公开(公告)号：US10060950B2

公开(公告)日：2018-08-28

申请号：US14997345

申请日：2016-01-15

申请人： Cascade Microtech, Inc.

发明人： Michael E Simmons ,  Bryan Conrad Bolt ,  Christopher Anthony Storm ,  Kazuki Negishi ,  Joseph George Frankel ,  Robbie Ingram-Goble

IPC分类号： G01R31/00 ,  G01R1/18 ,  G01R1/067 ,  G01R31/28

CPC分类号： G01R1/18 ,  G01R1/06705 ,  G01R31/2849

摘要： Shielded probe systems are disclosed herein. The probe systems are configured to test a device under test (DUT) and include a measurement chamber that at least partially bounds an enclosed volume, an aperture defined by the measurement chamber, a probing assembly, and a shielding structure. The probing assembly includes a probe, which is oriented within the enclosed volume, a probe arm, which is operatively attached to the probe, and a manipulator, which is operatively attached to the probe arm. At least a portion of the probing assembly extends through the aperture. The shielding structure extends between the measurement chamber and the probing assembly and is configured to restrict fluid flow through the aperture and shield the enclosed volume from an ambient environment that surrounds the measurement chamber while maintaining at least a threshold separation distance from the probe arm throughout a probe arm range-of-motion thereof.

公开(公告)号：US20180188313A1

公开(公告)日：2018-07-05

申请号：US15395907

申请日：2016-12-30

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Alex PAIKIN ,  Colin JOHNSON ,  Tathagata CHATTERJEE ,  Sameer PENDHARKAR

IPC分类号： G01R31/26 ,  G01R31/28

CPC分类号： G01R31/2628 ,  G01R31/2849

摘要： In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.

公开(公告)号：US20180115316A1

公开(公告)日：2018-04-26

申请号：US15335333

申请日：2016-10-26

申请人： QUALCOMM Incorporated

发明人： Ankit MAHESHWARI ,  Akash KUMAR ,  Rimal PATEL

IPC分类号： H03L1/00 ,  H03L7/00 ,  H03B5/06 ,  H03B5/32 ,  G01R31/28

CPC分类号： H03L1/00 ,  G01R31/2849 ,  H03B5/06 ,  H03B5/32 ,  H03B2200/0082 ,  H03J7/04 ,  H03L1/02 ,  H03L1/028 ,  H03L7/00 ,  H04W76/27 ,  H04W88/02

摘要： Techniques for calibrating a crystal oscillator of a wireless device are provided. A method according to these techniques includes operating a transmit path of the wireless device at a first carrier frequency, configuring a receive path of the wireless device to receive at a second carrier frequency, the second carrier frequency being offset from the first carrier frequency by a first frequency offset, transmitting a tone using the transmit path at a frequency that is offset from the first carrier frequency by a second frequency offset that is different than the first frequency offset, receiving a second tone via the receive path, and determining the oscillator error based on the second tone.

公开(公告)号：US20170219646A1

公开(公告)日：2017-08-03

申请号：US15486425

申请日：2017-04-13

申请人： MURATA MANUFACTURING CO., LTD.

发明人： Masakazu ITAKURA ,  Tetsuo KAWASAKI

IPC分类号： G01R31/28 ,  G01R31/26 ,  G01R31/02

CPC分类号： G01R31/2849 ,  G01R31/028 ,  G01R31/2642

摘要： An electronic-component testing device capable of achieving efficient heat-releasing from a self-heating electronic component and efficiently performing a desired test while maintaining the temperature of the electronic component in a predetermined range higher than ordinary temperature.

公开(公告)号：US20170205446A1

公开(公告)日：2017-07-20

申请号：US14997345

申请日：2016-01-15

申请人： Cascade Microtech, Inc.

发明人： Michael E. Simmons ,  Bryan Conrad Bolt ,  Christopher Anthony Storm ,  Kazuki Negishi ,  Joseph George Frankel ,  Robbie Ingram-Goble

IPC分类号： G01R1/18 ,  G01R1/067

CPC分类号： G01R1/18 ,  G01R1/06705 ,  G01R31/2849

摘要： Shielded probe systems are disclosed herein. The probe systems are configured to test a device under test (DUT) and include a measurement chamber that at least partially bounds an enclosed volume, an aperture defined by the measurement chamber, a probing assembly, and a shielding structure. The probing assembly includes a probe, which is oriented within the enclosed volume, a probe arm, which is operatively attached to the probe, and a manipulator, which is operatively attached to the probe arm. At least a portion of the probing assembly extends through the aperture. The shielding structure extends between the measurement chamber and the probing assembly and is configured to restrict fluid flow through the aperture and shield the enclosed volume from an ambient environment that surrounds the measurement chamber while maintaining at least a threshold separation distance from the probe arm throughout a probe arm range-of-motion thereof.

公开(公告)号：US09506970B2

公开(公告)日：2016-11-29

申请号：US13807889

申请日：2011-06-30

申请人： Florent Miller ,  Sebastien Morand

发明人： Florent Miller ,  Sebastien Morand

IPC分类号： G01R13/38 ,  G01R31/00 ,  G01R31/28 ,  G01B1/00 ,  H01L21/00 ,  G01R31/311 ,  G01R31/3181

CPC分类号： G01R31/002 ,  G01B1/00 ,  G01R31/2848 ,  G01R31/2849 ,  G01R31/2881 ,  G01R31/311 ,  G01R31/31816 ,  H01L21/00 ,  H01L2221/00

摘要： A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics.

摘要翻译： 一种用于表征电子部件相对于自然辐射环境的灵敏度的方法。 为颗粒或入射光束的给定特性确定电子元件的超出该破坏性事件发生的安全工作区域（SOA）电压范围。 在接近所确定的SOA电压范围的最高电压值的工作条件下，电子元件被接通并通过具有给定特性的粒子或入射光束通电。 确定对应于电子部件的破坏性事件的估计的放大瞬态事件的有效部分。 粒子或光束的特征被修改，重复了该方法的改进特征。

公开(公告)号：US09046567B2

公开(公告)日：2015-06-02

申请号：US13001753

申请日：2009-06-23

申请人： Stephane Ortet

发明人： Stephane Ortet

IPC分类号： G01R31/10 ,  G01R31/28

CPC分类号： G01R31/2849

摘要： An equipment burn-in method, which includes the equipment undergoing treatment in an oven, the oven undergoing cycles including at least one temperature-rise and/or temperature-fall transition, for which ventilation of the equipment is cut off during at least part of a temperature transition of the oven.

摘要翻译： 一种设备老化方法，其包括在烤箱中进行处理的设备，烘箱经历包括至少一个温升和/或降温过渡的循环，在该过程中至少部分地切断设备的通风 烘箱的温度转变。

公开(公告)号：US09018965B2

公开(公告)日：2015-04-28

申请号：US13142528

申请日：2009-11-26

申请人： Raffaele Ricci

发明人： Raffaele Ricci

IPC分类号： G01R31/00 ,  G01R31/28

CPC分类号： G01R31/002 ,  G01R31/2849

摘要： To verify robustness with respect to electrical overstresses of an electronic circuit under test, the latter is exposed to electrical overstresses, and the behavior thereof is monitored. In particular, both the testing of the electronic circuit in dynamic conditions is performed by causing it to be traversed by the currents that characterize operation thereof, and by exposing at least one supply line of the electronic circuit under test to electrical overstresses and the testing of the electronic circuit under test in static conditions, without causing it to be traversed by the currents that characterize operation thereof, and by exposing to electrical overstresses both the supply and the input and/or output lines of the electronic circuit under test. The device for generating the overstresses can be mounted on a circuit board, which can be coupled as daughter board to a mother board, on which the electronic circuit under test is mounted.

摘要翻译： 为了验证被测试的电子电路的电应力的鲁棒性，后者暴露于电过载，并且监测其行为。 特别地，在动态条件下的电子电路的测试都是通过使其通过表征其操作的电流来进行的，并且通过将被测试的电子电路的至少一条电源线暴露于电过压并且测试 电子电路在静态条件下测试，而不会使其被表征其操作的电流穿过，并且暴露于被测电子电路的电源和输入和/或输出线的电力过载。 用于产生过应力的装置可以安装在电路板上，该电路板可以作为子板耦合到安装有被测电子电路的母板。

公开(公告)号：US08933703B2

公开(公告)日：2015-01-13

申请号：US11864235

申请日：2007-09-28

申请人： David Henderson ,  Sean P. Cortright ,  Calvin Krug ,  Ryan Kelley

发明人： David Henderson ,  Sean P. Cortright ,  Calvin Krug ,  Ryan Kelley

IPC分类号： H01H31/02

CPC分类号： G01M7/027 ,  G01R31/2849

摘要： A module is used for interfacing between a particular device to be tested (DUT) and a test station having a universal set of connections. The module is adapted for bridging both the physical and electrical differences between connection points available on the DUT and the universal test connections. The module contains information (personality data) unique to the particular DUT and is designed to mount in a tray in which the DUT is positioned. The personality module resides partially within an environmentally controlled area and an area outside of the environmentally controlled area and is adapted to seal the environmentally controlled area so as to maintain testing integrity therein. In one embodiment, the connections between the module and the test station occur outside of the environmentally controlled area.

摘要翻译： 一个模块用于在特定待测试设备（DUT）和具有通用连接组的测试站之间进行接口连接。 该模块适用于桥接DUT上可用的连接点与通用测试连接之间的物理和电气差异。 该模块包含特定DUT所特有的信息（个性数据），并被设计为安装在DUT所在的托盘中。 个性模块部分地位于环境受控区域和环境受控区域外部的区域中，并且适于密封环境受控区域，以保持其中的测试完整性。 在一个实施例中，模块和测试台之间的连接发生在环境受控区域之外。

公开(公告)号：US08583391B2

公开(公告)日：2013-11-12

申请号：US13087682

申请日：2011-04-15

申请人： Edward R. Morgana ,  Kevin P. Roy

发明人： Edward R. Morgana ,  Kevin P. Roy

IPC分类号： G06F19/00

CPC分类号： G01R31/2849 ,  G01R31/008 ,  G01R31/048 ,  G01R31/2856 ,  G01R31/2872

摘要： A health monitoring system for monitoring the health of an electronic system. The health monitoring system includes an analog-to-digital converter, and a monitoring circuit within the electronic system. The monitoring circuit includes fatigue life characterized electrical components representative of electrical components comprising the balance of the electronic system. The fatigue life characterized electrical components are employed solely to monitor the health of the electronic system. The monitoring circuit output is electrically connected to the analog-to-digital converter.

摘要翻译： 一个用于监测电子系统健康状况的健康监测系统。 健康监测系统包括模数转换器和电子系统内的监控电路。 监测电路包括代表包括电子系统的平衡的电气部件的表征的电气部件的疲劳寿命。 电气部件的疲劳寿命仅用于监测电子系统的健康状况。 监控电路输出电连接到模数转换器。