-
公开(公告)号：US12135313B2
公开(公告)日：2024-11-05
申请号：US17958996
申请日：2022-10-03
Applicant: ROLLS-ROYCE plc
Inventor： Duncan A Macdougall , Julian M Reed , Sophoclis Patsias , Antonio Pellegrino , Clive R Siviour , Daniel Eakins , Yuan Xu , Junyi Zhou
Abstract: A system for measuring loading on a test specimen. The system includes the test specimen arranged between a first loading bar and a second loading bar. The system further includes a first loading unit and a second loading unit configured to apply a first load and a second load to the first and second loading bars, respectively. The system further includes a first clamp and a second clamp configured to hold the first and second loading bars against the first and second loads, respectively. The system further includes a clamp actuating unit configured to selectively release at least the first clamp. The clamp actuating unit further includes a controller configured to electrically actuate at least one first electromechanical transducer from a retained state to a released state to release the first clamp, such that the first loading bar applies a first loading wave to the test specimen.
-
公开(公告)号：US12092617B2
公开(公告)日：2024-09-17
申请号：US17532281
申请日：2021-11-22
Applicant: Samsung Display Co., Ltd.
Inventor： Gabtae Kim
Abstract: Disclosed are display module evaluation jigs and methods, The display module evaluation jig includes: a first body defining a plurality of first recessions on a top surface of the first body; a second body disposed on and combined with the first body; and a plurality of insertions on the first recessions and between the first body and the second body. Inner lateral surfaces of the first body are directed toward and spaced apart from lateral surfaces of the insertions. The inner lateral surfaces define the first recessions.
-
3.发明授权
公开(公告)号：US12031954B2
公开(公告)日：2024-07-09
申请号：US17184030
申请日：2021-02-24
Applicant: The Government of the United States of America, as represented by the Secretary of the Navy
Inventor： Christopher Rudolf
CPC classification number: G01N3/30 , G01N3/066 , G01N2203/001
Abstract: A method of measuring millisecond-scale blast and impact characterization in soft materials includes embedding one or more sensors in soft material, wherein the one or more sensors have mechanical properties approximately matching the soft material; applying a constant current to the one or more sensors; subjecting the soft material to a shock or impact event; measuring a response as a change in voltage; and converting the measured voltage to strain or pressure.
-
公开(公告)号：US11892371B2
公开(公告)日：2024-02-06
申请号：US18105567
申请日：2023-02-03
Applicant: KOKUSAI KEISOKUKI KABUSHIKI KAISHA
Inventor： Sigeru Matsumoto , Hiroshi Miyashita , Kazuhiro Murauchi , Kiyoaki Haneishi
Abstract: A collision simulation test apparatus including a table to which a test piece is to be attached, the table being movable in a predetermined direction, a toothed belt for transmitting power to drive the table, a drive module capable of driving the toothed belt, and a control part capable of controlling the drive module. The control part is capable of controlling the drive module to generate an impact to be applied to the test piece, and the impact generated by the drive module is transmitted to the table by the toothed belt.
-
公开(公告)号：US20230366796A1
公开(公告)日：2023-11-16
申请号：US17868741
申请日：2022-07-19
Applicant: Tsinghua University
Inventor： Fei Guo , Ganlin Cheng , Bingzhe Chen , Chong Xiang , Yijie Huang , Shengshan Chen , Yongjian Li , Xiaohong Jia , Yuming Wang
CPC classification number: G01N3/04 , G01N3/30 , G01N3/405 , G01N3/56 , G01N2203/0206
Abstract: A material testing machine, including a machine body, a first fixing element, a second fixing element and a detection assembly; the first and the second fixing elements are mounted to the machine body, the first fixing element is configured to mount a first testing element, and the second fixing element is configured to mount a second testing element; in a first state, the first and the second testing elements are in sliding contact; in a second state, the first fixing element drives the first testing element to collide with the second testing element; the detection assembly is configured to detect a target parameter, and in the first state, the target parameter includes a friction force and/or, a friction sound between the first and the second testing elements; and in the second state, the target parameter includes a collision force received by the first or the second testing element.
-
公开(公告)号：US11726017B2
公开(公告)日：2023-08-15
申请号：US17571583
申请日：2022-01-10
Inventor： Clark Busenitz , Weston A. McGuire
CPC classification number: G01N3/04 , G01M7/08 , G01N3/30 , G01P15/18 , G01N2203/026 , G01N2203/0256 , G01N2203/0405 , G01N2203/0482 , G01N2203/0676
Abstract: An assembly for shock testing a specimen, the assembly including first and second opposing brackets and opposing lower and upper caps. The opposing brackets include lower and upper angled surfaces. The lower cap includes lower angled surfaces configured to engage the lower angled surfaces of the left and right brackets. The upper cap includes upper angled surfaces configured to engage the upper angled surfaces of the left and right brackets. The first and second brackets are configured to be drawn toward each other via fasteners, thereby wedging the lower and upper caps toward each other against the specimen.
-
公开(公告)号：US11598705B2
公开(公告)日：2023-03-07
申请号：US16614157
申请日：2017-05-22
Inventor： Kee Bong Yoon , Thanh Tuan Nguyen
Abstract: An apparatus and a method for measuring a creep crack growth property using a small specimen with a micro groove are provided. The apparatus for measuring a creep crack growth property includes a lower die on which an edge of the specimen is mounted and which includes a lower die hole formed in the center thereof, an upper die coupled to an upper portion of the lower die so as to fix the specimen, and a punching unit inserted into an upper die hole formed in the center of the upper die so as to press an upper surface of the specimen, wherein a semielliptical micro groove is formed in a lower surface of the specimen to measure a creep crack growth property.
-
公开(公告)号：US11156535B2
公开(公告)日：2021-10-26
申请号：US16789859
申请日：2020-02-13
Inventor： Hyung Seop Shin , Kyung Oh Bae
Abstract: The described technology can quantitatively evaluate a material embrittlement behavior under various gaseous hydrogen environments (temperature and pressure). The described technology may include a small-punch test device allowing a specimen to be fixed inside a jig comprising upper and lower dies, gas to be filled at the lower part of the specimen, and a punch for applying force to be included at the upper part thereof so as to bend the specimen in a vertical downward direction under an environment of the influent gas and measure the same. The small-punch test device also includes an insulating container provided so as to encompass the jig therein and a temperature measuring device connected to the inside of the insulating container so as to measure the internal temperature of the insulating container and the temperature of the specimen. The small-punch test device further includes a heat transfer device transferring heat to the specimen.
-
公开(公告)号：US11131611B2
公开(公告)日：2021-09-28
申请号：US16122214
申请日：2018-09-05
Applicant: CORNING INCORPORATED
Inventor： Kameron Isaiah Chambliss , Benedict Osobomen Egboiyi , Lisa Marie Noni , Prakash Chandra Panda , Kevin Barry Reiman
IPC: G01N3/30
Abstract: Test apparatus and methods for impact testing specimens, including edge impact testing are disclosed. The apparatus and methods disclosed include a pendulum and a bob which are used to impact test specimens against an impacting object.
-
公开(公告)号：US11092630B2
公开(公告)日：2021-08-17
申请号：US16172892
申请日：2018-10-29
Applicant: SHIMADZU CORPORATION
Inventor： Tohru Matsuura
IPC: G06F11/30 , G01R23/167 , G01R23/177 , G01R23/175 , G01N3/32 , G01N3/30
Abstract: A signal processing method and a material testing machine are provided. A reference function processing part includes a data interval generation part for cutting out input signal from a load cell into time-domain data interval by cutting out the input signal of a predetermined time length, a reference function determining part for determining a reference function to be used in a transform process, and a transform part for transforming the interval data using the reference function. Considering the approximately straight lines near the two ends of the data interval, the reference function is a third degree polynomial function with tangents overlapping with the approximately straight line at both ends of the data interval.
