摘要:
A control apparatus includes: a controller configured to estimate a vacant time period during a period from a first time at which a first user checked-in at an accommodation facility to a second time at which the first user is to check-out from the accommodation facility, the vacant time period being a time period during which the accommodation facility is not used by the first user; and a communication interface configured to transmit vacancy data that indicates the vacant time period estimated by the controller, to a terminal apparatus of at least one second user that is different from the first user.
摘要:
A method of determining a calibration or maintenance time interval after which a specific measurement device of a given type for measuring a quantity to be measured on a measurement site of an industrial site shall be re-calibrated or maintained is described, comprising the steps of: determining a criticality (C) of the specific device, based on the criticality (C) setting a reliability target (RT) for the device, wherein the reliability target (RT) denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval to be determined by this method, defining compliancy ranges for a measurable degree of compliance of the device, selecting a reliability model for a reliability of the device as a function of a normalized time interval (tn) and a set of at least one parameter (c1, . . . , cm) from a variety of predefined reliability models, determining a separate set of parameters for the selected reliability model for each of the compliancy ranges based on prescribed reliability expectation values (RV(tnpd)) for each of the error ranges, which a reliability function associated with this error range shall comply to at at least one predefined normalized time (tnpd), determining the degree of compliance of the specific measurement device and based on the degree of compliance determining the corresponding compliancy range, determining a normalized calibration or maintenance time (tn) as the time, at which a reliability function (R(tn)) given by the selected reliability model and the set of parameters determined for this compliancy range equals the reliability target (RT), and determining the next calibration or maintenance time interval based on a product of this normalized calibration or maintenance time (tn) and a given reference time interval (TR).
摘要:
A dye-based, multilayer time-indicating label without initial gray time comprises a multilayer first part and a multilayer second part. The first part comprises a topsheet in contact with an enhancement layer and an optional reference layer, and the enhancement layer is in contact with a timing layer. The second part comprises a dye layer, an optional dark layer, and a substrate layer. The timing layer and the dye layer are separate from one another, and are optionally protected by one or more release liners. To activate the indicator, the timing and dye layers are separated from the one or more release liners and then joined to one another.
摘要:
An apparatus for comparing event data sets. A system and computer program for comparing event data sets comprising: calculating one or more derivatives for each event in a first and second set of events; classifying each event by the calculated derivatives; and evaluating a similarity of the first and second sets of events based on the classifications of the respective events.
摘要:
A charge flow circuit for a time measurement, including a plurality of elementary capacitive elements electrically in series, each elementary capacitive element leaking through its dielectric space.
摘要:
Various embodiments provide systems, computer program products and computer implemented methods. Some embodiments include a system for modeling a relationship between a test time and a defect rate for a systematic multivariate issue caused by at least one predictable component and a random component in a semiconductor testing environment, the multivariate issue causing failure of a semiconductor device, the system that includes at least one computing device configured to perform actions including quantifying the at least one predictable component to produce at least one first mathematical form, quantifying the random component using distribution functions to produce a second mathematical form and producing a mathematical model of a relationship between the test time and the defect rate at a test condition by mathematically combining the at least one first mathematical form and the second mathematical form.
摘要:
Data for a plurality of samples collected by an LC/MS, GC/MS or other systems are converted into a two-dimensional table format without losing information and with a light load, thereby allowing a multivariate analysis processing to be efficiently performed. After LC/MS data on a plurality of samples are obtained and the respective extracted ion chromatograms (XICs) are created (S1 and S2), the correction of the retention-time difference, the waveform processing and the like are performed (S3 and S4), followed by the creation of a one-dimensional table in which the signal-strength values are arranged for each XIC. Then, one-dimensional tables of a plurality of XICs for one sample are joined together in order of m/z value to create an elongate one-dimensional table (S5). The elongate one-dimensional tables of a plurality of samples are arranged in another dimensional direction to obtain a two-dimensional table (S6).
摘要:
A method and apparatus for sequencing system bus grants and disabling a posting buffer in a bus bridge includes a bus activity monitor for monitoring bus cycles on a first bus, an inbound posting buffer, and a control logic. The control logic indicates whether to grant control of the first bus to a first processor on the first bus based on whether the inbound posting buffer is empty, and also controls disabling of posting to the inbound posting buffer. The control logic disables inbound posting responsive to both the first processor being backed off the system bus a predetermined number of times and the inbound posting buffer being empty.
摘要:
A time indicator is provided that changes color or produces an image or information after a specific time interval. The time indicator includes a base substrate with colored dye deposited on a first surface; and a substrate having an adhesive on a first surface thereof, the adhesive positioned at discrete locations on the first surface of the substrate. The substrate and the base substrate are put into adhesive contact. The adhesive contacts and coacts the colored dye to dissolve the dye and permit the dye to migrate through the adhesive to cause a color change visible through the substrate. The discrete adhesive inhibits lateral migration of the dye to preserve the image or information of the dye in a clear and/or understandable condition.
摘要:
In a surface reflectance meter for directing light to a surface, receiving light reflected from the surface and measuring the rate of change of light flux upon withdrawal of a light chopper from the optical path, a fault detection means which detects and indicates a fault in the flux rate of change measurement is disclosed. In the preferred embodiment the rate of change of flux is detected by measuring the time for the light intensity to increase from a first to a second predetermined intensity and the fault detector means detects and indicates a fault when the light intensity does not reach the second predetermined intensity within a predetermined period of time. The surface reflectance meter is reset for repetition of the measurement upon indication of a fault. This invention is useful in portable surface reflectance meters which must be hand held to the surface to be measured, because instability in holding the meter to the surface can cause the fault.