FREEFORM SURFACE IMAGING SPECTROMETER SYSTEM

    公开(公告)号:US20190250033A1

    公开(公告)日:2019-08-15

    申请号:US16246790

    申请日:2019-01-14

    IPC分类号: G01J3/02 G01J3/28

    CPC分类号: G01J3/024 G01J3/2823

    摘要: A freeform surface imaging spectrometer system including a primary mirror, a secondary mirror, a tertiary mirror, and a detector is provided. The secondary mirror is a grating having a freeform surface shape, and the grating having the freeform surface shape is obtained by intersecting a set of equally spaced parallel planes with a freeform surface. A plurality of feature rays exiting from a light source is successively reflected by the primary mirror, the secondary mirror and the tertiary mirror to form an image on an image sensor. A reflective surface of each of the primary mirror, the tertiary mirror surface and the tertiary mirror is an xy polynomial freeform surface.

    SPECTROMETER AND OPTICAL INPUT PORTION THEREOF

    公开(公告)号:US20170363470A1

    公开(公告)日:2017-12-21

    申请号:US15546003

    申请日:2015-01-23

    IPC分类号: G01J3/02

    摘要: A spectrometer (100) and an optical input portion (32) thereof are disclosed. The optical input portion (32) comprises an assembly structure (322), and the assembly structure (322) is formed at a hole wall (321) of a through hole (3211) of the optical input portion (32). A light (L1) is incident into a dispersing element (2) of the spectrometer (100) along an optical path (13) after passing through the through hole (3211), and is dispersed by the dispersing element (2). The assembly structure (322) is used to be detachably assembled with an optical element (200). When the optical element (200) is assembled with the assembly structure (322), an optical axis of the optical element (200) is linked to the optical path (13). As a result, the light (L1) passing through the optical element (200) is incident to the dispersing element (2) along the optical axis and the optical path (13).

    Spectrometer and method of spectroscopy
    7.
    发明授权
    Spectrometer and method of spectroscopy 有权
    光谱仪和光谱法

    公开(公告)号:US09157803B2

    公开(公告)日:2015-10-13

    申请号:US14361840

    申请日:2012-12-11

    摘要: A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.

    摘要翻译: 一种火花光发射光谱仪,包括:火花源,用于引起火花诱发的来自样品的光的发射; 单个入口狭缝; 用于将光引导通过单个入口狭缝的环形镜; 多个用于衍射光的衍射光栅,所述衍射光栅通过所述反射镜被引导通过所述入射狭缝,由此所述多个衍射光栅同时被照亮; 以及用于检测来自多个衍射光栅的衍射光的至少一个阵列检测器,其中,次要用于引导光通过入口狭缝,使得来自火花源中的不同区域的光在光的图像中在空间上分离 其中由来自火花源的第一区域的光优先照射第一衍射光栅并且同时第二衍射光栅的光栅优先用来自火花源的第二区域的光照射。

    ICP Optical Emission Spectrometer
    8.
    发明申请
    ICP Optical Emission Spectrometer 审中-公开
    ICP光发射光谱仪

    公开(公告)号:US20150268169A1

    公开(公告)日:2015-09-24

    申请号:US14661821

    申请日:2015-03-18

    IPC分类号: G01N21/73 G01J3/04 G01J3/443

    摘要: An ICP optical emission spectrometer including: an inductively coupled plasma device configured to atomize or ionize target element to be analyzed using inductively coupled plasma to obtain an atomic emission line; a light condenser configured to condense the atomic emission line, the light condenser including at least two independent light condensers including a first light condenser and a second light condenser; a spectroscope configured to receive the atomic emission line through an incident window and to spectrally detect the atomic emission line; and at least one incident slit that is provided between the first light condenser and the second light condenser, the incident slit being configured to allow the atomic emission line, which passed through the first light condenser, pass through the incident slit and reach to the second light condenser.

    摘要翻译: 一种ICP发射光谱仪,包括:感应耦合等离子体装置,被配置为使用电感耦合等离子体来雾化或电离待分析的目标元件以获得原子发射线; 光聚光器,被配置为冷凝原子发射线,所述光聚光器包括至少两个独立的光聚光器,包括第一光聚光器和第二光聚光器; 配置成通过入射窗口接收原子发射线并且光谱检测原子发射线的分光镜; 以及设置在所述第一光聚光器和所述第二光聚光器之间的至少一个入射狭缝,所述入射狭缝被配置为允许穿过所述第一光聚光器的所述原子发射线穿过所述入射狭缝并到达所述第二光聚合器 光冷凝器。

    Measuring optical system, and color luminance meter and colorimeter using the same
    9.
    发明授权
    Measuring optical system, and color luminance meter and colorimeter using the same 有权
    测量光学系统,以及使用其的彩色亮度计和色度计

    公开(公告)号:US08982349B2

    公开(公告)日:2015-03-17

    申请号:US13638723

    申请日:2011-03-08

    摘要: In a measuring probe (40) according to the present invention, measuring light is split into a two or more through a split optical system (12), and, when each split light is received by a light-receiving sensor (13B, 13B, 15B) through an interference filter (13A, 14A, 15A) serving as a color filter, the split light is introduced into the interference filter (13A, 14A, 15A) through a collecting lens group (123C, 14C, 15C) formed as a substantially bilateral telecentric system. The interference filter (13A, 14A, 15A) is formed to obtain a transmittance characteristic corresponding to a measurement parameter, depending on a condition of an intensity distribution with respect to incidents angles of light incident on the interference filter (13A, 14A, 15A). Thus, the measuring probe (40) according to the present invention can reduce an influence of a deviation in the transmittance characteristic due to incident angles, even using the interference filter (13A, 14A, 15A).

    摘要翻译: 在根据本发明的测量探针(40)中,通过分离光学系统(12)将测量光分成两个或更多个,并且当每个分开的光被光接收传感器(13B,13B)接收时, 15B)通过用作滤色器的干涉滤光器(13A,14A,15A),分裂光通过形成为滤色器的收集透镜组(123C,14C,15C)被引入干涉滤光器(13A,14A,15A) 基本上是双边远心系统。 干涉滤光器(13A,14A,15A)形成为根据与入射在干涉滤光器(13A,14A,15A)上的光的事件角度的强度分布的条件相应地获得与测量参数对应的透射率特性, 。 因此,即使使用干涉滤光器(13A,14A,15A),根据本发明的测量探针(40)也可以减少由入射角度引起的透射特性偏差的影响。

    Multi-path spectrometer
    10.
    发明授权
    Multi-path spectrometer 有权
    多径光谱仪

    公开(公告)号:US08922768B2

    公开(公告)日:2014-12-30

    申请号:US13252744

    申请日:2011-10-04

    摘要: A spectrometer in accordance with the present disclosure may provide multiple optical paths from the inputs to the camera, where the paths are as nearly identical as possible. For example, a spectrometer in accordance with the present disclosure may include multiple inputs, input optics, a diffraction grating, output optics, and a camera. The multiple inputs may be imaged onto different sections of the camera using the same input optics, the same diffraction grating, and the same output optics.

    摘要翻译: 根据本公开的光谱仪可以提供从输入到相机的多个光路,其中路径尽可能几乎相同。 例如,根据本公开的光谱仪可以包括多个输入,输入光学器件,衍射光栅,输出光学器件和照相机。 多个输入可以使用相同的输入光学器件,相同的衍射光栅和相同的输出光学器件成像到相机的不同部分上。