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公开(公告)号:US20240355387A1
公开(公告)日:2024-10-24
申请号:US18303726
申请日:2023-04-20
发明人: Yu-Yu LIN , Feng-Min LEE
IPC分类号: G11C13/00
CPC分类号: G11C13/004 , G11C13/0026 , G11C13/0061
摘要: An in-memory computing memory device includes: a plurality of computing memory cells forming a plurality of memory strings, the computing memory cells storing a plurality of weight values; a loading capacitor; and a measurement circuit. In IMC operations, a plurality of input voltages, corresponding to a plurality of input values, are input into the computing memory cells; a plurality of effective resistances of the computing memory cells are corresponding to the input voltages and the weight values; when a read voltage is applied to the plurality of computing memory cells, the computing memory cells generate a plurality of cell currents which are summed into a plurality of memory string currents for charging the loading capacitor; and based a capacitor voltage of the loading capacitor, at least one delay time and a predetermined voltage, an operation result of the input values and the weight values is determined.
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公开(公告)号:US20240355386A1
公开(公告)日:2024-10-24
申请号:US18302278
申请日:2023-04-18
申请人: TetraMem Inc.
发明人: Hengfang Zhu , Wenbo Yin , Miao Hu
IPC分类号: G11C13/00
CPC分类号: G11C13/003 , G11C13/004 , G11C2213/79
摘要: The present disclosure relates to voltage-mode crossbar circuits that may include a plurality of bit lines intersecting with a plurality of word lines, a plurality of cross-point devices, and a plurality of sensing circuits configured to amplify bit line voltages settled on the bit lines in response to an application of input voltages to the cross-point devices via the word lines and generate digital outputs representative of the amplified bit line voltages. Each cross-point device is connected to one of the word lines and one of the bit lines and may include a resistive random-access memory (RRAM) device. Each cross-point device may further be connected to a local select line that may enable a group of cross-point devices connected to one or more bit lines. A cross-point device may be enabled when both a global select line and the local select line connected to the cross-point device are enabled.
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公开(公告)号:US20240331771A1
公开(公告)日:2024-10-03
申请号:US18741201
申请日:2024-06-12
发明人: Meng-Sheng Chang , Chia-En HUANG , Yi-Ching LIU , Yih WANG
IPC分类号: G11C13/00
CPC分类号: G11C13/004 , G11C13/0026 , G11C13/0028 , G11C13/003
摘要: Disclosed herein are systems, methods and apparatuses related to a memory array. In one aspect, the memory array includes a set of resistive storage circuits including a first subset of resistive storage circuits connected between a first local line and a second local line in parallel. The first local line and the second local line may extend along a first direction. In one aspect, for each resistive storage circuit of the first subset of resistive storage circuits, current injected at a first common entry point of the first local line exits through a first common exit point of the second local line, such that each resistive storage circuit of the first subset of resistive storage circuits may have same or substantial equal resistive loading.
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公开(公告)号:US12106803B2
公开(公告)日:2024-10-01
申请号:US17824776
申请日:2022-05-25
IPC分类号: G11C11/4074 , G11C13/00 , G11C16/10 , G11C16/26 , G11C16/34
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/004 , G11C2013/0045 , G11C2013/0057 , G11C2013/0076
摘要: Systems, methods, and apparatus related to memory devices. In one approach, a memory device has a memory array including memory cells. A controller of the memory device applies multiple pre-read voltages to memory cells prior to performing write operations on the memory cells. The controller applies a first pre-read voltage to determine which of the memory cells have a sensed current that exceeds a threshold. In response to determining that a percentage of the memory cells exceeding the threshold is too low (e.g., below a fixed limit), the controller determines to apply a second pre-read voltage to the memory cells. The second pre-read voltage has a greater magnitude than the first pre-read voltage, and can be applied to ensure greater reliability in properly determining the existing programming state of the memory cells. The controller then applies write voltages to the memory cells as appropriate based on target logic states for each memory cell and the programming mode to be used by the controller.
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公开(公告)号:US20240313779A1
公开(公告)日:2024-09-19
申请号:US18600281
申请日:2024-03-08
申请人: Robert Bosch GmbH
发明人: Taha Soliman , Tobias Kirchner
IPC分类号: H03K19/0948 , G11C13/00
CPC分类号: H03K19/0948 , G11C13/0002
摘要: A method for processing input variables by means of a processing device having least a first transistor. The method including: providing the first transistor and a first memristive element, which characterizes a first input variable associated with the first transistor, wherein a charging current of a capacitance associated with a control electrode of the first transistor can be influenced using the first memristive element; applying to the control electrode of the first transistor a first output variable which characterizes a second input variable associated with the first transistor; ascertaining a first output variable which characterizes at least one product of the first input variable and of the second input variable, based on a first variable characterizing a time profile of a current through a load path of the first transistor.
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公开(公告)号:US20240304243A1
公开(公告)日:2024-09-12
申请号:US18119104
申请日:2023-03-08
申请人: Crossbar, Inc.
发明人: Zhi Li , Sung Hyun Jo , Jordan Frick
IPC分类号: G11C13/00
CPC分类号: G11C13/0097 , G11C13/0033 , G11C13/004 , G11C13/0064 , G11C13/0069
摘要: Improved erase techniques and apparatuses can improve performance and longevity of non-volatile memory. Various disclosed techniques include performing an erase operation(s) on a group of such memory cells, followed by a weak program operation. One or more subsequent erase-verify operations can be implemented until no erase disturb states are detected for the memory cells, or until a maximum erase-verify cycle count is reached. In one or more embodiments, additional weak program and erase-verify cycles can be implemented to enhance cycle longevity and reduce erase disturb states for the group of non-volatile memory.
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公开(公告)号:US20240298553A1
公开(公告)日:2024-09-05
申请号:US18419190
申请日:2024-01-22
发明人: Lorenzo Fratin , Paolo Fantini , Enrico Varesi
IPC分类号: H10N70/00 , G11C13/00 , H01L25/065 , H10B63/00
CPC分类号: H10N70/8265 , G11C13/0004 , G11C13/0026 , G11C13/0028 , H01L25/065 , H10B63/30 , H10N70/021 , H10N70/841 , H10N70/882
摘要: Methods, systems, and devices for techniques that support sidewall structures for memory cells in vertical structures are described. A memory cell may include a first electrode, a second electrode, and a self-selecting storage element between the first electrode and the second electrode. The self-selecting storage element may extend between the first electrode and the second electrode in a direction that is parallel with a plane defined by the substrate. The self-selecting storage element may also include a bulk region and a sidewall region. The bulk region may include a chalcogenide material having a first composition, and the sidewall region may include the chalcogenide material having a second composition that is different than the first composition. Also, the sidewall region may extend between the first electrode and the second electrode.
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公开(公告)号:US12080347B1
公开(公告)日:2024-09-03
申请号:US17710835
申请日:2022-03-31
申请人: Crossbar, Inc.
发明人: Hagop Nazarian
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0026 , G11C13/0028 , G11C13/0038 , G11C13/004
摘要: Differential programming of multiple resistive switching memory cells defining a bit is disclosed. The differential programming can mitigate invalid data values for the defined bit, referred to herein as an identifier bit. Embodiments of the present disclosure provide for detection of a program event(s) for a portion of resistive switching memory cells defining an identifier bit, and disconnecting a remainder of the memory cells from program supply voltage, prior to a duration of a program cycle. Additionally, the program cycle can be continued for the programmed memory cell(s) to facilitate a robust programming and enhance data longevity. The detection and subsequent disconnection can facilitate proper differential programming and mitigate unwanted program events that lead to invalid identifier bit results, as well as reducing power consumption for a program cycle of resistive switching memory.
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公开(公告)号:US20240289219A1
公开(公告)日:2024-08-29
申请号:US18652714
申请日:2024-05-01
CPC分类号: G06F11/1068 , G06F11/076 , G11C13/0026 , G11C13/0028 , G06F2201/88
摘要: An apparatus comprising a memory array including a plurality of memory cells arranged in a plurality of columns and a plurality of rows is provided. The apparatus further comprises circuitry configured to perform an error detection operation on the memory array to determine a raw count of detected errors, to compare the raw count of detected errors to a threshold value to determine an over-threshold amount, to scale the over-threshold amount according to a scaling algorithm to determine a scaled error count, and to store the scaled error count in a user-accessible storage location.
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公开(公告)号:US12075627B2
公开(公告)日:2024-08-27
申请号:US17412776
申请日:2021-08-26
发明人: Ruilong Xie , Alexander Reznicek , Wei Wang , Tao Li , Tsung-Sheng Kang
CPC分类号: H10B61/00 , G11C11/15 , H10B61/10 , H10N50/01 , H10N50/85 , G11C11/005 , G11C13/0004
摘要: An integrated circuit, a system, and a method to integrate phase change memory and magnetoresistive random access memory within a same integrated circuit in a system. The integrated circuit may include an MRAM and a PCM. The MRAM may include an MRAM bottom electrode, an MRAM stack, and an MRAM top electrode. The PCM may include a PCM bottom electrode, where the PCM bottom electrode has a lower height than the MRAM bottom electrode, a phase change material, and a PCM top electrode.
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