公开(公告)号：US5221497A

公开(公告)日：1993-06-22

申请号：US746634

申请日：1991-08-19

申请人： Yoshitane Watanabe ,  Mikio Ando ,  Kenji Tanimoto ,  Tsutomu Kagamimiya ,  Makoto Kawashima

发明人： Yoshitane Watanabe ,  Mikio Ando ,  Kenji Tanimoto ,  Tsutomu Kagamimiya ,  Makoto Kawashima

IPC分类号： C01B33/145 ,  C01B33/148

CPC分类号： C01B33/148 ,  C01B33/145

摘要： A method for preparing a stable silica sol having an SiO.sub.2 concentration of 40% or less, the colloidal particles of said silica having a particle size of 40 to 500 nm, as measured by dynamic light-scattering and having an elongated shape having a thickness of 5 to 40 nm and an elongation of 5 to 30 times the thickness in only one plane, the method comprising the steps (a), (b) and (c): (a) mixing an aqueous solution of Ca or Mg salt with an aqueous solution of active silicic acid having an SiO.sub.2 concentration of 1 to 6% and a pH value of 2 to 5, or with an aqueous acidic silica sol having a particle size of 3 to 30 nm, an SiO.sub.2 concentration of 0.5 to 25% and a pH value of 1 to 5 in a weight ratio of 1500 to 10000 ppm of (CaO or MgO)/SiO.sub.2 ; (b) mixing an alkali metal hydroxide with the solution obtained by step (a) in a molar ratio of 20 to 300 as SiO.sub.2 /M.sub.2 O, wherein M represents an alkali metal atom; and (c) heating the mixture obtained by step (b) at 60.degree. to 300.degree. C. for 0.5 to 40 hours.

摘要翻译： 制备SiO 2浓度为40％以下的稳定的二氧化硅溶胶的方法，通过动态光散射测定的所述二氧化硅的粒径为40〜500nm的胶体粒子，其厚度为 （a），（b）和（c）的方法：（a）将Ca或Mg盐水溶液与 SiO 2浓度为1〜6％，pH值为2〜5的活性硅酸水溶液，或粒径为3〜30nm，SiO 2浓度为0.5〜25％的酸性硅酸水溶液，以及 （CaO或MgO）/ SiO 2的重量比为1500〜10000ppm的pH值为1〜5; （b）将碱金属氢氧化物与作为SiO 2 / M 2 O的摩尔比为20〜300的步骤（a）得到的溶液混合，其中M表示碱金属原子; 和（c）将步骤（b）获得的混合物在60℃至300℃下加热0.5至40小时。

公开(公告)号：US5196177A

公开(公告)日：1993-03-23

申请号：US641709

申请日：1991-01-15

申请人： Yoshitane Watanabe ,  Yoshiyuki Kashima ,  Kenji Tanimoto

发明人： Yoshitane Watanabe ,  Yoshiyuki Kashima ,  Kenji Tanimoto

IPC分类号： C01B33/149

CPC分类号： C01B33/149

摘要： A sol of flat silica particles (100-1000 nm in size) is produced by the following steps (a) to (d) from an acidic aqueous sol (S.sub.0) of negatively charged silica particles (7-30 nm in diameter) and an aqueous solution (B) of basic aluminum or zirconium salt.(a) mixing 100 parts by weight (as SiO.sub.2) of the sol (S.sub.0) with 0.2-10 parts by weight (as Al.sub.2 O.sub.3 or ZrO.sub.2) of the aqueous solution (B), and adjusting the resulting sol to pH 4-7, thereby yielding a sol (S.sub.1),(b) mixing 100 parts by weight (as SiO.sub.2) of the sol (S.sub.1) with 20-200 parts by weight (as SiO.sub.2) of the sol (S.sub.0), and adjusting the resulting sol to pH 4-7, thereby yielding a sol (S.sub.2),(c) mixing 100 parts by weight (as SiO.sub.2) of the sol (S.sub.2) with the aqueous solution (B) in an amount corresponding to 2-50% of the amount (as Al.sub.2 O.sub.3 or ZrO.sub.2 in parts by weight) added to 100 parts by weight (as SiO.sub.2) of the sol (S.sub.0) used in step (a), and adjusting the resulting sol to pH 4-7, thereby yielding a sol (S.sub.3), and(d) mixing 100 parts by weight (as SiO.sub.2) of the sol (S.sub.3) with the sol (S.sub.0) in an amount corresponding to 10-95% of the amount (as SiO.sub.2 in parts by weight) added to 100 parts by weight (as SiO.sub.2) of the sol (S.sub.1) in step (b), and adjusting the resulting sol to pH 4-7, thereby yielding a sol (S.sub.4).

公开(公告)号：US07752864B2

公开(公告)日：2010-07-13

申请号：US11659121

申请日：2005-08-01

申请人： Masaaki Takegami ,  Takeo Ueno ,  Kenji Tanimoto ,  Satoru Sakae

发明人： Masaaki Takegami ,  Takeo Ueno ,  Kenji Tanimoto ,  Satoru Sakae

IPC分类号： F25B13/00

CPC分类号： F25B13/00 ,  F25B2313/0231

摘要： A refrigeration apparatus (1) is provided with a refrigerant circuit (1E) along which are connected a compressor (2), an outdoor heat exchanger (4), an expansion mechanism, an indoor heat exchanger (41) for providing room air conditioning, and a cooling heat exchanger (45, 51) for providing storage compartment cooling. The refrigerant circuit (1E) includes a discharge side three way switch valve (101) for varying the flow rate of a portion of the refrigerant which is discharged out of the compressor (2) and then distributed to the indoor heat exchanger (41) and the outdoor heat exchanger (4) during a heat recovery operation mode in which the indoor heat exchanger (41) and the outdoor heat exchanger (4) operate as condensers. As a result of such arrangement, even when the amount of heat obtained in the cooling heat exchanger (45, 51) exceeds the amount of heat required in the indoor heat exchanger (41), surplus heat is discharged without excessive decrease in the discharge pressure of the compressor (2).

摘要翻译： 制冷装置（1）具备：制冷剂回路（1E），连接有压缩机（2），室外热交换器（4），膨胀机构，室内空调用的室内热交换器（41） 以及用于提供储藏室冷却的冷却热交换器（45,51）。 制冷剂回路（1E）包括排出侧三通切换阀（101），用于改变从压缩机（2）排出的一部分制冷剂的流量，然后分配到室内热交换器（41）和 在室内热交换器（41）和室外热交换器（4）作为冷凝器运转的热回收运转模式中的室外热交换器（4）。 作为这种结构的结果，即使在冷却热交换器（45,51）中获得的热量超过室内热交换器（41）所需的热量的情况下，也可以排出多余的热量而不会使排出压力过度降低 的压缩机（2）。

公开(公告)号：US20080156908A1

公开(公告)日：2008-07-03

申请号：US12071785

申请日：2008-02-26

申请人： Isao Ota ,  Kenji Tanimoto ,  Gen Yamada ,  Noriyuki Takakuma

发明人： Isao Ota ,  Kenji Tanimoto ,  Gen Yamada ,  Noriyuki Takakuma

IPC分类号： B02C17/20

CPC分类号： B02C17/00 ,  B02C17/20 ,  C09K3/1409

摘要： A method of milling cerium compound by means of a ball mill using a milling medium, characterized in that ratio Hb/r of radius r of a cylindrical ball mill container and depth Hb of the milling medium in the ball mill container disposed horizontally ranges from 1.2 to 1.9, and the ball mill container is rotated at a rotational speed which is 50% or less of critical rotational speed Nc=299/r1/2 of the ball mill container converted from the radius r expressed in centimeter. The milling method can be carried out in a wet or dry process, and the cerium compound is preferably cerium oxide. The method can be also applied for producing a cerium compound slurry.

摘要翻译： 一种通过使用研磨介质的球磨机研磨铈化合物的方法，其特征在于，圆柱形球磨机容器的半径r与深度H b b的比值H b / 水平设置的球磨机容器中的研磨介质的SUB> 1.2〜1.9，球磨容器以临界旋转速度N C = 50％以下的转速旋转， 从以半径r表示的半径r转换的球磨机容器的299 / r 1/2倍。 研磨方法可以在湿法或干法中进行，铈化合物优选为氧化铈。 该方法也可用于制备铈化合物浆料。

公开(公告)号：US20070241278A1

公开(公告)日：2007-10-18

申请号：US11808376

申请日：2007-06-08

申请人： Makoto Suzuki ,  Kenji Tanimoto ,  Yuko Sasaki

发明人： Makoto Suzuki ,  Kenji Tanimoto ,  Yuko Sasaki

IPC分类号： G01N23/00

CPC分类号： H01J37/21 ,  H01J37/265 ,  H01J37/28 ,  H01J2237/216 ,  H01J2237/24592 ,  H01J2237/2487 ,  H01J2237/2817 ,  H01J2237/2826

摘要： A charged particle beam apparatus obtains an image by detecting a generation signal inclusively indicative of secondary electrons generated from a specimen. The apparatus has an input unit for inputting current and voltage values to be applied to a charged particle optical system through which the charged particle beam travels, a memory unit for storing shape, position and physical properties of the charged particle optical system and accuracy of the applied current or voltage, an electromagnetic field calculation unit for calculating an electromagnetic field near a path of the charged particle beam, a charged particle trajectory calculation unit for calculating a trajectory of the charged particle beam in the calculated electromagnetic field, a memory unit for storing a result of the trajectory calculation and a controller for controlling the charged particle optical system on the basis of the result of the trajectory calculation.

公开(公告)号：US20070228276A1

公开(公告)日：2007-10-04

申请号：US11692263

申请日：2007-03-28

申请人： HIROSHI MAKINO ,  Kenji Tanimoto ,  Zhaohui Cheng ,  Hikaru Koyama

发明人： HIROSHI MAKINO ,  Kenji Tanimoto ,  Zhaohui Cheng ,  Hikaru Koyama

IPC分类号： G21K7/00

CPC分类号： H01J37/265 ,  H01J2237/047 ,  H01J2237/0473 ,  H01J2237/0475 ,  H01J2237/2817

摘要： When performing an inspection using a charge control function in a SEM wafer inspection apparatus, acceleration voltage, control voltage and deceleration voltage are changed in conjunction so that incident energy determined by “acceleration voltage−deceleration voltage” and bias voltage determined by “deceleration voltage−control voltage” do not change. By this means, charge of a wafer can be controlled, while restraining electrostatic lens effect generated near a control electrode. As a result, an inspection using a charge control function at low incident energy and in a wide viewing field can be performed, and a highly sensitive inspection of semiconductor patterns subject to damages due to electron beam irradiation can be realized. Acceleration voltage, control voltage and deceleration voltage are changed in conjunction so that incident energy determined by “acceleration voltage−deceleration voltage” and bias voltage determined by “deceleration voltage−control voltage” do not change.

摘要翻译： 当在SEM晶片检查装置中使用充电控制功能进行检查时，加速电压，控制电压和减速电压结合起来，使得由“加速电压 - 减速电压”确定的入射能量和由“减速电压 - 控制电压“不变。 通过这种方式，可以控制晶片的电荷，同时抑制在控制电极附近产生的静电透镜效应。 结果，可以执行使用低入射能量和宽视场中的电荷控制功能的检查，并且可以实现由于电子束照射而受到损害的半导体图案的高灵敏度检查。 加速电压，控制电压和减速电压结合起来，使得由“加速电压 - 减速电压”确定的入射能量和由“减速电压控制电压”确定的偏置电压不变。

公开(公告)号：US07155928B2

公开(公告)日：2007-01-02

申请号：US10489297

申请日：2003-07-02

申请人： Masaaki Takegami ,  Kenji Tanimoto

发明人： Masaaki Takegami ,  Kenji Tanimoto

IPC分类号： F25B1/00 ,  F25B49/00

CPC分类号： F25B13/00 ,  F25B1/10 ,  F25B40/00 ,  F25B2313/007 ,  F25B2313/0231 ,  F25B2313/0233 ,  F25B2313/02331 ,  F25B2400/075 ,  F25B2400/0751 ,  F25B2400/16 ,  F25B2400/22 ,  F25B2600/021 ,  Y02B30/741

摘要： In a refrigerating apparatus in which a plurality of application-side heat exchangers (41, 45, 51) are connected to a heat-source side heat exchanger (4), liquid lines for a plurality of channels in a refrigerant circuit (1E) share a liquid side communication pipe (11) in order to reduce the number of pipes. Further, the liquid side communication pipe (11) is provided adjacent to a low-pressure gas side communication pipe (15) for at least one channel so as to contact it in order to supercool a liquid refrigerant by a low-pressure gas refrigerant. Thus, workability for connecting the pipes is improved and a refrigerating ability may not be decreased even if communication pipes (11, 15, 17) become long.

摘要翻译： 在多个利用侧热交换器（41,45,51）与热源侧热交换器（4）连接的制冷装置中，制冷剂回路（1E）中的多个通道的液体管线 共享液侧连通管（11），以减少管道数量。 此外，液侧连通管（11）与低压气体侧连通管（15）相邻设置，用于至少一个通道以与其接触，以便通过低压气体制冷剂使液体制冷剂过冷。 因此，即使连通管（11,15,17）变长，也可以提高连接管的可加工性，并且制冷能力也不会降低。

公开(公告)号：US07098455B2

公开(公告)日：2006-08-29

申请号：US10404451

申请日：2003-04-02

申请人： Hiroyuki Shinada ,  Atsuko Takafuji ,  Takanori Ninomiya ,  Yuko Sasaki ,  Mari Nozoe ,  Hisaya Murakoshi ,  Taku Ninomiya ,  Yuji Kasai ,  Hiroshi Makino ,  Yutaka Kaneko ,  Kenji Tanimoto

发明人： Hiroyuki Shinada ,  Atsuko Takafuji ,  Takanori Ninomiya ,  Yuko Sasaki ,  Mari Nozoe ,  Hisaya Murakoshi ,  Taku Ninomiya ,  Yuji Kasai ,  Hiroshi Makino ,  Yutaka Kaneko ,  Kenji Tanimoto

IPC分类号： H01J37/28

CPC分类号： G01N23/225 ,  G01R31/307 ,  H01J37/28 ,  H01J2237/2817

摘要： A circuit pattern inspecting instrument includes an electron-optical system for irradiating an electron beam on a sample, an electron beam deflector, a detector for detecting secondary charged particles from the sample, and a mode setting unit for switching between a first mode and a second mode. An electron beam current is larger in the first mode than in the second mode, and an electron beam scanning speed is higher in the first mode than in the second mode. The circuit pattern inspecting instrument is configured so that first the sample is observed in the first mode, then a particular position on the sample is selected based on image data produced by an output of the detector in the first mode, and then the particular position on the sample is observed in the second mode.

公开(公告)号：US4464682A

公开(公告)日：1984-08-07

申请号：US377769

申请日：1982-05-13

申请人： Satoshi Etoh ,  Junichi Kobayashi ,  Kenji Tanimoto

发明人： Satoshi Etoh ,  Junichi Kobayashi ,  Kenji Tanimoto

IPC分类号： H04N1/17

CPC分类号： H04N1/17

摘要： An auxiliary scanning control system for facsimile is provided with a white line skip function to speed communication. A mechanism is provided whereby the data corresponding to the first line of information following the line skipping operation is added to that of the next line and stored in a memory unit, so that the information of the first line is not neglected in subsequent printing.

摘要翻译： 用于传真的辅助扫描控制系统设置有用于加速通信的白线跳过功能。 提供了一种机制，由此将与行跳过操作之后的第一行信息相对应的数据添加到下一行的数据并存储在存储单元中，使得在后续打印中第一行的信息不被忽略。

公开(公告)号：US4059637A

公开(公告)日：1977-11-22

申请号：US607020

申请日：1975-08-22

申请人： Hirokazu Hosaka ,  Kenji Tanimoto ,  Hiromichi Okabe ,  Kunthiko Tanaka ,  Yuji Ueda ,  Iwao Dohgane

发明人： Hirokazu Hosaka ,  Kenji Tanimoto ,  Hiromichi Okabe ,  Kunthiko Tanaka ,  Yuji Ueda ,  Iwao Dohgane

IPC分类号： C07C409/12 ,  C07C67/00 ,  C07C407/00 ,  C07C179/02

CPC分类号： C07C407/003

摘要： A method for extracting a dihydroperoxide of a dialkylbenzene of the formula, ##STR1## wherein each R.sub.1, R.sub.2, R.sub.3 and R.sub.4 is independently a lower alkyl group, from an aqueous alkali solution of the said dihydroperoxide with at least one organic solvent selected from the group consisting of C.sub.4 -C.sub.10 ketones, C.sub.4 -C.sub.10 ethers and C.sub.4 -C.sub.8 alcohols, which comprises extracting the dihydroperoxide by a countercurrent multi-stage extraction at a temperature between 0.degree. and 85.degree. C with a temperature gradient, the aqueous alkali solution being fed to the lower temperature zone, the organic solvent being fed to the higher temperature zone, and each aqueous alkali solution and organic solvent being fed countercurrently, whereby the dihydroperoxide is obtained in the form of organic solvent solution from the lower temperature zone.

摘要翻译： 一种提取下式的二烷基苯的二氢过氧化物的方法，其中每个R 1，R 2，R 3和R 4各自为低级烷基，所述二氢过氧化物的碱性水溶液与至少一种选自以下的有机溶剂 其包括C4-C10酮，C4-C10醚和C4-C8醇，其包括在0℃至85℃之间的温度梯度下通过逆流多级萃取萃取二氢过氧化物，碱水溶液为 进料到较低温度区域，将有机溶剂进料到较高温度区域，并将每种碱性水溶液和有机溶剂逆流进料，由此从低温区获得有机溶剂溶液形式的二氢过氧化物。