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公开(公告)号：US11544441B2
公开(公告)日：2023-01-03
申请号：US16274173
申请日：2019-02-12
发明人： Wolfgang Fink
IPC分类号： G06F30/398 , G06F30/33 , G06F30/327 , G06F30/394 , G06F111/06 , G06F111/08 , G06F119/06
摘要： Various examples are provided related to automated chip design, such as a pareto-optimization framework for automated network-on-chip design. In one example, a method for network-on-chip (NoC) design includes determining network performance for a defined NoC configuration comprising a plurality of n routers interconnected through a plurality of intermediate links; comparing the network performance of the defined NoC configuration to at least one performance objective; and determining, in response to the comparison, a revised NoC configuration based upon iterative optimization of the at least one performance objective through adjustment of link allocation between the plurality of n routers. In another example, a method comprises determining a revised NoC configuration based upon iterative optimization of at least one performance objective through adjustment of a first number of routers to obtain a second number of routers and through adjustment of link allocation between the second number of routers.
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公开(公告)号：US11543560B2
公开(公告)日：2023-01-03
申请号：US17047131
申请日：2019-04-15
发明人： Kashif Rashid
IPC分类号： G01V99/00 , G06F30/20 , G06F17/18 , G06F111/08
摘要： A method, computer program product, and computing system are provided for receiving reservoir data associated with the reservoir. A simulation may be performed on the reservoir data to generate simulated reservoir data. A subset of realizations including a minimal number of realizations from a plurality of realizations may be determined based upon, at least in part, one or more statistical moments of the simulated reservoir data. An optimized reservoir model associated with an objective may be generated based upon, at least in part, the subset of realizations including the minimal number of realizations.
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公开(公告)号：US11347918B2
公开(公告)日：2022-05-31
申请号：US17278491
申请日：2019-10-03
发明人： Kenji Takao , Keita Hirayama
IPC分类号： G06F30/3308 , G06F30/13 , G06F30/15 , G06F30/17 , G06F30/18 , G06F30/367 , G06F30/398 , G06F111/08 , G06F119/02 , G06F111/06 , G06F111/02 , G06F111/04
摘要： This validation processing device is provided with: a processing unit that performs model checking on a model to be checked; and a selection unit that selects, on the basis of the result of the model checking, one element from among elements that have undergone state change in a process leading to an unsafe event. The processing unit further performs model checking again on the model to be checked excluding the one element.
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公开(公告)号：US11288426B2
公开(公告)日：2022-03-29
申请号：US17019577
申请日：2020-09-14
申请人： Synopsys, Inc.
发明人： Duc Huynh , Jiayong Le , Ayhan Mutlu , Peivand Tehrani
IPC分类号： G06F30/3312 , G06F111/08 , G06F119/12
摘要： A system receives a circuit description and measures of intrinsic delay, intrinsic delay variation, transition time and transition time variation for each stage and determines stage delay variation of each stage. The system receives a circuit description and derate factors and determines an intrinsic delay standard deviation and a correlation coefficient. The system determines a stage delay variation of each stage based on the determined factors. The system receives parameters describing an asymmetric distribution of delay values and generates a normal distribution of delay values. The system receives measures of nominal transition time at an output and input of a wire, and transition time variation at the input of the wire and determines a transition time variation at the output of the wire. The system receives measures of an Elmore delay and a nominal delay of the wire and determines a delay variation at the output of the wire.
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公开(公告)号：US11100269B2
公开(公告)日：2021-08-24
申请号：US16579836
申请日：2019-09-24
申请人： ARTERIS, INC.
发明人： Jonah Probell , Monica Tang
IPC分类号： G06F30/392 , G06F30/398 , G06F30/30 , G06F30/33 , G06F30/39 , G06F111/08
摘要： Simulation or calculation to estimate activity per unit in a chip design, combined with estimation of the specific location or region in which the unit logic will be finally placed, provides for calculation of an estimation of the activity distribution within the floorplan. Activity distribution estimation can be performed with fine granularity (at a gate level), at coarse granularity (at a macro level), or at an intermediate granularity (at a network-on-chip unit level). The estimation is displayed, visually, to a user of a design tool. Furthermore, the estimation is used to make manual or automatic optimizations of the floorplan and the location and configuration of units within the floorplan.
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公开(公告)号：US11080448B1
公开(公告)日：2021-08-03
申请号：US16910815
申请日：2020-06-24
发明人： Yaron Schiller , Guy Wolfovitz , Habeeb Farah
IPC分类号： G06F30/30 , G06F30/3323 , G06F111/08 , G06F7/58
摘要： A method for formal deep bug hunting in a device under test (DUT) may include obtaining a selection of a start state for the DUT; obtaining a selection of one or a plurality of variables that are declared as random variables; for each of said one or a plurality of random variables, generating a sequence of random values in a generation order using a random number generator (RNG); and performing formal verification exploration of the DUT starting at the start state and consecutively assigning each of said one or a plurality of random variables a value from the sequence of values in the generation order.
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7.发明授权公开(公告)号：US10923319B2
公开(公告)日：2021-02-16
申请号：US16307465
申请日：2017-06-06
IPC分类号： G03F7/20 , H01J37/317 , G06F30/20 , G06F111/08
摘要： A method for projecting a particle beam onto a substrate, the method includes a step of calculating a correction of the scattering effects of the beam by means of a point spread function modelling the forward scattering effects of the particles; a step of modifying a dose profile of the beam, implementing the correction thus calculated; and a step of projecting the beam, the dose profile of which has been modified, onto the substrate, and being wherein the point spread function is, or comprises by way of expression of a linear combination, a two-dimensional double sigmoid function. A method to e-beam lithography is also provided.
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公开(公告)号：US10705250B2
公开(公告)日：2020-07-07
申请号：US14328374
申请日：2014-07-10
IPC分类号： G06F17/18 , G01V99/00 , G06F30/20 , G06F111/06 , G06F111/08 , G06F111/10
摘要： A computer-implemented method for reservoir volumetric estimation, a non-transitory computer-readable medium, and a computing system. The method may include running a molecular dynamics simulation of a fluid-rock model of a first reservoir system at a plurality of pressures. The fluid-rock model includes a fluid that is at least partially adsorbed in the first reservoir system at one or more pressures of the plurality of pressures. The method may also include calculating a plurality of isothermal density profiles of the fluid in the first reservoir system, in association with the plurality of pressures using a result of the molecular dynamics simulation. The method may further include determining a first gas accumulation of the fluid in the first reservoir system for the plurality of isothermal density profiles. The first gas accumulation is at least partially a function of a pore surface area of a sample of the first reservoir system.
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公开(公告)号：US10678971B2
公开(公告)日：2020-06-09
申请号：US16040834
申请日：2018-07-20
发明人： Jing Sha , Dongbing Shao , Derren Dunn
IPC分类号： G06F17/50 , G06F30/20 , G06N7/00 , G03F7/20 , G06F30/39 , G06N20/00 , G06F111/08 , G06F119/18
摘要： A system, a computer program product, and method for physically fabricating an electronic circuit using design space exploration as part of a design process is described. The method begins with defining a plurality of design space parameters to be tuned along with parameter ranges for each of the plurality of design space parameters. Next an output target to be optimized is defined. A series of one or more test mask shapes are generated to appear on a photo mask using the plurality of design space parameters. A simulation of a post lithography or etch on the series of one or more test mask shapes is performed to produce simulation output values. Next, the simulation output values and corresponding design space parameters are fed into to a Bayesian inference algorithm for assessment and identification of a next combination of design space parameters to investigate.
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公开(公告)号：US11506813B2
公开(公告)日：2022-11-22
申请号：US16774914
申请日：2020-01-28
申请人： CHEVRON U.S.A. INC.
IPC分类号： G01V99/00 , G06F30/20 , G06F30/27 , G06F111/08
摘要： Systems and methods are disclosed for generating subsurface feature prediction probability distributions from a subsurface feature as a function of position in a subsurface volume of interest. For example, a computer-implemented method may include: obtaining subsurface data and well data, generating subsurface feature values, generating subsurface feature realizations, generating subsurface feature realization uncertainty values, generating subsurface parameter values, generating subsurface parameter realizations, generating subsurface feature prediction probability distributions, generating a first representation of likelihoods of the subsurface feature values, and displaying the first representation.
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