摘要:
A window ball grid array substrate and its package structure includes a package substrate with a long slot arranged thereon, wherein the improvement is characterized by the long slot penetrating an end of the package substrate making the package substrate appear to be U-shaped.
摘要:
A window-type BGA semiconductor package is revealed, primarily comprising a substrate with a wire-bonding slot, a chip disposed on a top surface of the substrate, and a plurality of bonding wires passing through the wire-bonding slot. A plurality of plating line stubs are formed on a bottom surface of the substrate, connect the bonding fingers on the substrate and extend to the wire-bonding slot. The bonding wires electrically connect the bonding pads of the chip to the corresponding bonding fingers of the substrate. The plating line stubs are compliant to the wire-bonding paths of the bonding wires correspondingly connected at the bonding fingers, such as parallel to the overlapped arrangement, to avoid electrical short between the plating line stubs and the bonding wires with no corresponding relationship of electrical connections.
摘要:
A BGA package and a substrate for the package are disclosed. A chip is disposed on a top surface of the substrate. A plurality of solder balls are disposed on a plurality of ball pads formed on a bottom surface of the substrate. The substrate has at least a core layer with a plurality of corner cavities filled with low-modulus materials as stress buffer. Additionally, some of the ball pads at the corners of the substrate are disposed under the corner cavities.
摘要:
A method for forming an isolated inner lead from a leadframe is revealed. The leadframe primarily comprises a plurality of leads, the isolated inner lead, and an external lead. Each lead has an inner portion having a finger. The isolated inner lead having two fingers is completely formed inside a molding area and is made of the same metal leadframe as the leads. One finger of the isolated inner lead and the fingers of the leads are linearly arranged. The other finger of the isolated inner lead is adjacent to a finger of the external lead. At least one of the inner portions divides the isolated inner lead from the external lead. The isolated inner lead is integrally connected to an adjacent one of the inner portions by a connecting block. A tape-attaching step is performed to mechanically connect the isolated inner lead where two insulating tapes are attached in a manner that the connecting block can be removed. Therefore, the isolated inner lead is electrically isolated from the leads and can be mechanically fixed to replace extra redistributing components during semiconductor packaging processes.
摘要:
A LOC leadframe-based semiconductor package includes a chip with multiple rows of bonding pads. At least a bus bar is attached to the chip and is disposed between a first row of bonding pads and the fingers of the leads. A plurality of bonding wires electrically connect the first row of bonding pads to the fingers of the leads. The portion of the bus bar attached to the active surface of the chip includes a bent section bent away from the fingers. A long bonding wire electrically connects one of a second row of bonding pads to one of the fingers of the leads by overpassing the bent section. Therefore, the distance between the long bonding wire and the bus bar is increased to avoid electrical short between the long bonding wire and the bus bar and to enhance the quality of electrical connections of the LOC semiconductor package.
摘要:
An IC package mainly includes a substrate having slot(s), a chip, a protective encapsulant, a stiffening encapsulant, and a plurality of external terminals. The Young's modulus of the stiffening encapsulant is greater than the one of the protective encapsulant and the curing shrinkage of the stiffening encapsulant is smaller than the one of the protective encapsulant. The protective encapsulant is formed on one of the surfaces of the substrate for encapsulating the chip. The stiffening encapsulant protrudes from the other surface of the substrate where the external terminals are disposed. Moreover, the stiffening encapsulant is formed inside the slot and is contacted with the chip. Since the stiffening encapsulant is embedded and formed inside the slot, therefore, the contact area of the stiffening encapsulant with the substrate is increased to enhance the warpage resistance of the IC package.
摘要:
A chip packaging process integrates a burn-in test or a high temperature test to simplify overall packaging and testing process flow. One or more chips are disposed on one or more units of a substrate strip where the substrate strip has a plurality of electrical open sections at the plating lines to electrically isolate the external pads between different units. After electrical connection and encapsulation, a burn-in test is executed at the same time of a post mold curing step, with a high-temperature testing if necessary. Therefore, the chips on the substrate strip has been gone through the burn-in test during the encapsulant is completely cured at the post mold curing step and the burn-in test is finished before the singulation step to reduce the overall testing time.
摘要:
A mounting assembly of semiconductor packages is revealed, primarily comprising at least a semiconductor package having a plurality of external terminals, a package carrier, and solder paste. The solder paste joints the external terminals to the package carrier. According to the distance to a central line on a substrate of the semiconductor package, the external terminals are divided into at least two different groups. In one of the embodiment, different groups of the external terminals are bumps with non-equal heights to achieve a uniform standoff plane to compensate the warpage of the substrate. The predicted substrate warpage can be compensated without causing any soldering defects. In another embodiment, a plurality of compensating bumps are selectively disposed on one group of the external terminals with larger stacking gaps.
摘要:
A semiconductor chip substrate with solder pad includes: a core layer and at least one conductive structure formed on the surface of the core layer; an insulation layer with at least one patterned opening covering the conductive structure, wherein the patterned opening has a center portion and a plurality of wing portions on the peripheral edge of the center portion to define the exposed area of the conductive structure as the solder pad. The solder pad with wing will improve the adhesion effect between the solder pad and the solder ball.
摘要:
A chip package and a lead frame used in the chip package are disclosed. The lead frame includes a plurality of first side leads and a plurality of second side leads where the first side leads have a plurality of first bent leads extending from a first edge and the second side leads have a plurality of second bent leads extending from a second edge. The inner ends of the first bent leads and the inner ends of the second bent leads are facing to a third edge between the first and second edges and are connected to the lead frame. Therefore, the lengths of the first side leads are equal and symmetrical to the ones of the second side leads without any suspended long leads for chip attachment. The chip package is most suitable for packaging chips with bonding pads on one single side.