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    IMAGING SPECTROMETER WITH REFLECTIVE GRATING
    1.
    发明申请
    IMAGING SPECTROMETER WITH REFLECTIVE GRATING 审中-公开

    公开(公告)号：US20180094977A1

    公开(公告)日：2018-04-05

    申请号：US15718475

    申请日：2017-09-28

    申请人： European Space Agency

    发明人： Matteo Taccola

    IPC分类号： G01J3/26 ,  G02B17/06 ,  G02B5/18 ,  G01J3/18 ,  G01J3/28

    CPC分类号： G01J3/26 ,  G01J3/021 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/1809 ,  G01J3/2823 ,  G01J2003/262 ,  G02B5/1861 ,  G02B17/061 ,  G02B17/0615

    摘要： An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.

    Echelle grating multi-order imaging spectrometer utilizing a catadioptric lens
    4.
    发明授权
    Echelle grating multi-order imaging spectrometer utilizing a catadioptric lens 有权
    Echelle光栅多阶成像光谱仪利用反折射透镜

    公开(公告)号：US08736836B2

    公开(公告)日：2014-05-27

    申请号：US13086233

    申请日：2011-04-13

    申请人： Michael P. Chrisp ,  Joel M. Bowers

    发明人： Michael P. Chrisp ,  Joel M. Bowers

    IPC分类号： G01J3/02 ,  G01J3/18

    CPC分类号： G01J3/0208 ,  G01J3/0256 ,  G01J3/0286 ,  G01J3/1809

    摘要： A cryogenically cooled imaging spectrometer that includes a spectrometer housing having a first side and a second side opposite the first side. An entrance slit is on the first side of the spectrometer housing and directs light to a cross-disperser grating. An echelle immersions grating and a catadioptric lens are positioned in the housing to receive the light. A cryogenically cooled detector is located in the housing on the second side of the spectrometer housing. Light from the entrance slit is directed to the cross-disperser grating. The light is directed from the cross-disperser grating to the echelle immersions grating. The light is directed from the echelle immersions grating to the cryogenically cooled detector on the second side of the spectrometer housing.

    摘要翻译： 一种低温冷却成像光谱仪，其包括具有第一侧和与第一侧相对的第二侧的光谱仪外壳。 入口狭缝位于光谱仪外壳的第一侧，并将光引导到交叉分散光栅。 折叠式沉没光栅和反射折射透镜位于外壳中以接收光。 低温冷却检测器位于光谱仪外壳第二侧的外壳内。 来自入口狭缝的光被引导到交叉分散光栅。 光从交叉分散器光栅引导到梯子沉浸光栅。 灯从梯子沉浸光栅引导到光谱仪外壳第二侧的低温冷却检测器。

    Spectrometer assembly
    5.
    发明授权
    Spectrometer assembly 有权
    光谱仪组装

    公开(公告)号：US08102527B2

    公开(公告)日：2012-01-24

    申请号：US12665665

    申请日：2008-05-09

    申请人： Helmut Becker-Ross ,  Michael Okruss ,  Stefan Florek

    发明人： Helmut Becker-Ross ,  Michael Okruss ,  Stefan Florek

    IPC分类号： G01J3/28

    CPC分类号： G01J3/22 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/08 ,  G01J3/1809 ,  G01J3/2823 ,  G01J3/32

    摘要： The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.

    摘要翻译： 本发明涉及一种具有用于在检测器（34）上产生来自辐射源的辐射光谱的光谱仪的光谱仪装置（10），该光谱仪包括用于对进入光谱仪装置的辐射进行成像的光学成像Littrow布置（18,20） 16），用于对进入光谱仪装置的辐射的第一波长范围进行光谱分解的第一色散装置（28,30），用于第二波长的光谱分解的第二色散装置（58,60） 进入光谱仪布置的辐射的范围以及布置在想象光学器件的图像平面中的公共检测器（34），其特征在于，成像光学装置（18,20）包括可在两者之间移动的元件（20） 位置（20,50），其中在第一位置进入分光计装置的辐射经由第一分散装置被引导，并且经由 第二分散布置。

    THREE MIRROR ANASTIGMAT SPECTROGRAPH
    6.
    发明申请
    THREE MIRROR ANASTIGMAT SPECTROGRAPH 有权
    三个镜子评估光谱

    公开(公告)号：US20090091753A1

    公开(公告)日：2009-04-09

    申请号：US12246232

    申请日：2008-10-06

    申请人： BURT JAY BEARDSLEY ,  WENDY LYNN BEARDSLEY

    发明人： BURT JAY BEARDSLEY ,  WENDY LYNN BEARDSLEY

    IPC分类号： G01J3/18

    CPC分类号： G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0262 ,  G01J3/027 ,  G01J3/0291 ,  G01J3/443

    摘要： A spectrograph including a primary mirror, a secondary mirror, and a tertiary mirror forming a TMA having a common vertex axis. The spectrograph also may include a collimating mirror, a diffraction grating, and a dispersive prism. The collimating mirror and an entrance aperture form an interchangeable module. Radiation received through the entrance aperture is reflected in a collimated pattern towards an aperture stop. The diffraction grating, located between the collimating mirror and prism, diffracts radiation passed through the aperture stop into multiple beams directed onto the prism. A flat mirror, located to one side of the vertex axis. receives and reflects the multiple beams exiting the prism onto the primary mirror, where they are reflected onto the secondary mirror. The secondary mirror reflects the beams to the tertiary mirror where they are reflected onto an image plane located on the other side of the vertex axis.

    摘要翻译： 包括主镜，次镜和形成具有共同顶点轴的TMA的第三镜的光谱仪。 光谱仪还可以包括准直镜，衍射光栅和分散棱镜。 准直镜和入口孔形成可互换的模块。 通过入射孔收到的辐射以朝向孔径光阑的准直图案反射。 位于准直镜和棱镜之间的衍射光栅将通过孔径光阑的辐射衍射成多个指向棱镜的光束。 平面镜，位于顶点轴的一侧。 接收和反射离开棱镜的多个光束到主镜上，在那里它们被反射到次镜上。 次级反射镜将光束反射到第三级反射镜，它们被反射到位于顶点轴线另一侧的图像平面上。

    Apparatus for automated real-time material identification
    9.
    发明申请
    Apparatus for automated real-time material identification 审中-公开
    自动实时材料识别装置

    公开(公告)号：US20060262304A1

    公开(公告)日：2006-11-23

    申请号：US11409857

    申请日：2006-04-24

    申请人： Keith Carron

    发明人： Keith Carron

    IPC分类号： G01J3/28

    CPC分类号： G01J3/42 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0264 ,  G01J3/0294 ,  G01J3/1809 ,  G01J3/44 ,  G01J2001/4242

    摘要： An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an alternative embodiment, both an infrared spectrometer and a Raman spectrometer are included in a single instrument and a common infrared light source is used by both spectrometers. In another embodiment, a vibrational spectrometer and a stoichiometric spectrometer are combined in a single instrument and are coupled to exchange respective spectral information of the target material and to compare the spectral information against a library of spectra to generate a real-time signal if a selected component is present in the target material.

    摘要翻译： 描述了用于实时识别目标材料的一个或多个选定部件的装置。 在一个实施例中，红外光谱仪和单独的拉曼光谱仪被耦合以交换目标材料的各个光谱信息，优选地被归一化并呈现在单个图中。 在替代实施例中，红外光谱仪和拉曼光谱仪均包括在单个仪器中，并且两个光谱仪都使用通用的红外光源。 在另一个实施例中，将振动光谱仪和化学计量光谱仪组合在单个仪器中，并耦合以交换目标材料的相应光谱信息，并将光谱信息与光谱库进行比较以产生实时信号，如果选定 组分存在于目标材料中。

    Method and apparatus for spectrochemical analysis
    10.
    发明授权
    Method and apparatus for spectrochemical analysis 有权
    光谱化学分析的方法和装置

    公开(公告)号：US06813019B2

    公开(公告)日：2004-11-02

    申请号：US09958458

    申请日：2001-10-05

    申请人： Michael R. Hammer ,  Philip V. Wilson ,  Mark R. Williams ,  Dower C. Bricker ,  Martin K. Masters ,  Stewart R. Campbell ,  Peter G. Layton

    发明人： Michael R. Hammer ,  Philip V. Wilson ,  Mark R. Williams ,  Dower C. Bricker ,  Martin K. Masters ,  Stewart R. Campbell ,  Peter G. Layton

    IPC分类号： G01J328

    CPC分类号： G01J3/36 ,  G01J3/02 ,  G01J3/0213 ,  G01J3/0227 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/1809 ,  G01J3/2803 ,  G01J5/62 ,  G01J2003/1828 ,  G01N21/27 ,  G01N21/31

    摘要： A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.

    摘要翻译： 用于对样品进行光谱化学分析的方法和装置，其中固态阵列检测器（82）用于检测分光光度的辐射（62）。 本发明涉及使用与多色调剂（74-80）的入口孔（70）相邻的快门（72）将检测器（82）暴露于辐射（62）以改变长度的时间，从而短时间曝光时间 由于辐射的高强度分量，检测器（82）的元件（即，像素）中的电荷累积受到限制，并且由于辐射的微弱的肥胖分量，对于更长的曝光时间来检测器（82）的元件（像素）中的电荷累积 62）增加。 这确保了检测器（82）的每次读取包括至少一次曝光，其中在每个感兴趣波长处累积的电荷量既不太小也不太大。 因此能够避免无法精确测量的微弱辐射成分和超过检测器（82）的元件（像素）的电荷承载能力的高强度辐射成分的问题。 衰减器（90）可以放置在辐射源（60）和检测器（82）之间，以允许更长的曝光时间用于非常高强度的辐射。