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    Depth determination in X-ray backscatter system using frequency modulated X-ray beam
    2.
    发明授权
    Depth determination in X-ray backscatter system using frequency modulated X-ray beam 有权

    公开(公告)号：US09329300B2

    公开(公告)日：2016-05-03

    申请号：US14932942

    申请日：2015-11-04

    申请人： Nucsafe, Inc.

    发明人： Steven W. Pauly

    IPC分类号： G01N23/203 ,  G01V5/00

    CPC分类号： G01V5/0025 ,  A61B6/483 ,  G01N23/203 ,  G01N2223/053 ,  G01N2223/314 ,  G01N2223/345

    摘要： An X-ray backscatter imaging system uses frequency modulated X-rays to determine depth of features within a target. An X-ray source generates X-ray radiation modulated by a frequency-modulated bias current. The X-ray radiation impinges upon and is backscattered from multiple depths within the target. A scintillating material receives the backscattered X-rays and generates corresponding photons. A photodetector, having gain modulated by the frequency modulation signal from the local oscillator, receives the photons from the scintillating material and generates an analog output signal containing phase delay information indicative of the distance travelled by the X-rays backscattered from multiple depths within the target. The analog output signal is sampled by an analog-to-digital converter to create a digital output signal. A computer processor performs a discrete Fourier transform on the digital output signal to provide target depth information based on the phase delay information.

    IMAGING APPARATUS AND IMAGE PROCESSING METHOD
    3.
    发明申请
    IMAGING APPARATUS AND IMAGE PROCESSING METHOD 有权
    成像装置和图像处理方法

    公开(公告)号：US20140241632A1

    公开(公告)日：2014-08-28

    申请号：US14347270

    申请日：2012-11-02

    申请人： CANON KABUSHIKI KAISHA

    发明人： Kentaro Nagai ,  Mitsuo Takeda

    IPC分类号： G06K9/62 ,  G01J9/02

    CPC分类号： G06K9/62 ,  A61B6/00 ,  A61B6/484 ,  A61B6/5258 ,  G01J9/0215 ,  G01N23/04 ,  G01N2223/345 ,  G01N2223/401

    摘要： Disclosed is an imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, including: a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction, based on interference pattern data generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the phase image by solving a second-order differential equation including the first and second second-order differential phase data as functions.

    摘要翻译： 公开了一种用于基于由剪切干涉仪获取的干涉图案来生成相位图像的数据的成像装置，包括：差分相位数据计算单元，其计算表示第一方向上的相位变化的第一差分相位数据和第二差分 基于通过被摄体发送的电磁波产生的干涉图案数据，表示相位在第二方向上的变化的相位数据; 二阶差分相位数据计算单元，其通过对第一方向上的第一差分相位数据进行微分来计算第一二阶差分相位数据，并且通过在第二方向上区分第二差分相位数据来计算第二二阶差分相位数据 ; 以及相位数据计算单元，其通过求解包括第一和第二二阶微分相位数据的二阶微分方程作为函数来计算相位图像。

    AUGER ELEMENTAL IDENTIFICATION ALGORITHM
    5.
    发明申请
    AUGER ELEMENTAL IDENTIFICATION ALGORITHM 失效
    AUGER元素识别算法

    公开(公告)号：US20130341504A1

    公开(公告)日：2013-12-26

    申请号：US13913240

    申请日：2013-06-07

    申请人： Mark Neill ,  Mehran Nasser-Ghodsi ,  Christopher Sears

    发明人： Mark Neill ,  Mehran Nasser-Ghodsi ,  Christopher Sears

    IPC分类号： H01J49/00 ,  H01J49/44

    CPC分类号： H01J37/26 ,  G01N23/2276 ,  G01N2223/345 ,  G06K9/00563 ,  G06K9/6271 ,  H01J49/0036 ,  H01J49/44

    摘要： System and methods for decomposing an Auger electron spectrum into elemental and chemical components, includes conditioning and input spectrum to generate a normalized input spectrum; determining statistical correlation between the normalized input spectrum and stored elemental spectral signatures; and characterizing elemental or chemical species in the input spectrum from the statistical correlation, wherein said conditioning the input spectrum includes estimating a background signal of non-Auger electrons in the input spectrum and subtracting the estimated background signal from the input spectrum.

    摘要翻译： 将俄歇电子谱分解为元素和化学成分的系统和方法包括调节和输入光谱以产生归一化输入光谱; 确定归一化输入光谱和存储的基本光谱特征之间的统计相关性; 以及从所述统计相关性表征所述输入光谱中的元素或化学物质，其中所述调节所述输入光谱包括估计所述输入光谱中的非俄歇电子的背景信号并从所述输入光谱中减去所估计的背景信号。

    Method of determining a given characteristic of a material sample
    6.
    发明授权
    Method of determining a given characteristic of a material sample 失效
    确定材料样品的给定特性的方法

    公开(公告)号：US5442676A

    公开(公告)日：1995-08-15

    申请号：US168732

    申请日：1993-12-16

    申请人： Paul F. Fewster

    发明人： Paul F. Fewster

    IPC分类号： G01B15/02 ,  G01L1/24 ,  G01L1/25 ,  G01N23/20

    CPC分类号： G01L1/248 ,  G01B15/02 ,  G01L1/25 ,  G01N23/20 ,  G01N2223/302 ,  G01N2223/345 ,  G01N2223/607 ,  G01N2223/633

    摘要： Measurements are made on a sample (1) to obtain an experimental profile (2) having structural features (3, 4) determined at least in part by the given characteristic and an expected profile (5) calculated for the sample using selected parameters. A degree of smoothing is applied to the experimental profile (2) to reduce the structural features (3,4) thereby producing a smoothed experimental profile (21 a) and the same degree of smoothing is applied to the calculated profile (5) to produce a smoothed calculated profile 51 a. The smoothed calculated profile (51 a) is compared with the smoothed experimental profile (21 a) to determine the difference between the smoothed profiles. The calculated profile is then modified by varying at least one of the parameters until the smoothed modified profile fits the smoothed experimental profile. The above steps are then repeated with the modified calculated profile using each time a degree of smoothing less than the previous time so that the structural features return and the final modified calculated profile (5b) provides a desired fit to the experimental profile (2) thereby enabling the given characteristic to be determined from the parameters used for the final modified profile.

    摘要翻译： 在样品（1）上进行测量以获得具有至少部分地由给定特性确定的结构特征（3,4）的实验轮廓（2），以及使用所选参数为样品计算的预期轮廓（5）。 对实验轮廓（2）施加平滑度以减小结构特征（3,4），从而产生平滑的实验轮廓（21a），并且将相同的平滑度应用于计算的轮廓（5）以产生 平滑的计算轮廓51a。 将平滑的计算轮廓（51a）与平滑的实验轮廓（21a）进行比较以确定平滑轮廓之间的差异。 然后通过改变参数中的至少一个来修改计算的轮廓，直到平滑的修改轮廓符合平滑的实验轮廓。 然后使用每次平滑度小于先前时间的修正计算轮廓来重复上述步骤，使得结构特征返回并且最终修改的计算轮廓（5b）提供对实验轮廓（2）的期望拟合，由此 使得能够根据用于最终修改的轮廓的参数来确定给定的特征。

    Depth Determination in X-ray Backscatter System Using Frequency Modulated X-Ray Beam
    8.
    发明申请
    Depth Determination in X-ray Backscatter System Using Frequency Modulated X-Ray Beam 有权

    公开(公告)号：US20160070021A1

    公开(公告)日：2016-03-10

    申请号：US14932942

    申请日：2015-11-04

    申请人： NUCSAFE, INC.

    发明人： Steven W. Pauly

    IPC分类号： G01V5/00 ,  G01N23/203

    CPC分类号： G01V5/0025 ,  A61B6/483 ,  G01N23/203 ,  G01N2223/053 ,  G01N2223/314 ,  G01N2223/345

    摘要： An X-ray backscatter imaging system uses frequency modulated X-rays to determine depth of features within a target. An X-ray source generates X-ray radiation modulated by a frequency-modulated bias current. The X-ray radiation impinges upon and is backscattered from multiple depths within the target. A scintillating material receives the backscattered X-rays and generates corresponding photons. A photodetector, having gain modulated by the frequency modulation signal from the local oscillator, receives the photons from the scintillating material and generates an analog output signal containing phase delay information indicative of the distance travelled by the X-rays backscattered from multiple depths within the target. The analog output signal is sampled by an analog-to-digital converter to create a digital output signal. A computer processor performs a discrete Fourier transform on the digital output signal to provide target depth information based on the phase delay information.

    Apparatus for analyzing the spectral data in an elemental analyzer measuring gamma rays arising from neutron capture in bulk substances
    10.
    发明授权
    Apparatus for analyzing the spectral data in an elemental analyzer measuring gamma rays arising from neutron capture in bulk substances 失效
    用于分析元素分析仪中的光谱数据的装置，用于测量散装物质中的中子捕获产生的伽马射线

    公开(公告)号：US4171485A

    公开(公告)日：1979-10-16

    申请号：US835807

    申请日：1977-09-22

    申请人： J. Howard Marshall

    发明人： J. Howard Marshall

    IPC分类号： G01N23/222 ,  G01N23/00 ,  G01V5/00

    CPC分类号： G01N23/222 ,  G01N2223/0745 ,  G01N2223/303 ,  G01N2223/304 ,  G01N2223/345 ,  G01N2223/617 ,  G01N2223/635

    摘要： An apparatus for analyzing the spectral data in an elemental analyzer measuring gamma rays arising from neutron capture in bulk substances is disclosed. The formation of optimally-weighted linear sums of the number of counts in various portions of the energy spectrum of neutron-capture gamma rays improves measurement accuracy in an apparatus for on-line elemental analysis of bulk substances. Within the apparatus, the analyzed bulk substance is exposed to neutrons, and neutron capture generates prompt gamma rays therefrom. A detector interacts with some of these gamma rays to produce electrical signals used to convert their energy spectrum to digital form by pulse-height analysis. A small computer uses this digitized spectrum to construct the weighted linear sums corresponding to at least one interesting element. Generally, several elements are measured, and the computer forms ratios between the elemental sums to provide relative concentration measurements which are independent of absolute counting rates. The instrument also contains a calibration plug to verify performance, a digital data link to allow the computer to be remote from the gamma-ray detector and devices to display the results of the measurement and/or to communicate them to external equipment. Measurement of an element principally present in the instrument structure permits the computer to correct the measurement of an interesting element in the bulk substance for its presence in the structure.

    摘要翻译： 公开了一种用于分析测量散装物质中的中子俘获产生的伽马射线的元素分析仪中的光谱数据的装置。 在中子捕获伽马射线能谱各部分的计数数量的最佳加权线性和的形成提高了用于散装物质在线元素分析的装置中的测量精度。 在设备内，分析的散装物质暴露于中子，并且中子捕获从其产生迅速的γ射线。 检测器与这些伽马射线中的一些相互作用，产生用于通过脉冲高度分析将其能谱转换为数字形式的电信号。 小型计算机使用该数字化频谱来构造对应于至少一个有趣元素的加权线性和。 通常，测量几个元素，并且计算机形成元素和之间的比率以提供与绝对计数率无关的相对浓度测量。 仪器还包含一个用于验证性能的校准插头，一个数字数据链接，允许计算机远离伽马射线探测器和设备，以显示测量结果和/或将其传送到外部设备。 主要存在于仪器结构中的元件的测量允许计算机校正散装物质中有趣元素在结构中的存在的测量。