Lithography system and method for processing a target, such as a wafer

    公开(公告)号:USRE49241E1

    公开(公告)日:2022-10-11

    申请号:US16568164

    申请日:2019-09-11

    发明人: Niels Vergeer

    摘要: A method for operating a target processing system for processing a target (23) on a chuck (13), the method comprising providing at least a first chuck position mark (27) and a second chuck position mark (28) on the chuck (13); providing an alignment sensing system (17) arranged for detecting the first and second chuck position marks (27, 28), the alignment sensing system (17) comprising at least a first alignment sensor (61) and a second alignment sensor (62); moving the chuck (13) to a first position based on at least one measurement of the alignment sensing system (17); and measuring at least one value related to the first position of the chuck.

    Adjustment assembly and substrate exposure system comprising such an adjustment assembly

    公开(公告)号:US11237489B2

    公开(公告)日:2022-02-01

    申请号:US16457765

    申请日:2019-06-28

    IPC分类号: G03B27/58 G03F7/20

    摘要: The invention relates to a substrate exposure system comprising a frame, a substrate support module for carrying a substrate, an exposure apparatus for exposing said substrate, and adjustment assembly for adjusting the position of the exposure apparatus with respect to the substrate support module. The adjustment assembly comprises a hydraulic actuator, a hydraulic generator and a conduit, wherein the conduit interconnects said hydraulic actuator and said hydraulic generator for forming a hydraulic system. The exposure apparatus, the frame, the adjustment assembly and the substrate support module are arranged as parts of a series of mechanically linked components. A first part of said series of mechanically linked components comprises the exposure apparatus, and a second part comprises the substrate support module. Said hydraulic actuator is arranged between said first part and said second part. Preferably the hydraulic actuator comprises a first bellows and the hydraulic generator comprises a second bellows.

    Substrate holder and a method of manufacturing a device

    公开(公告)号:US11086234B2

    公开(公告)日:2021-08-10

    申请号:US16758917

    申请日:2018-10-11

    IPC分类号: G03B27/58 G03F7/20

    摘要: A substrate holder, a method of manufacturing of the substrate holder and a lithographic apparatus having the substrate holder. In one arrangement, a substrate holder is for use in a lithographic apparatus. The substrate holder is configured to support a lower surface of a substrate. The substrate holder has a main body, a plurality of burls and a coating. The main body has a substrate-facing face. The plurality of burls protrudes from the substrate-facing face. Each burl has a distal end configured to engage with the substrate. The distal ends are configured for supporting the substrate. The coating is on the substrate-facing face between the burls. Between the burls the substrate-facing face has an arrangement of areas. Adjacent areas are separated by a step-change in distance below the support plane. Each step-change is greater than a thickness of the coating.

    Substrate processing apparatus and article manufacturing method

    公开(公告)号:US11048176B2

    公开(公告)日:2021-06-29

    申请号:US16812717

    申请日:2020-03-09

    摘要: The present invention provides a substrate processing apparatus that processes a substrate, the apparatus including a stage configured to hold and move the substrate, a conveying unit configured to hold and convey the substrate between conveying unit and the stage, an accumulation unit configured to accumulate control information concerning the stage and the conveying unit which is generated by processing the substrate, and a determination unit configured to determine a conveying procedure when conveying the substrate between the stage and the conveying unit by selecting one of a plurality of conveying procedures which can be set for the stage and the conveying unit based on control information accumulated in the accumulation unit.

    Lithography apparatus and device manufacturing method

    公开(公告)号:US10551751B2

    公开(公告)日:2020-02-04

    申请号:US14395436

    申请日:2013-03-18

    IPC分类号: G03B27/58 G03F7/20 G03F9/00

    摘要: A lithography apparatus and device manufacturing methods are disclosed. A lithography apparatus includes a support stage, and a measurement system including a sensor part and a reference part, the measurement system being configured to determine the position and/or orientation of the support stage, or of a component mounted on the support stage, relative to a reference frame by using the sensor part to interact with the reference part, wherein: the reference frame comprises N sub-frames coupled together so as to behave predominantly as a single rigid body with respect to vibrations below a first reference frequency and predominantly as an N-body system with respect to vibrations above a second reference frequency, where N is an integer greater than 1.

    Linear motor, stage apparatus, and exposure apparatus

    公开(公告)号:US10459350B2

    公开(公告)日:2019-10-29

    申请号:US15788745

    申请日:2017-10-19

    申请人: NIKON CORPORATION

    摘要: A linear motor with high heat recovery efficiency that inhibits the rise in surface temperature is offered. The linear motor is disposed in a surrounding member (142) and facing a flow passage (142a) of a liquid for regulating temperature, and is provided with a coil unit (141) having at least a part thereof in contact with the liquid. The coil unit (141) is provided with a coil body (144), a mold layer (143) that covers the coil body and holds it in specific form, and a liquid protection layer (150) that covers the mold layer (143) and has liquid protection properties.

    Calibration method, measurement apparatus, exposure apparatus, and method of manufacturing article

    公开(公告)号:US10401744B2

    公开(公告)日:2019-09-03

    申请号:US14324806

    申请日:2014-07-07

    IPC分类号: G03B27/58 G03F7/20 G01D5/244

    摘要: The present invention provides a method for calibrating an encoder which includes a scale and a light receiving unit configured to receive light reflected by the scale, and detects a change in relative position between the scale and the light receiving unit, the method comprising a measurement step of measuring a deformation amount of a surface shape of the scale, a specifying step of specifying, based on a measurement result in the measurement step, a range which includes a portion of a surface of the scale, where the deformation amount exceeds a threshold, and within which a detection value of the encoder is corrected, and a determination step of determining a correction value for correcting the detection value of the encoder within the range specified in the specifying step.