摘要:
A semiconductor device manufacturing method includes: a process of forming an isolation trench on the surface of a semiconductor substrate; a process of forming a thermally-oxidized film on the surface of the isolation trench; a process of depositing a silicon oxynitride film on the semiconductor substrate via the thermally-oxidized film; a process of heat-treating the silicon oxynitride film in an oxidizing atmosphere; and a process of etching the top of the thermally-oxidized film and the heat-treated silicon oxynitride film.