统,所述扫描单元包括用于沿朝向刻度的部分的方向透射光的光源和用于接收由所述刻度尺改变的光的检测器。 放置在检测器前面的透镜装置,透镜装置具有多个光学透镜,并用于在检测器上的图像场中产生扫描扫描区域的确定的图像,其中透镜装置将扫描区域减少 在检测器上的图像场中。

    Optical position measuring device
    4.
    发明授权
    Optical position measuring device 有权
    光学位置测量装置

    公开(公告)号:US08537370B2

    公开(公告)日:2013-09-17

    申请号:US12995070

    申请日:2009-03-31

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38 G01D5/34715

    摘要: A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.

    摘要翻译: 一种用于检测相对位置的测量装置,所述测量装置包括可在至少一个测量方向上移动的测量刻度和用于确定所述测量刻度相对于所述扫描单元的相对位置的扫描单元。 扫描单元包括光源,设置在位于扫描光束路径中的透明载体元件的第一侧上的扫描光栅和检测器装置。 扫描单元还包括以限定的方式调节检测器装置上的光强度的衰减结构,其中1)衰减结构设置在透明载体元件的第二侧上,与第一侧相对,或者2) 衰减结构具有至少沿着一个方向作为位置的函数变化的磁导率,使得至少在该一个方向上均匀的光强导致检测器布置。

    ROTARY POSITION MEASURING INSTRUMENT
    5.
    发明申请
    ROTARY POSITION MEASURING INSTRUMENT 有权
    旋转位置测量仪器

    公开(公告)号:US20130063732A1

    公开(公告)日:2013-03-14

    申请号:US13603846

    申请日:2012-09-05

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38

    摘要: A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.

    摘要翻译: 一种旋转位置测量仪器,包括光源和具有测量标准的刻度盘。 所述旋转位置测量仪器包括光电检测器组件,其中所述刻度盘相对于所述光源和所述检测器组件围绕旋转轴线可旋转,其中通过所述检测器组件可检测旋转角度相关位置信号。 光源与测量标准间隔开第一距离,并且检测器组件设置在与测量标准物隔开的第二距离处,其中第二距离不同于第一距离。 刻度盘包括具有光学效果的光学元件,其导致将光源的图像投射到距离测量标准具有第三距离的位置,其中第三距离不同于第一距离。

    Position measuring system
    6.
    发明授权
    Position measuring system 有权
    位置测量系统

    公开(公告)号:US07164482B2

    公开(公告)日:2007-01-16

    申请号:US10840812

    申请日:2004-05-07

    IPC分类号: G01B11/14

    CPC分类号: G01D5/34715

    摘要: A position measuring system that includes a scale having a measuring graduation extending along a first line and a scanning device. The scanning device includes a light source that transmits light beams that scan the measuring graduation, wherein the measuring graduation generates modified light from the transmitted light beams and a detector unit that receives the modified light from the measuring graduation. A lens arrangement, arranged between the scale and the detector unit, the lens arrangement generating a defined image of the measuring graduation on the, detector unit, wherein the defined image extends along a second line, whose curvature is different from a curvature of the first line.

    摘要翻译: 一种位置测量系统,包括具有沿着第一线延伸的测量刻度的刻度和扫描装置。 扫描装置包括透射扫描测量刻度的光束的光源,其中测量刻度产生来自透射光束的修正光,以及从测量刻度接收修改光的检测器单元。 布置在刻度尺和检测器单元之间的透镜布置,透镜装置在检测器单元上产生测量刻度的定义图像,其中限定的图像沿着第二线延伸,其第二线的曲率不同于第一 线。

    OPTICAL POSITION MEASURING DEVICE
    7.
    发明申请
    OPTICAL POSITION MEASURING DEVICE 有权
    光学位置测量装置

    公开(公告)号:US20110109917A1

    公开(公告)日:2011-05-12

    申请号:US12995070

    申请日:2009-03-31

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38 G01D5/34715

    摘要: A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.

    摘要翻译: 一种用于检测相对位置的测量装置,所述测量装置包括可在至少一个测量方向上移动的测量刻度和用于确定所述测量刻度相对于所述扫描单元的相对位置的扫描单元。 扫描单元包括光源,设置在位于扫描光束路径中的透明载体元件的第一侧上的扫描光栅和检测器装置。 扫描单元还包括以限定的方式调节检测器装置上的光强度的衰减结构,其中1)衰减结构设置在透明载体元件的第二侧上,与第一侧相对,或者2) 衰减结构具有至少沿着一个方向作为位置的函数变化的磁导率,使得至少在该一个方向上均匀的光强导致检测器布置。

    Optical position measuring device

    公开(公告)号:US20050168757A1

    公开(公告)日:2005-08-04

    申请号:US10510868

    申请日:2003-04-02

    CPC分类号: G01D5/38 G01D5/34715

    摘要: An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, AG (r) or the mutual distance between adjoining lenses of said lens array defined by the equation: wherein AG(r) is the A G ⁡ ( r ) =  β ⁡ ( r )  * [ t ⁡ ( r ) ⁢   * [ k + i + n ] + ψ ] (  β ⁡ ( r )  + 1 ) array, t(r) the period of the periodic grating structure, |β(r)| the absolute amount of the image scale β of the lens array ψ a presettable defined phase shift r the radius of the grating arrangement, wherein in the case of a linear grating r=∞, and AG, t and |β| are constants, i, k, n ε N, i.e. are natural numbers, including zero.

    Rotary position measuring instrument
    9.
    发明授权
    Rotary position measuring instrument 有权
    旋转位置测量仪

    公开(公告)号:US08937726B2

    公开(公告)日:2015-01-20

    申请号:US13603846

    申请日:2012-09-05

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14 G01D5/38

    CPC分类号: G01D5/38

    摘要: A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.

    摘要翻译: 一种旋转位置测量仪器,包括光源和具有测量标准的刻度盘。 所述旋转位置测量仪器包括光电检测器组件,其中所述刻度盘相对于所述光源和所述检测器组件围绕旋转轴线可旋转,其中通过所述检测器组件可检测旋转角度相关位置信号。 光源与测量标准间隔开第一距离,并且检测器组件设置在与测量标准物隔开的第二距离处,其中第二距离不同于第一距离。 刻度盘包括具有光学效果的光学元件,其导致将光源的图像投射到距离测量标准具有第三距离的位置,其中第三距离不同于第一距离。

    Position-measuring device
    10.
    发明授权
    Position-measuring device 有权
    位置测量装置

    公开(公告)号:US08854630B2

    公开(公告)日:2014-10-07

    申请号:US13203688

    申请日:2010-02-03

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14 G01B11/00 G01D5/347

    CPC分类号: G01B11/00 G01D5/34715

    摘要: A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.

    摘要翻译: 位置测量装置适合于在至少一个测量方向上检测扫描单元和可相对于其移动的反射测量光栅的相对位置。 扫描单元包括主光源以及检测平面中的至少一个检测器组件。 能够在来自主光源的检测平面中产生点光源的周期性配置。 主光源设置在检测平面上方。