Semiconductor storage device
    2.
    发明授权

    公开(公告)号:US12068031B2

    公开(公告)日:2024-08-20

    申请号:US17901239

    申请日:2022-09-01

    IPC分类号: G11C16/08 G11C8/08 G11C8/10

    CPC分类号: G11C16/08 G11C8/08 G11C8/10

    摘要: A semiconductor storage device includes a memory cell array including a plurality of word line groups and a plurality of blocks corresponding to the plurality of word line groups. Each of word line groups includes a plurality of word lines and each of the blocks includes a plurality of memory cells. The plurality of memory cells of each block are connected to the respective word lines of a corresponding one of the word line groups. The semiconductor storage device includes a row decoder including a plurality of word line group decoders corresponding to the plurality of word line groups, respectively. Each of the plurality of word line group decoders is configured to drive a word line independent from a word line driven in another of the word line groups, when all of the plurality of word line groups are activated in parallel.

    Apparatuses and methods including multilevel command and address signals

    公开(公告)号:US11996161B2

    公开(公告)日:2024-05-28

    申请号:US17805270

    申请日:2022-06-03

    发明人: Kang-Yong Kim

    IPC分类号: G11C7/10 G11C8/10 G11C8/18

    摘要: Multilevel command and address (CA) signals are used to provide commands and memory addresses from a controller to a memory system. Using multilevel signals CA signals may allow for using fewer signals compared to binary signals to represent a same number of commands and/or address space, or using a same number of multilevel CA signals to represent a larger number of commands and/or address space. A number of external command/address terminals may be reduced without reducing a set of commands and/or address space. Alternatively, a number of external terminals may be maintained, but provide for an expanded set of commands and/or address space.

    STATIC RANDOM ACCESS MEMORY SUPPORTING A DYNAMICALLY VARIABLE DURATION SELF-TIME DELAY FOR A SINGLE CLOCK CYCLE READ-MODIFY-WRITE OPERATION

    公开(公告)号:US20240170032A1

    公开(公告)日:2024-05-23

    申请号:US18389314

    申请日:2023-11-14

    IPC分类号: G11C7/22 G11C7/10 G11C8/10

    摘要: A memory array includes memory cells forming a data word location accessed in response to a word line signal. A data sensing circuit configured to sense data on bit lines associated with the memory cells. The sensed data corresponds to a current data word stored at the data word location. A data latching circuit latches the sensed data for the current data word from the data sensing circuit. A data modification circuit then performs a mathematical modify operation on the current data word to generate a modified data word. The modified data word is then applied by a data writing circuit to the bit lines for writing back to the memory cells of the memory array at the data word location in response to assertion of control signal having a dynamically variable delay dependent on the current data word. The operations are advantageously performed within a single clock cycle.

    ADDRESS DECODER UNIT FOR A MEMORY CELL ARRAY

    公开(公告)号:US20240127875A1

    公开(公告)日:2024-04-18

    申请号:US18474406

    申请日:2023-09-26

    IPC分类号: G11C8/10

    CPC分类号: G11C8/10 H03K19/20

    摘要: An address decoder unit (30) for a memory cell array (10), the address decoder unit (30) including an address decoder (31) including an address input (33) and a number of address outputs (34, 35, 36), the address decoder (31) being operable to select one of the address outputs (34, 35, 36) in response to receive a memory address at the address input (33); and an address selection circuitry (32) connected to the address decoder (31) and including a number of address selection outputs (44, 45, 46) each of which connectable the memory cell array and each of which corresponding to one memory address, wherein the address decoder unit (30) is switchable into a memory erase mode, in which the address selection circuitry (32) is operable to select all address selection outputs (44, 45, 46) of an address space above or beyond a memory address provided at the address input (33).

    Semiconductor device related to operation of internal circuits

    公开(公告)号:US11915783B2

    公开(公告)日:2024-02-27

    申请号:US17695613

    申请日:2022-03-15

    申请人: SK hynix Inc.

    IPC分类号: G11C7/10 G11C7/22 G11C8/10

    CPC分类号: G11C7/1069 G11C7/22 G11C8/10

    摘要: A semiconductor device includes a memory core circuit configured to generate core data from bank data outputted by a bank or generate the core data from a dummy column address based on a read operation for the bank. The semiconductor device also includes a data control circuit configured to generate a switching signal from a bank active signal or a dummy bank address based on the read operation for the bank and and configured to control the output of the core data based on the switching signal.

    Memory device and operating method of the memory device

    公开(公告)号:US11887694B2

    公开(公告)日:2024-01-30

    申请号:US17577140

    申请日:2022-01-17

    申请人: SK hynix Inc.

    发明人: Tae Heui Kwon

    CPC分类号: G11C8/08 G11C8/10 G11C8/12

    摘要: A memory device includes a memory block and a peripheral circuit. The memory block includes a first word line group of word lines included in the memory block and a second word line group of the word lines included in the memory block. The word lines of the first word line group are different from the word lines of the second word line group. The peripheral circuit provides the first word line group and the second word line group with an equalizing voltage during an equalizing section overlapping an erase voltage discharging section for the memory block to constantly keep voltages of the first word line group and the second word line group to the equalizing voltage.