NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM
    1.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM 有权
    非易失性半导体存储器件和非易失性半导体存储器系统

    公开(公告)号:US20110188319A1

    公开(公告)日:2011-08-04

    申请号:US13010165

    申请日:2011-01-20

    IPC分类号: G11C16/06

    CPC分类号: G11C16/06

    摘要: A nonvolatile semiconductor memory device and a nonvolatile memory system having a unit which suppresses erroneous reading of a nonvolatile semiconductor memory device of a multi-level memory system are provided. In the nonvolatile semiconductor memory device and the nonvolatile memory system of the multi-level memory system, a first verify voltage is used when data is written before a packaging process, and the verify voltage is switched to a second verify voltage lower than the first verify voltage when data is written after the packaging process.

    摘要翻译: 提供一种具有抑制多层存储器系统的非易失性半导体存储器件的错误读取的单元的非易失性半导体存储器件和非易失性存储器系统。 在多级存储器系统的非易失性半导体存储器件和非易失性存储器系统中,当在封装处理之前写入数据时,使用第一验证电压,并将验证电压切换到低于第一校验电压的第二验证电压 在包装过程中写入数据时的电压。

    Nonvolatile semiconductor memory device and nonvolatile semiconductor memory system
    2.
    发明授权
    Nonvolatile semiconductor memory device and nonvolatile semiconductor memory system 有权
    非易失性半导体存储器件和非易失性半导体存储器系统

    公开(公告)号:US08274836B2

    公开(公告)日:2012-09-25

    申请号:US13010165

    申请日:2011-01-20

    IPC分类号: G11C16/06

    CPC分类号: G11C16/06

    摘要: A nonvolatile semiconductor memory device and a nonvolatile memory system having a unit which suppresses erroneous reading of a nonvolatile semiconductor memory device of a multi-level memory system are provided. In the nonvolatile semiconductor memory device and the nonvolatile memory system of the multi-level memory system, a first verify voltage is used when data is written before a packaging process, and the verify voltage is switched to a second verify voltage lower than the first verify voltage when data is written after the packaging process.

    摘要翻译: 提供一种具有抑制多层存储器系统的非易失性半导体存储器件的错误读取的单元的非易失性半导体存储器件和非易失性存储器系统。 在多级存储器系统的非易失性半导体存储器件和非易失性存储器系统中,当在封装处理之前写入数据时,使用第一验证电压,并将验证电压切换到低于第一校验电压的第二验证电压 在包装过程中写入数据时的电压。

    Non-volatile semiconductor memory device capable of preventing over-programming
    3.
    发明授权
    Non-volatile semiconductor memory device capable of preventing over-programming 有权
    能够防止过度编程的非易失性半导体存储器件

    公开(公告)号:US08203877B2

    公开(公告)日:2012-06-19

    申请号:US12884594

    申请日:2010-09-17

    IPC分类号: G11C11/34

    摘要: According to one embodiment, a semiconductor memory device includes a memory cell array, a data memory circuit, a power generation circuit, and a controller. In the memory cell array, a plurality of memory cells which store two-or-more-bit data are arrayed in a matrix. When data is written to all memory cells connected to selected word lines, the controller performs a write operation with a write voltage obtained by adding the step-up voltage to the write voltage until a write count indicating a number of times by which writing is performed reaches a first write count. When the first write count is exceeded, the controller controls whether the step-up voltage is to be added or not, for each write operation.

    摘要翻译: 根据一个实施例,半导体存储器件包括存储单元阵列,数据存储电路,发电电路和控制器。 在存储单元阵列中,存储两位或多位数据的多个存储单元被排列成矩阵。 当将数据写入连接到选定字线的所有存储单元时,控制器通过将升压电压加到写入电压而获得的写入电压进行写入操作,直到写入计数指示进行写入的次数 达到第一个写入数。 当超过第一次写入计数时,控制器控制是否对每个写入操作添加升压电压。

    NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
    4.
    发明申请
    NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE 有权
    非易失性半导体存储器件

    公开(公告)号:US20130235662A1

    公开(公告)日:2013-09-12

    申请号:US13607699

    申请日:2012-09-08

    申请人: Masaki Fujiu

    发明人: Masaki Fujiu

    IPC分类号: G11C16/34

    摘要: In one embodiment, a control circuit executes a first page writing operation, a first verify operations, a second page writing operation, a second verify operations, a step-up operation. The control circuit executes the first page writing operation which forms an intermediate distribution, and a first read operation which reads data form the intermediate distribution by using a determine voltage higher than a first verify voltage with a first value, and changes a second verify voltage based on the result of the first read operation.

    摘要翻译: 在一个实施例中,控制电路执行第一页写入操作,第一验证操作,第二页写入操作,第二验证操作,升压操作。 控制电路执行形成中间分布的第一页写入操作和通过使用高于具有第一值的第一验证电压的确定电压从中间分布读取数据的第一读取操作,并且基于 对第一次读取操作的结果。

    SEMICONDUCTOR MEMORY DEVICE
    5.
    发明申请

    公开(公告)号:US20110063911A1

    公开(公告)日:2011-03-17

    申请号:US12951616

    申请日:2010-11-22

    IPC分类号: G11C16/04 G11C16/16

    摘要: A semiconductor memory device includes a memory cell array including a plurality of blocks each including a memory cell unit, and a selection transistor which selects the memory cell unit, and a row decoder including a first block selector and a second block selector each of which includes a plurality of transfer transistors which are formed to correspond to the plurality of blocks and arranged adjacent to each other in a word-line direction wherein the diffusion layers are formed to oppose each other in the first block selector and the second block selector, and a width between the diffusion layers of the first block selector and the second block selector adjacent to each other in the word-line direction is made larger than a width between the diffusion layers in each of the first block selector and the second block selector adjacent to each other in the word-line direction.

    Semiconductor memory device including stacked gate having charge accumulation layer and control gate and method of writing data to semiconductor memory device
    6.
    发明授权
    Semiconductor memory device including stacked gate having charge accumulation layer and control gate and method of writing data to semiconductor memory device 有权
    半导体存储器件包括具有电荷累积层和控制栅极的堆叠栅极以及将数据写入半导体存储器件的方法

    公开(公告)号:US08184484B2

    公开(公告)日:2012-05-22

    申请号:US13182847

    申请日:2011-07-14

    申请人: Masaki Fujiu

    发明人: Masaki Fujiu

    IPC分类号: G11C11/34

    摘要: A semiconductor memory device includes memory cells, word lines, a driver circuit, and a control circuit. The driver circuit repeats a programming operation of selecting any one of the word lines, of applying a first voltage to selected one of the word lines, and of applying a second voltage to unselected one of the word lines, to write data to selected one of the memory cells connected to the selected one of the word lines. The control circuit, while the driver circuit is repeating the programming operation, steps up the first voltage and keeps the second voltage constant until the first voltage reaches a first threshold. The control circuit steps up the second voltage after the first voltage has reached the first threshold.

    摘要翻译: 半导体存储器件包括存储单元,字线,驱动电路和控制电路。 驱动器电路重复编程操作,其选择任何一条字线,将第一电压施加到选定的一条字线,以及将第二电压施加到未选择的一条字线,以将数据写入到 所述存储器单元连接到所选择的一条字线。 控制电路在驱动电路重复编程操作时,升高第一电压并保持第二电压恒定,直到第一电压达到第一阈值。 控制电路在第一电压达到第一阈值之后升高第二电压。

    Non-volatile semiconductor memory device
    9.
    发明授权
    Non-volatile semiconductor memory device 有权
    非易失性半导体存储器件

    公开(公告)号:US09007826B2

    公开(公告)日:2015-04-14

    申请号:US13607699

    申请日:2012-09-08

    申请人: Masaki Fujiu

    发明人: Masaki Fujiu

    摘要: In one embodiment, a control circuit executes a first page writing operation, a first verify operations, a second page writing operation, a second verify operations, a step-up operation. The control circuit executes the first page writing operation which forms an intermediate distribution, and a first read operation which reads data form the intermediate distribution by using a determine voltage higher than a first verify voltage with a first value, and changes a second verify voltage based on the result of the first read operation.

    摘要翻译: 在一个实施例中,控制电路执行第一页写入操作,第一验证操作,第二页写入操作,第二验证操作,升压操作。 控制电路执行形成中间分布的第一页写入操作和通过使用高于具有第一值的第一验证电压的确定电压从中间分布读取数据的第一读取操作,并且基于 对第一次读取操作的结果。

    Semiconductor memory device
    10.
    发明授权
    Semiconductor memory device 有权
    半导体存储器件

    公开(公告)号:US08867269B2

    公开(公告)日:2014-10-21

    申请号:US13709291

    申请日:2012-12-10

    申请人: Masaki Fujiu

    发明人: Masaki Fujiu

    IPC分类号: G11C11/56 G11C16/06 G11C16/04

    摘要: A semiconductor memory device includes: a memory cell array including a plurality of memory cells, a plurality of word lines, and a plurality of bit lines, and a control circuit. A first memory cell stores first data of n bits, a second memory cell stores second data used to determine whether data of k bits is stored in the first memory cell, and the control circuit performs first determination of determining data read from the data of the second memory cell, performs second determination of determining data read from the second memory cell by supplying the first word line with a second read voltage different from the first read voltage, and outputs either one of a result obtained by reading the data stored in the first memory cell at the first read voltage and a result obtained by reading the data stored in the first memory cell at the second read voltage, based on a result of the second determination.

    摘要翻译: 半导体存储器件包括:包括多个存储单元,多个字线和多个位线的存储单元阵列,以及控制电路。 第一存储器单元存储n位的第一数据,第二存储单元存储用于确定k位的数据是否存储在第一存储单元中的第二数据,并且控制电路执行第一确定从第 第二存储单元,通过向第一字线提供与第一读取电压不同的第二读取电压来执行确定从第二存储器单元读取的数据的第二确定,并且输出通过读取存储在第一存储器单元中的数据而获得的结果中的任一个 存储单元,并且基于第二确定的结果,通过以第二读取电压读取存储在第一存储单元中的数据而获得的结果。