Subpixel routing and processing for an imaging sytstem or the like
    2.
    发明申请
    Subpixel routing and processing for an imaging sytstem or the like 有权
    用于成像系统的子像素路由和处理等

    公开(公告)号:US20070120062A1

    公开(公告)日:2007-05-31

    申请号:US11291273

    申请日:2005-11-30

    IPC分类号: G01T1/24 G01T1/26 H01L27/146

    摘要: Briefly, in accordance with one or more embodiments, count rates may be obtained from one or more subpixels for a given pixel in an imaging system detector. Count rates may be obtained from individual subpixels, or may be from electronically binned subpixels at least in part in various subpixel arrangements where a selected subpixel arrangement may be adaptively set according to a detected count rate. For lower count rates, two or more subpixels may be electronically binned together and the counts may be obtained from the binned subpixels, for example to mitigate a charge sharing effect. For higher count rates, the count rates of a greater number of subpixels may be individually obtained, for example to mitigate a pulse pile-up effect. Detective quantum efficiency may be optimized over a wider range of photon flux rate via the adaptive subpixel arrangement.

    摘要翻译: 简而言之,根据一个或多个实施例,可以从成像系统检测器中的给定像素的一个或多个子像素获得计数率。 可以从各个子像素获得计数速率,或者可以至少部分地根据检测到的计数速率自适应地选择所选择的子像素排列的各种子像素排列从电子分组的子像素获得。 对于较低的计数率,可以将两个或更多个子像素电子地分组在一起,并且可以从二进制子像素获得计数,例如以减轻电荷共享效应。 对于更高的计数率,可以单独获得更多数量的子像素的计数率,例如以减轻脉冲堆积效应。 可以通过自适应子像素排列在更宽的光子通量速率范围内优化探测量子效率。

    Methods and apparatus for identification and imaging of specific materials
    9.
    发明申请
    Methods and apparatus for identification and imaging of specific materials 失效
    用于特定材料的识别和成像的方法和装置

    公开(公告)号:US20050084069A1

    公开(公告)日:2005-04-21

    申请号:US10687131

    申请日:2003-10-16

    IPC分类号: A61B6/00 A61B6/03 H05G1/64

    摘要: A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.

    摘要翻译: 用于分析对象中的材料的方法包括以高能量和低能量获取多个视图的物体的X射线投影数据。 所获取的X射线投影数据用于材料分解以确定两个所选基础材料的每个像素处的材料密度。 使用所选择的两种材料的材料密度区域的确定的映射来确定每个像素处的对象的组成。 使用所确定的构图来显示表示对象的构图的图像。