公开(公告)号：US20240134083A1

公开(公告)日：2024-04-25

申请号：US18544934

申请日：2023-12-19

Applicant: Rapiscan Holdings, Inc.

Inventor： Emmanuel St-Aubin ,  Philippe Desjeans-Gauthier ,  Ola El Bakry ,  Simon Archambault ,  William Awad

IPC: G01V5/22 ,  G01N23/04 ,  G01N23/087 ,  G01N23/10

CPC classification number: G01V5/224 ,  G01N23/04 ,  G01N23/087 ,  G01N23/10 ,  G01N2223/04 ,  G01N2223/1016 ,  G01N2223/206 ,  G01N2223/3035 ,  G01N2223/3307 ,  G01N2223/3308 ,  G01N2223/41 ,  G01N2223/424 ,  G01N2223/5015 ,  G01N2223/639 ,  G01N2223/643

Abstract: A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

公开(公告)号：US20230404499A1

公开(公告)日：2023-12-21

申请号：US18344342

申请日：2023-06-29

Applicant: Hologic, Inc.

Inventor： Kenneth DeFreitas ,  Timothy N. Wells ,  Thomas DeYoung ,  Henry Landry ,  Shawn St. Pierre ,  Shawn Hochstetler ,  Joseph Vartolone ,  Neil Roth ,  Michelle Lustrino

IPC: A61B6/00 ,  G01N23/04 ,  G21K7/00 ,  G01N23/18 ,  G01N23/083 ,  G01N23/087 ,  G01N23/06

CPC classification number: A61B6/4435 ,  G01N23/04 ,  A61B6/588 ,  G21K7/00 ,  A61B6/587 ,  A61B6/508 ,  A61B6/4233 ,  A61B6/44 ,  G01N23/18 ,  A61B6/4208 ,  A61B6/4411 ,  G01N23/083 ,  G01N23/087 ,  A61B6/4405 ,  A61B6/40 ,  A61B6/42 ,  A61B6/4429 ,  G01N23/06 ,  A61B6/4441 ,  A61B6/4447 ,  A61B6/4452 ,  A61B6/469 ,  A61B6/461 ,  A61B6/465 ,  A61B6/46 ,  A61B6/463 ,  A61B6/467 ,  A61B6/542 ,  G01N2223/301 ,  G01N2223/309 ,  G01N2223/3306 ,  G01N2223/3307 ,  G01N2223/6126 ,  A61B6/4423

Abstract: A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.

公开(公告)号：US11822043B2

公开(公告)日：2023-11-21

申请号：US17420681

申请日：2020-01-03

Applicant: NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED ,  TSINGHUA UNIVERSITY

Inventor： Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang ,  Jianmin Li ,  Shangmin Sun ,  Chunguang Zong ,  Yu Hu ,  Quanwei Song ,  Hejun Zhou ,  Weifeng Yu ,  Jinguo Cao ,  Bing Fu

IPC: G01N23/04 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01V5/00 ,  G01N23/18

CPC classification number: G01V5/0066 ,  G01N23/04 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01N23/18 ,  G01V5/0008 ,  G01V5/0016 ,  G01V5/0041 ,  G01N2223/04 ,  G01N2223/3303 ,  G01N2223/40 ,  G01N2223/639

Abstract: The present disclosure provides a radiation inspection apparatus and a radiation inspection method. The radiation inspection apparatus includes: a radiation inspection device comprising a ray source and a detector that cooperates with the ray source to perform scanning inspection on an object to be inspected, the radiation inspection device having an inspection channel for the object to be inspected to pass through when scanning inspection is performed thereon; and traveling wheels provided at the bottom of the radiation inspection device to enable the radiation inspection apparatus to travel in an extension direction of the inspection channel, and the traveling wheels are configured to rotate 90° to enable the radiation inspection apparatus to travel in a direction perpendicular to the extension direction of the inspection channel.

公开(公告)号：US11099141B2

公开(公告)日：2021-08-24

申请号：US16627451

申请日：2018-10-26

Applicant: JOB CORPORATION

Inventor： Tsutomu Yamakawa ,  Shuichiro Yamamoto ,  Masahiro Okada

IPC: G01N23/00 ,  G01N23/087 ,  A61B6/00 ,  G01N23/04 ,  G01T1/36

Abstract: A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Zeff, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (ZHigh, ZLow) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.

公开(公告)号：US20210199592A1

公开(公告)日：2021-07-01

申请号：US17199090

申请日：2021-03-11

Applicant: SOUTHERN INNOVATION INTERNATIONAL PTY LTD

Inventor： Paul Scoullar ,  Christopher McLean ,  Shane Michael Tonissen ,  Syed Khusro Saleem

IPC: G01N21/85 ,  G01N23/087 ,  E21B49/00 ,  G01N21/25 ,  G01N21/93

Abstract: A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.

公开(公告)号：US20210116397A1

公开(公告)日：2021-04-22

申请号：US17137039

申请日：2020-12-29

Applicant: Colgate-Palmolive Company ,  Northwestern University

Inventor： Michael FITZGERALD ,  Iraklis PAPPAS ,  Jean-Francois GAILLARD ,  Marco ALSINA CORVALAN

IPC: G01N23/083 ,  G01N21/89 ,  G01N21/94 ,  G01N23/087

Abstract: The disclosure contains a method of quantifying and/or evaluating metal ions in a dentifrice, wherein the method comprises subjecting the dentifrice to X-ray absorption spectroscopy (XAS), and wherein the XAS is used to measure and/or evaluate the metal ions in the dentifrice. Also disclosed are methods of selecting and screening for dentifrices based upon the evaluation and quantification of their metal ion content.

公开(公告)号：US20210033545A1

公开(公告)日：2021-02-04

申请号：US17065858

申请日：2020-10-08

Applicant: JOHNSON MATTHEY PUBLIC LIMITED COMPANY

Inventor： Christopher Bowdon ,  Paul David Featonby ,  James Stephen Howstan ,  Peter Jackson ,  Kenneth James ,  Emanuele Ronchi

IPC: G01N23/18 ,  G01V5/00 ,  G01T1/164 ,  G01N23/06 ,  G01N23/087 ,  G01N23/04 ,  G01N23/083 ,  G01N23/046 ,  G01N9/24 ,  G01T1/20 ,  G21K1/02

Abstract: The invention discloses a scanning method and apparatus suitable for scanning a pipeline or process vessel in which a beam of gamma radiation from a source is emitted through the vessel to be detected by an array of detectors which are each collimated to detect radiation over a narrow angle relative to the width of the emitted radiation beam.

公开(公告)号：US10859516B2

公开(公告)日：2020-12-08

申请号：US16334350

申请日：2017-09-20

Applicant: System Square Inc.

Inventor： Noriaki Ikeda ,  Sachihiro Nakagawa

IPC: G01N23/04 ,  G01N23/087 ,  G01T1/24 ,  G01N23/18

Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

公开(公告)号：US10859515B2

公开(公告)日：2020-12-08

申请号：US15465937

申请日：2017-03-22

Applicant: Carl Zeiss X-ray Microscopy, Inc.

Inventor： Zhifeng Huang ,  Thomas A. Case ,  Lourens B. Steger

IPC: G01N23/087 ,  G01N23/046

Abstract: A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.

公开(公告)号：US10795047B2

公开(公告)日：2020-10-06

申请号：US16229860

申请日：2018-12-21

Applicant: VOTI INC.

Inventor： Emmanuel St-Aubin ,  Philippe Desjeans-Gauthier ,  Ola El Bakry ,  Simon Archambault ,  William Awad

IPC: G06K9/00 ,  G01V5/00 ,  G01N23/087 ,  G01N23/04 ,  G01N23/083 ,  G01N23/10 ,  G06T11/00 ,  H04N5/32 ,  G06T7/194 ,  G06T7/70 ,  G01N23/20 ,  G06T7/00 ,  G06T7/60 ,  G06T7/50 ,  G06T7/11

Abstract: There is provided a method for assigning an attribute to an unknown object overlapping with a predetermined background object. The unknown object is scanned overlapping with the background object within an x-ray scanning device to obtain a plurality of dual-energy attenuation images having attenuation information representing the background object and an overlap region wherein the background object and the unknown object overlap. The dual-energy attenuation images are decomposed into reference material equivalent path length images. The reference material equivalent path lengths representing the background object in the overlap region are determined and eliminated from the overlap region to provide reference material equivalent path length images having first and second reference material equivalent path lengths through only the unknown object.