公开(公告)号：US12236575B2

公开(公告)日：2025-02-25

申请号：US17492905

申请日：2021-10-04

Applicant: Applied Materials, Inc.

Inventor： Yangyang Sun ,  Jinxin Fu ,  Kazuya Daito ,  Ludovic Godet

IPC: G06T7/00 ,  G01J1/42 ,  G01J1/44 ,  G01N21/958 ,  G02B27/01 ,  G06T7/80 ,  G06T7/90 ,  H04N23/56 ,  H04N23/74 ,  H04N23/90

Abstract: Embodiments of the present disclosure relate to optical devices for augmented, virtual, and/or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of first metrics and one or more second metrics for optical devices, the one or more second metrics including a display leakage metric.

公开(公告)号：US12099019B2

公开(公告)日：2024-09-24

申请号：US17532558

申请日：2021-11-22

Applicant: OTT HYDROMET B.V.

Inventor： Xander Olivier Van Mechelen ,  Joachim Christian Jaus ,  Joop Mes

IPC: G01N21/958 ,  G01J1/02 ,  G01J5/00 ,  G01N21/94 ,  H02S50/00 ,  G01N21/88 ,  G01N21/95

CPC classification number: G01N21/958 ,  G01J1/02 ,  G01J5/00 ,  G01N21/94 ,  H02S50/00 ,  G01N2021/8822 ,  G01N2021/9511 ,  G01N2021/9586

Abstract: A device comprises a housing, a detector for receiving solar irradiance and for providing a detector signal providing an indication of an amount of solar irradiance received by the detector and a shield transparent to at least part of the solar irradiance to be detected, the shield and the housing providing a detector space for housing at least part of the detector. The device further comprises a first light source for emitting light to the shield and a first light sensor arranged to receive light from the first light source, arranged to provide a first signal providing an indication for an amount of light received by the first light sensor. Particles will and reflect light back to the detector space. The reflected light is received by the light sensor. Hence, a signal generated by the sensor is an indication for pollution of the shield.

公开(公告)号：US12013346B2

公开(公告)日：2024-06-18

申请号：US17562719

申请日：2021-12-27

Applicant: BLANCCO TECHNOLOGY GROUP IP OY

Inventor： William Fitzgerald ,  Donal O'Shaughnessy ,  Donie Kelly ,  Paul O'Sullivan ,  Liam O'Callaghan ,  James Donovan ,  Shane Hallinan ,  Charlie McGrory ,  Wayne Morgan ,  Uday Chitturi ,  Patrick Conway ,  John Mollaghan ,  Kevin Sutton

IPC: G01N21/88 ,  G01N21/95 ,  G01N21/958 ,  G06N3/045 ,  G06N3/08 ,  G06N3/084 ,  G06T7/00 ,  G06T7/13 ,  G06T7/80 ,  G06V10/42 ,  H04N7/18 ,  G06Q10/30

CPC classification number: G01N21/8851 ,  G01N21/95 ,  G06N3/045 ,  G06N3/08 ,  G06N3/084 ,  G06T7/0004 ,  G06T7/001 ,  G06T7/13 ,  G06T7/80 ,  G06V10/42 ,  H04N7/18 ,  G01N2021/8854 ,  G01N2021/8887 ,  G01N2021/8893 ,  G01N2021/9513 ,  G01N21/958 ,  G01N2201/0221 ,  G06Q10/30 ,  G06T7/0002 ,  G06T2207/10024 ,  G06T2207/20084 ,  G06T2207/30121 ,  G06T2207/30244

Abstract: There is presented a system and method for detecting mobile device fault conditions, including detecting fault conditions by software operating on the mobile device. In one embodiment, the present invention provides for systems and methods for using a neural network to detect, from an image of the device, that the mobile device has a defect, for instance a cracked or scratched screen. Systems and methods also provide for, reporting the defect status of the device, working or not, so that appropriate action may be taken by a third party.

公开(公告)号：US11987884B2

公开(公告)日：2024-05-21

申请号：US17345795

申请日：2021-06-11

Applicant: JNK TECH

Inventor： Youngjin Choi

IPC: C23C16/52 ,  G01N21/88 ,  G01N21/95 ,  G01N21/958 ,  G06T1/00 ,  G06T7/00 ,  G06T7/13 ,  G06T7/174 ,  H01L21/66 ,  H01L21/68

CPC classification number: C23C16/52 ,  G01N21/8851 ,  G01N21/9501 ,  G01N21/958 ,  G06T1/0014 ,  G06T7/0004 ,  G06T7/13 ,  G06T7/174 ,  H01L21/681 ,  H01L22/12 ,  G06T2207/30148

Abstract: A method of inspection and an inspection system for the film deposition process for substrates includes glass and wafer. The inspection system includes multiple camera modules positioned in a load lock unit of a process chamber, such as the camera modules that can capture images of the substrate in the load lock. The images are analyzed by a control unit of the inspection system to determine the accuracy of robots in handling the substrate, calibration of the robots based on the analysis, and defects in the substrate caused during the handling and deposition process.

公开(公告)号：US11885706B2

公开(公告)日：2024-01-30

申请号：US17734240

申请日：2022-05-02

Applicant: Transitions Optical, Ltd. ,  Johnson & Johnson Vision Care, Inc.

Inventor： Forrest R. Blackburn ,  Joshua Hazle ,  Patricia Martin

IPC: G01M11/02 ,  G01N21/59 ,  G01N21/958 ,  G02C7/04 ,  G02C7/10

CPC classification number: G01M11/0285 ,  G01N21/59 ,  G01N21/958 ,  G02C7/04 ,  G02C7/102 ,  G01N2021/9583

Abstract: A method of determining the transmittance of a contact lens (200) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected by ocular surface (100) with an intensity measuring device (400), positioning the contact lens (200) in direct contact with the ocular surface (100), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the contact lens (200) that is reflected a region (110) of the ocular surface (100) that is covered by the contact lens (200) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.

公开(公告)号：US11867630B1

公开(公告)日：2024-01-09

申请号：US17884116

申请日：2022-08-09

Applicant: Glasstech, Inc.

Inventor： Benjamin L. Moran ,  Jason C. Addington ,  Michael J. Vild

IPC: G01N21/958 ,  G01N21/64

CPC classification number: G01N21/6456 ,  G01N21/958 ,  G01N2201/06113

Abstract: An optical inspection system is provided with a fixture to support a glass sheet, with the fixture having an optical fiducial. An ultraviolet laser and associated optics form a planar laser sheet that intersects a surface of the glass sheet causing the surface to fluoresce and form a visible wavelength line thereon. A camera has an image sensor for detecting the optical fiducial and the visible wavelength line across at least a portion of a width of the sheet. A control system is configured to (i) image the optical fiducial on the fixture, (ii) define an optical fiducial coordinate system from the imaged optical fiducial, (ii) receive a mathematical model of the glass sheet in a model coordinate system, and (iii) relate the optical fiducial coordinate system to the model coordinate system via at least one transformation. A method of using a non-contact optical inspection system is also provided.

公开(公告)号：US20240003829A1

公开(公告)日：2024-01-04

申请号：US18468867

申请日：2023-09-18

Applicant: Carl Zeiss Vision International GmbH ,  Carl Zeiss Jena GmbH

Inventor： Marc Flemming ,  Hannes Scheibe ,  Dominik Wiedemann ,  Alexander Friedl ,  Daniel Schoebel

IPC: G01N21/958

CPC classification number: G01N21/958 ,  G01N2021/8835 ,  G01N2021/9583

Abstract: A testing device for detecting defects of transparent test specimens, in particular of ophthalmological lenses, has an illumination device for transilluminating test specimens to be examined and with an image acquisition device for imaging the test specimen transilluminated by the illumination device. The illumination device includes a plurality of linearly adjustable light sources for generating a stripe pattern. To capture the stripe pattern, the acquisition duration of the image acquisition device can be adjusted in such a way that the light emitted by each of the light sources is detected as a light stripe. Further, the disclosure relates to a testing method for detecting a defect of a transparent specimen.

公开(公告)号：US11852595B2

公开(公告)日：2023-12-26

申请号：US17019421

申请日：2020-09-14

Applicant: LARGAN PRECISION CO., LTD.

Inventor： Lin-An Chang ,  Ming-Ta Chou ,  Cheng-Feng Lin ,  Liang-Chieh Weng ,  Ming-Shun Chang

IPC: G01N21/958 ,  G02B3/04 ,  B29D11/00 ,  G02B1/04

CPC classification number: G01N21/958 ,  B29D11/00009 ,  G02B1/04 ,  G02B3/04 ,  G01N2021/9583

Abstract: A plastic lens element includes an optical effective portion and a peripheral portion. The peripheral portion surrounds the optical effective portion and includes a peripheral surface and an optical inspecting structure. The optical inspecting structure is disposed between the optical effective portion and the peripheral surface and includes a first optical inspecting surface and a second optical inspecting surface. The first optical inspecting surface and the second optical inspecting surface are disposed on two sides of the peripheral portion respectively and correspond to each other.

公开(公告)号：US11852585B2

公开(公告)日：2023-12-26

申请号：US17502632

申请日：2021-10-15

Applicant: THE TEXAS A&M UNIVERSITY SYSTEM

Inventor： Iltai Isaac Kim ,  Yang Lie ,  Jae Sung Park

IPC: G01N21/552 ,  G01N21/958 ,  G01B11/06 ,  G01N21/55

CPC classification number: G01N21/552 ,  G01B11/06 ,  G01N21/958 ,  G01N2021/555

Abstract: The present disclosure relates to methods for evaluating features of objects such as liquid droplets and surfaces. More particularly, the present disclosure relates to methods for measuring features such as the contact angle and the thickness of an object such as a liquid droplet or a fingerprint as well as related compositions for evaluation.

公开(公告)号：US11840762B2

公开(公告)日：2023-12-12

申请号：US17656343

申请日：2022-03-24

Applicant: JNK TECH

Inventor： Youngjin Choi

IPC: G06K9/00 ,  C23C16/52 ,  G01N21/88 ,  G01N21/958 ,  G06T7/00 ,  G06T7/13 ,  G06T7/174 ,  G06T1/00 ,  G01N21/95 ,  H01L21/68 ,  H01L21/66

CPC classification number: C23C16/52 ,  G01N21/8851 ,  G01N21/9501 ,  G01N21/958 ,  G06T1/0014 ,  G06T7/0004 ,  G06T7/13 ,  G06T7/174 ,  H01L21/681 ,  H01L22/12 ,  G06T2207/30148

Abstract: This application relates to a method of inspection and an inspection system for the film deposition process for substrates that includes glass and wafer. The inspection system includes multiple camera modules positioned in a load lock unit of a process chamber, such as the camera modules that can capture images of the substrate in the load lock. The images are analyzed by a control unit of the inspection system to determine the accuracy of robots in handling the substrate, calibration of the robots based on the analysis, and defects in the substrate caused during the handling and deposition process.