Method and apparatus for processing photon counting-type X-ray detection data and X-ray apparatus

    公开(公告)号:US11099141B2

    公开(公告)日:2021-08-24

    申请号:US16627451

    申请日:2018-10-26

    申请人: JOB CORPORATION

    摘要: A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Zeff, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (ZHigh, ZLow) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.

    SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

    公开(公告)号:US20210199592A1

    公开(公告)日:2021-07-01

    申请号:US17199090

    申请日:2021-03-11

    摘要: A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.

    X-ray inspection apparatus
    5.
    发明授权

    公开(公告)号:US10859516B2

    公开(公告)日:2020-12-08

    申请号:US16334350

    申请日:2017-09-20

    摘要: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

    Radiation Signal Processing System
    9.
    发明申请

    公开(公告)号:US20200158909A1

    公开(公告)日:2020-05-21

    申请号:US16458251

    申请日:2019-07-01

    IPC分类号: G01V5/00 G01N23/087

    摘要: A dual energy based X-ray scanning system has a linear detector array with high and low energy detectors. A signal processing method is employed that accounts for varying angles at which the transmitted X-rays impinge upon the detectors and also the varying order in which the transmitted X-rays pass through the high and low energy detectors. This yields both high resolution in the generated images and better penetration performance.

    PHOTON COUNTING X-RAY CT APPARATUS
    10.
    发明申请

    公开(公告)号:US20200033273A1

    公开(公告)日:2020-01-30

    申请号:US15929150

    申请日:2019-10-01

    摘要: A photon counting X-ray CT apparatus according to an embodiment includes: data acquiring circuitry, and processing circuitry. The data acquiring circuitry is configured to allocate energy measured by signals output from a photon counting detector in response to incidence of X-ray photons to any of a plurality of first energy bins so as to acquire a first data group as count data of each of the first energy bins. The processing circuitry is configured to determine a plurality of second energy bins obtained by grouping the first energy bins in accordance with a decomposition target material that is a material to be decomposed in a imaging region, allocate the first data group to any of the second energy bins so as to generate a second data group, and use the second data group to generate an image representing a distribution of the decomposition target material.