Socket for inspection
    1.
    发明授权

    公开(公告)号:US11415624B2

    公开(公告)日:2022-08-16

    申请号:US17047625

    申请日:2019-01-31

    发明人: Junichi Miyaaki

    摘要: An IC socket (2) includes a first contact terminal (15a) that contacts a gull wing type lead terminal (1b) of an IC device (1), a second contact terminal that contacts a J-type lead terminal, a cam portion (3d) and a sliding portion (15c5) for bringing the first contact terminal (15a) into contact with the gull wing type lead terminal (1b), and a latch (6) for bringing the second contact terminal into contact with the J-type lead terminal. An asynchronous operation in which a contact operation by the cam portion (3d) and the sliding portion (15c5) is performed after a contact operation by the latch (6) is performed.

    SOCKET FOR INSPECTION
    2.
    发明申请

    公开(公告)号:US20210148970A1

    公开(公告)日:2021-05-20

    申请号:US17047625

    申请日:2019-01-31

    发明人: Junichi Miyaaki

    IPC分类号: G01R31/28 H01L23/32 H01R12/88

    摘要: An IC socket (2) includes a first contact terminal (15a) that contacts a gull wing type lead terminal (1b) of an IC device (1), a second contact terminal that contacts a J-type lead terminal, a cam portion (3d) and a sliding portion (15c5) for bringing the first contact terminal (15a) into contact with the gull wing type lead terminal (1b), and a latch (6) for bringing the second contact terminal into contact with the J-type lead terminal. An asynchronous operation in which a contact operation by the cam portion (3d) and the sliding portion (15c5) is performed after a contact operation by the latch (6) is performed.