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公开(公告)号:US20250061946A1
公开(公告)日:2025-02-20
申请号:US18540350
申请日:2023-12-14
Applicant: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Inventor: Zhijiu ZHU
Abstract: Examples of the present disclosure provide a memory and operating method thereof, a memory system and a readable storage medium. The memory includes an array of memory cells and a peripheral circuit coupled to the array of memory cells; the peripheral circuit is configured to: receive a program command, a program address, program data, and a program confirmation command which correspond to a program operation, and perform the program operation on the array of memory cells after performing at least two initialization operations. The process of receiving the program command, the program address, the program data, and the program confirmation command which correspond to the program operation and the process of performing the at least two initialization operations at least partially overlap in time.
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公开(公告)号:US20250017005A1
公开(公告)日:2025-01-09
申请号:US18480722
申请日:2023-10-04
Applicant: YIELD MICROELECTRONICS CORP.
Inventor: YU-TING HUANG , CHI-PEI WU
Abstract: A small-area common-voltage multi-write non-volatile memory array includes word lines, select lines, common-voltage lines, and sub-memory arrays. The word lines include a first word line and a second word line. The select lines include a first select line. The common-voltage lines are directly coupled together. The common-voltage lines include a first common-voltage line and a second common-voltage line. Each sub-memory array includes a first non-volatile memory cell coupled to the first word line, the first select line, and the first common-voltage line and a second non-volatile memory cell coupled to the second word line, the first select line, and the second common-voltage line.
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公开(公告)号:US20240312542A1
公开(公告)日:2024-09-19
申请号:US18591856
申请日:2024-02-29
Applicant: Kioxia Corporation
Inventor: Masato ENDO , Haruo MIKI , Daiki SUGAWARA
CPC classification number: G11C16/3495 , G11C16/0483 , G11C16/20
Abstract: A semiconductor storage device includes a thermal history monitor and a determination circuit. The thermal history monitor outputs a thermal history based on a characteristic variation of a memory cell when a reliability detection command is input from a controller or a host device. The determination circuit determines package reliability based on the thermal history output from the thermal history monitor.
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公开(公告)号:US20240212754A1
公开(公告)日:2024-06-27
申请号:US18321001
申请日:2023-05-22
Applicant: SK hynix Inc.
Inventor: KyuSub YOON
CPC classification number: G11C16/0483 , G11C16/20 , G11C16/26
Abstract: A memory device comprises a memory cell array comprising multiple memory cells that are connected between multiple word lines, multiple bit lines, and K strings, and a controller configured to: perform, in a read operation on a first logical page of a selected physical page corresponding to a selected word line, the multiple bit lines and a selected string, a first channel-initializing operation on the selected string and first strings among unselected strings, and perform, in a read operation on a second logical page of the selected physical page, a second channel-initializing operation on the selected string and second strings among the unselected strings, the first and second strings partially overlapping each other, wherein K is a natural number equal to or greater than 2.
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公开(公告)号:US20240211395A1
公开(公告)日:2024-06-27
申请号:US18528375
申请日:2023-12-04
Applicant: Micron Technology, Inc.
Inventor: Aswin Thiruvengadam , Daniel L. Lowrance , Peter Feeley
IPC: G06F12/02 , G06F13/16 , G06F16/18 , G11C7/20 , G11C11/406 , G11C16/20 , G11C16/32 , G11C16/34 , G11C29/02 , G11C29/44
CPC classification number: G06F12/0292 , G06F12/0246 , G06F13/1694 , G06F16/1847 , G11C7/20 , G11C11/40607 , G11C16/20 , G11C16/32 , G11C16/3459 , G11C29/028 , G06F2212/7208 , G06F2212/7209 , G11C2029/4402 , G11C2211/5641
Abstract: The present disclosure includes apparatuses and methods related to determining trim settings on a memory device. An example apparatus can determine a set of trim settings for the array of memory cells based on the operational characteristics of the array of memory cells, wherein the set of trim settings are associated with desired operational characteristics for the array of memory cells.
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公开(公告)号:US20240062820A1
公开(公告)日:2024-02-22
申请号:US18500712
申请日:2023-11-02
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Laura Varisco , Swetha Bongu , Kirthi Ravindra Kulkarni , Soujanya Venigalla
Abstract: A system includes a memory device and a processing device coupled to the memory device. The processing device is to perform operations including determining whether one or more memory access operations performed on a range of consecutive wordlines of a memory device satisfy one or more criteria. The operations further include, responsive to determining that the one or more memory access operations satisfy the one or more criteria, causing a memory management operation to be performed at each wordline of the range of consecutive wordlines of the memory device.
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公开(公告)号:US11836078B2
公开(公告)日:2023-12-05
申请号:US17575998
申请日:2022-01-14
Applicant: Micron Technology, Inc.
Inventor: Aswin Thiruvengadam , Daniel L Lowrance , Peter Feeley
IPC: G06F12/02 , G11C11/406 , G11C16/20 , G11C16/34 , G06F13/16 , G11C16/32 , G06F16/18 , G11C7/20 , G11C29/02 , G11C29/44
CPC classification number: G06F12/0292 , G06F12/0246 , G06F13/1694 , G06F16/1847 , G11C7/20 , G11C11/40607 , G11C16/20 , G11C16/32 , G11C16/3459 , G11C29/028 , G06F2212/7208 , G06F2212/7209 , G11C2029/4402 , G11C2211/5641
Abstract: The present disclosure includes apparatuses and methods related to determining trim settings on a memory device. An example apparatus can determine a set of trim settings for the array of memory cells based on the operational characteristics of the array of memory cells, wherein the set of trim settings are associated with desired operational characteristics for the array of memory cells.
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公开(公告)号:US11798626B2
公开(公告)日:2023-10-24
申请号:US17947320
申请日:2022-09-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Chaehoon Kim , Junyoung Ko , Sangwan Nam , Minjae Seo , Jiwon Seo , Hojun Lee
CPC classification number: G11C16/08 , G11C16/0425 , G11C16/16 , G11C16/20 , G11C16/26 , G11C16/30 , G11C16/3404
Abstract: A method of operating a nonvolatile memory device which includes at least one memory block is provided. The method includes providing a plurality of word-lines with a voltage during a word-line set-up period, precharging a plurality of driving lines with a voltage during a word-line development period, detecting a voltage drop of a sensing node during a sensing period, and detecting leakage based on the voltage drop.
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公开(公告)号:US11748112B2
公开(公告)日:2023-09-05
申请号:US17576546
申请日:2022-01-14
Applicant: Micron Technology, Inc.
Inventor: Reshmi Basu , Richard C. Murphy
CPC classification number: G06F9/441 , G06F11/102 , G06F11/1417 , G06F12/0238 , G11C11/5628 , G06F2212/7201 , G11C7/20 , G11C16/20
Abstract: Systems, apparatuses, and methods related to configurable media structure are described. A memory device can be configured to boot up in a variety of configurations. The variety of configurations can include using the memory device for persistent memory storage, for non-persistent memory storage, etc. For instance, an apparatus can include a first memory array and a second memory array. The apparatus can include a memory controller coupled to the first memory array and the second memory array. The second memory array can be configured to store at least two boot images. The first memory array can be configured to operate based on which of the at least two boot images is used.
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公开(公告)号:US20230122474A1
公开(公告)日:2023-04-20
申请号:US18086206
申请日:2022-12-21
Applicant: KIOXIA CORPORATION
Inventor: Noboru Okamoto , Toshikatsu Hida
Abstract: A memory system connectable to a host, includes a non-volatile memory including a plurality of memory cell transistors and a controller configured to execute read operations on the non-volatile memory. The controller executes one or more first read operations on the non-volatile memory to obtain read data using read voltages that are determined from one of a plurality of entries stored in a shift table, and performs error correction on the read data, until the error correction is successful, and when the error correction on the read data is successful, records an index corresponding to the entry stored in the shift table that was used in obtaining the successfully error-corrected read data. The controller executes a second read operation on the non-volatile memory to obtain read data using read voltages that are determined from the entry stored in the shift table corresponding to the recorded index.
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