公开(公告)号：US20250027891A1

公开(公告)日：2025-01-23

申请号：US18355490

申请日：2023-07-20

Applicant: SAUDI ARABIAN OIL COMPANY

Inventor： Mohamed SOUA ,  Husinsyah SITEPU

IPC: G01N23/207 ,  G01N23/2055

Abstract: Methods and tools to identify a type of sedimentary system from an XRD pattern. The method includes applying x-rays to a sample to obtain diffraction pattern data, and calculating a March-Dollase preferred orientation factor of a crystallographic plane of the sample based on the diffraction pattern data. The method further includes classifying the calculated March-Dollase preferred orientation factor to identify a type of clastic sedimentary system corresponding to the sample. A rapid sediment analyzer tool includes an X-ray diffraction device and an application having a March-Dollase preferred orientation factor calculator and a classifier. The display device is configured to display the identified type of clastic sedimentary system.

公开(公告)号：US12174132B2

公开(公告)日：2024-12-24

申请号：US17768464

申请日：2020-10-09

Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED

Inventor： Takehiro Yoshida

IPC: G01N23/207 ,  G01N23/20008 ,  H01L21/304

Abstract: A nitride semiconductor substrate that has a diameter of 2 inches or more and includes a main surface for which the closest low index crystal plane is a (0001) plane. The ratio of FWHM1{10-12} to FWHM2{10-12} is 80% or more.

公开(公告)号：US12174131B2

公开(公告)日：2024-12-24

申请号：US17831188

申请日：2022-06-02

Applicant: Rigaku Corporation

Inventor： Takahiro Kuzumaki ,  Tetsuya Ozawa ,  Miki Kasari ,  Akihiro Himeda ,  Atsushi Ohbuchi ,  Takayuki Konya

IPC: G01N23/207 ,  G01N23/2055

Abstract: A quantitative analysis apparatus, a method, a program, and a manufacturing control system are provided. A WPPF section 320 for determining parameters of theoretical diffraction intensity by performing whole powder pattern fitting with respect to an X-ray diffraction profile to be analyzed, a scale factor acquiring section 325 for acquiring a scale factor of a test component among the determined parameters, a calibration curve storing section 350 for storing a calibration curve indicating a correlation between scale factors of the test component acquired with respect to a standard sample and content ratios of the test component in the standard sample, and a conversion section 370 for converting the scale factor of the test component acquired with respect to an objective sample into the content ratio of the test component in the objective sample using the stored calibration curve, are comprised.

公开(公告)号：US12163904B2

公开(公告)日：2024-12-10

申请号：US17771866

申请日：2020-11-04

Applicant: LG ENERGY SOLUTION, LTD.

Inventor： Hyo-Jung Yoon ,  So-Young Kim ,  Eun-Ju Lee

IPC: G01N23/207

Abstract: A method of quantitatively analyzing a carbon based hybrid negative electrode including the steps of preparing a secondary battery including a carbon based hybrid negative electrode, where the carbon based hybrid negative electrode comprises a carbon based negative electrode active material and a non-carbon based negative electrode active material, measuring a lattice d-spacing of the carbon based negative electrode active material in the carbon based hybrid negative electrode during charging/discharging of the secondary battery using an X-ray diffractometer and then plotting a graph of a change in lattice d-spacing value as a function of charge/discharge capacity, detecting an inflection point of a slope of the graph during discharging; and then, quantifying capacity contribution of the carbon based negative electrode active material and the non-carbon based negative electrode active material in the total discharge capacity of the secondary battery by the inflection point of the slope of the graph.

公开(公告)号：US12135299B2

公开(公告)日：2024-11-05

申请号：US17794855

申请日：2020-10-15

Applicant: Shimadzu Corporation

Inventor： Takuro Izumi ,  Tetsuya Yoneda

IPC: G01N23/20008 ,  G01N23/207 ,  G01N23/2209 ,  G01N23/223

Abstract: An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.

公开(公告)号：US20240361259A1

公开(公告)日：2024-10-31

申请号：US18307834

申请日：2023-04-27

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Richard Thake Bytheway

IPC: G01N23/20008 ,  G01N23/207 ,  G01T1/20

CPC classification number: G01N23/20008 ,  G01N23/207 ,  G01T1/2002 ,  G01T1/20185

Abstract: A detector assembly of an X-ray system, the detector assembly includes: (a) an optical sensor having a first surface, the optical sensor configured to receive optical radiation impinging on the first surface, and to produce an electrical signal responsively to the optical radiation, (b) a fiber optic plate (FOP) disposed over the first surface of the optical sensor, the FOP includes: (i) one or more optical fibers disposed at an acute angle relative to a normal to the first surface, the one or more optical fibers are configured to convey the optical radiation to the optical sensor, and (ii) a second surface, which is oblique to the first surface, and (c) a scintillator layer disposed on the second surface of the FOP and configured to convert an X-ray beam into the optical radiation.

公开(公告)号：US20240353357A1

公开(公告)日：2024-10-24

申请号：US18761689

申请日：2024-07-02

Applicant: KABUSHIKI KAISHA TOSHIBA ,  TOSHIBA MATERIALS CO., LTD.

Inventor： Shuhei NITTA ,  Naoyuki SANADA ,  Seiichi SUENAGA ,  Katsuyuki AOKI ,  Kentaro IWAI ,  Yoshihito YAMAGATA

IPC: G01N23/207

CPC classification number: G01N23/2073

Abstract: According to one embodiment, a crystal phase information extraction apparatus includes a first estimation unit and a second estimation unit. The first estimation unit estimates first crystal phase information on a first polycrystalline material. The second estimation unit performs, using the first crystal phase information, iterative optimization on diffraction data acquired from a second polycrystalline material having a component ratio of a crystal phase of interest smaller than that of the first polycrystalline material, and estimates second crystal phase information on the second polycrystalline material.

公开(公告)号：US12105034B2

公开(公告)日：2024-10-01

申请号：US18448939

申请日：2023-08-13

Applicant: Rigaku Corporation

Inventor： Takashi Sato

IPC: G01N23/20025 ,  G01N1/28 ,  G01N23/207

CPC classification number: G01N23/207 ,  G01N1/28 ,  G01N23/20025

Abstract: A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

公开(公告)号：US20240310454A1

公开(公告)日：2024-09-19

申请号：US18281835

申请日：2022-11-18

Applicant: LG ENERGY SOLUTION, LTD.

Inventor： Youngdeok KIM ,  Daesoo KIM ,  Joonhyeon KANG

IPC: G01R31/392 ,  G01N23/207 ,  G01R31/36

CPC classification number: G01R31/392 ,  G01N23/207 ,  G01R31/3648

Abstract: A method for non-destructively detecting failure of a cell is disclosed. The method may include preparing a cell containing a carbon-based material as an anode active material, charging the cell, x-ray diffraction (XRD) scanning the charged cell inward from an end of an anode, and determining whether or not an LiC6 peak of the anode is observed in a region after a signal of an anode current collector appears in XRD scans.

公开(公告)号：US20240302303A1

公开(公告)日：2024-09-12

申请号：US18599964

申请日：2024-03-08

Applicant: Malvern Panalytical B.V.

Inventor： Milen Gateshki ,  Detlef Beckers

IPC: G01N23/207 ,  G01N23/20025

CPC classification number: G01N23/207 ,  G01N23/20025 ,  G01N2223/0563 ,  G01N2223/1016 ,  G01N2223/313 ,  G01N2223/501

Abstract: The present invention relates to an X-ray analysis apparatus and an X-ray analysis method for analysing a sample. The X-ray analysis method involves using a first slit between the sample and a position sensitive X-ray detector to analyse the sample, including calculating a detection angle based on a distance L1 between the first slit and the X-ray detector, and the position of the first detection element in the array of detection elements. The X-ray analysis apparatus comprises a processor that is configured to analyse data from an X-ray detector comprising an array of detection elements. The processor is configured to receive data comprising an X-ray intensity detected at the first detection element of the array of detection elements and calculate the detection angle based on the distance L1 between the first slit and the X-ray detector, and the position of the first detection element in the array of detection elements.