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    Semiconductor test management system and method
    3.
    发明授权
    Semiconductor test management system and method 有权
    半导体测试管理系统及方法

    公开(公告)号：US07237160B2

    公开(公告)日：2007-06-26

    申请号：US10963863

    申请日：2004-10-13

    申请人： Ying-Lon Lu ,  Joshua Huang

    发明人： Ying-Lon Lu ,  Joshua Huang

    IPC分类号： G01R31/28 ,  G01R35/00 ,  G06F19/00

    CPC分类号： G01R31/2894

    摘要： A system and method thereof for semiconductor test management. A first computer generates a new gating rule and transmits the new gating rule. A second computer receives the new gating rule via a network, acquires a test result, carries the test result into the new gating rule to generate an advisory report. In which, the test result comprises a test value corresponding to a test attribute, the new gating rule determines a final advisory when the test value satisfies a specific condition comprising the test attribute, and the advisory report comprises the final advisory.

    摘要翻译： 一种用于半导体测试管理的系统及其方法。 第一台计算机生成一个新的门控规则并传输新的门控规则。 第二台计算机通过网络接收新的门控规则，获取测试结果，将测试结果运载到新的门控规则中，以生成一个咨询报告。 其中，测试结果包括与测试属性对应的测试值，当测试值满足包含测试属性的特定条件时，新的门控规则确定最终建议，并且咨询报告包括最终咨询。

    Method, system and program product for mask-based compression of a sparse matrix
    4.
    发明授权
    Method, system and program product for mask-based compression of a sparse matrix 有权

    公开(公告)号：US11469772B2

    公开(公告)日：2022-10-11

    申请号：US16773976

    申请日：2020-01-27

    申请人： Joshua Huang ,  Hsilin Huang

    发明人： Joshua Huang ,  Hsilin Huang

    IPC分类号： H03M7/30 ,  G06F13/40 ,  G06F3/06

    摘要： A method, system, and program product accesses chunks of data identifying data elements. A mask is used to identify a position of the data elements that have zero values and that have non-zero values. The data elements are processed based on the mask. For compression of data, data elements in chunks of data that have zero values and that have non-zero values are determined. A mask is used to identify a position of the data elements that have zero values and that have non-zero values. The data elements in the chunks of data having zero values are removed. The data elements having non-zero values are packed into the chunks to form the compressed data. For decompressing the data, zero-value data elements are added in positions in the chunks of data according to the mask to form uncompressed data.

    Semiconductor test management system and method
    5.
    发明申请
    Semiconductor test management system and method 有权
    半导体测试管理系统及方法

    公开(公告)号：US20060080582A1

    公开(公告)日：2006-04-13

    申请号：US10963863

    申请日：2004-10-13

    申请人： Ying-Lon Lu ,  Joshua Huang

    发明人： Ying-Lon Lu ,  Joshua Huang

    IPC分类号： G01R31/28

    CPC分类号： G01R31/2894

    摘要： A system and method thereof for semiconductor test management. A first computer generates a new gating rule and transmits the new gating rule. A second computer receives the new gating rule via a network, acquires a test result, carries the test result into the new gating rule to generate an advisory report. In which, the test result comprises a test value corresponding to a test attribute, the new gating rule determines a final advisory when the test value satisfies a specific condition comprising the test attribute, and the advisory report comprises the final advisory.

    摘要翻译： 一种用于半导体测试管理的系统及其方法。 第一台计算机生成一个新的门控规则并传输新的门控规则。 第二台计算机通过网络接收新的门控规则，获取测试结果，将测试结果运载到新的门控规则中，以生成一个咨询报告。 其中，测试结果包括与测试属性对应的测试值，当测试值满足包含测试属性的特定条件时，新的门控规则确定最终建议，并且咨询报告包括最终咨询。

    Method, System and Program Product for Mask-Based Compression of a Sparse Matrix
    6.
    发明申请
    Method, System and Program Product for Mask-Based Compression of a Sparse Matrix 审中-公开

    公开(公告)号：US20200228136A1

    公开(公告)日：2020-07-16

    申请号：US16773976

    申请日：2020-01-27

    申请人： Joshua Huang ,  Hsilin Huang

    发明人： Joshua Huang ,  Hsilin Huang

    IPC分类号： H03M7/30 ,  G06F13/40 ,  G06F3/06

    摘要： A method, system, and program product accesses chunks of data identifying data elements. A mask is used to identify a position of the data elements that have zero values and that have non-zero values. The data elements are processed based on the mask. For compression of data, data elements in chunks of data that have zero values and that have non-zero values are determined. A mask is used to identify a position of the data elements that have zero values and that have non-zero values. The data elements in the chunks of data having zero values are removed. The data elements having non-zero values are packed into the chunks to form the compressed data. For decompressing the data, zero-value data elements are added in positions in the chunks of data according to the mask to form uncompressed data.

    Semiconductor test management system and method
    7.
    发明授权
    Semiconductor test management system and method 有权
    半导体测试管理系统及方法

    公开(公告)号：US07155361B2

    公开(公告)日：2006-12-26

    申请号：US11064634

    申请日：2005-02-24

    申请人： Joshua Huang

    发明人： Joshua Huang

    IPC分类号： G01R31/00

    CPC分类号： G01R31/2894

    摘要： A system and method for semiconductor test management. A second computer receives a scrap rule from a first computer, acquires an initial scrap threshold corresponding to the scrap rule, stores the scrap rule as a SBC/SBL (Statistic BIN Control/Statistic BIN Limit) rule when a scrap condition therein is less or equally restrictive than the initial scrap threshold, acquires a CP (Circuit Probing) test result for a wafer or wafer lot and generates an advisory report for the wafer or wafer lot by carrying the CP test result into the stored SBC/SBL rules.

    摘要翻译： 一种用于半导体测试管理的系统和方法。 第二台计算机从第一台计算机接收废料规则，获取与废料规则相对应的初始废料阈值，当其中的废钢条件较少时，将废料规则存储为SBC / SBL（统计BIN控制/统计BIN限制）规则 与初始废品阈值相同的限制，获取晶圆或晶圆批次的CP（电路检测）测试结果，并通过将CP测试结果携带到存储的SBC / SBL规则中，为晶圆或晶圆批生成一个咨询报告。

    Semiconductor test management system and method
    8.
    发明申请
    Semiconductor test management system and method 有权

    公开(公告)号：US20060190206A1

    公开(公告)日：2006-08-24

    申请号：US11064634

    申请日：2005-02-24

    申请人： Joshua Huang

    发明人： Joshua Huang

    IPC分类号： G01R27/28

    CPC分类号： G01R31/2894

    摘要： A system and method for semiconductor test management. A second computer receives a scrap rule from a first computer, acquires an initial scrap threshold corresponding to the scrap rule, stores the scrap rule as a SBC/SBL (Statistic BIN Control/Statistic BIN Limit) rule when a scrap condition therein is less or equally restrictive than the initial scrap threshold, acquires a CP (Circuit Probing) test result for a wafer or wafer lot and generates an advisory report for the wafer or wafer lot by carrying the CP test result into the stored SBC/SBL rules.

    Systems and methods for manufacturing execution system integration
    9.
    发明授权
    Systems and methods for manufacturing execution system integration 有权
    制造执行系统集成的系统和方法

    公开(公告)号：US07031784B1

    公开(公告)日：2006-04-18

    申请号：US11021050

    申请日：2004-12-23

    申请人： Po-Chun Lai ,  Joshua Huang

    发明人： Po-Chun Lai ,  Joshua Huang

    IPC分类号： G06F19/00

    CPC分类号： G05B19/41865 ,  G05B2219/31372 ,  Y02P90/12 ,  Y02P90/18 ,  Y02P90/20

    摘要： Systems and methods for MES (manufacturing execution system) integration. A Web server receives lot control data for a lot control operation performed in a MES server and selectively transmits the lot control data. A message encoder receives the lot control data from the Web server and encodes the lot control data in a lot control message for the MES server. A message controller receives the lot control message and directs the MES server to perform the lot control operation according to the lot control message.

    摘要翻译： MES（制造执行系统）集成的系统和方法。 Web服务器接收在MES服务器中执行的批次控制操作的批量控制数据，并选择性地发送批次控制数据。 消息编码器从Web服务器接收批量控制数据，并对MES服务器的批量控制消息中的批量控制数据进行编码。 消息控制器接收批量控制消息，并指示MES服务器根据批量控制消息执行批量控制操作。