-
公开(公告)号：US12224169B2
公开(公告)日：2025-02-11
申请号：US17706539
申请日：2022-03-28
Applicant: Protein Metrics, LLC
Inventor： Yong Joo Kil , Eric Carlson
Abstract: This invention relates to graphical user-interactive analysis of data, including in particular, mass spectrographic data analysis, as well as methods and software for generating and using such. One aspect provides user-customizable reports, including methods and apparatuses for generating customizable pivot tables and graphs specific to mass spectrographic data.
-
公开(公告)号：US20240404815A1
公开(公告)日：2024-12-05
申请号：US18530851
申请日：2023-12-06
Applicant: Thermo Finnigan LLC
Inventor： Joshua A. Silveira , Eloy R. Wouters , Gary A. Schultz
Abstract: A position control system may obtain image data representative of one or more images that depict an inlet of a mass spectrometer and an emitter positioned near the inlet and adjust, based on the image data, a position of the emitter relative to the inlet to an optimum position that is at or near a reference position relative to the inlet.
-
公开(公告)号：US20240371622A1
公开(公告)日：2024-11-07
申请号：US18610570
申请日：2024-03-20
Applicant: Standard BioTools Canada Inc. , University of Ottawa
Inventor： Paul Corkum , Alexander V. Loboda
IPC: H01J49/04 , G01N33/68 , G02B21/33 , H01J37/20 , H01J37/28 , H01J49/00 , H01J49/02 , H01J49/06 , H01J49/10 , H01J49/14 , H01J49/16 , H01J49/40
Abstract: The present invention relates to the high resolution imaging of samples using imaging mass spectrometry (IMS) and to the imaging of biological samples by imaging mass cytometry (IMC®) in which labelling atoms are detected by IMS. LA-ICP-MS (a form of IMS in which the sample is ablated by a laser, the ablated material is then ionised in an inductively coupled plasma before the ions are detected by mass spectrometry) has been used for analysis of various substances, such as mineral analysis of geological samples, analysis of archaeological samples, and imaging of biological substances. However, traditional LA-ICP-MS systems and methods may not provide high resolution. Described herein are methods and systems for high resolution IMS and IMC.
-
公开(公告)号：US20240363321A1
公开(公告)日：2024-10-31
申请号：US18768828
申请日：2024-07-10
Applicant: Micromass UK Limited
Inventor： Keith Richardson , Jason Lee Wildgoose
CPC classification number: H01J49/0031 , H01J49/0009 , H01J49/004 , H01J49/005 , H01J49/0072 , H01J49/025
Abstract: A method of mass spectrometry is disclosed comprising: performing a plurality of cycles of operation during a single experimental run, wherein each cycle comprises: mass selectively transmitting precursor ions of a single mass, or range of masses, through or out of a mass separator or mass filter at any given time, wherein the mass separator or mass filter is operated such that the single mass or range of masses transmitted therefrom is varied with time; and mass analysing ions.
-
公开(公告)号：US20240331993A1
公开(公告)日：2024-10-03
申请号：US18693037
申请日：2022-09-07
Applicant: Scienta Omicron AB
Inventor： Patrik KARLSSON
CPC classification number: H01J49/22 , H01J49/0004 , H01J49/025 , H01J49/44
Abstract: A charged particle spectrometer is described, which comprises an imaging energy analyser and an electrostatic lens system, having a first deflector and optionally a second deflector operable to cause deflection of the charged particles in a coordinate direction a first and, if applicable, also a second time before the entrance into the imaging energy analyser. The spectrometer also comprises a control unit which is configured to control the nominal spatial position of the electrostatic lens system and to control the scanning in an angular mode of the spectrometer using a lens table. A computer program for controlling the control unit is also described.
-
Patent Agency Ranking
公开(公告)号：US20240304434A1
公开(公告)日：2024-09-12
申请号：US18630314
申请日：2024-04-09
Applicant: Purdue Research Foundation
Inventor： Robert Graham Cooks , Dalton Snyder
CPC classification number: H01J49/4225 , G01N33/6848 , H01J49/025 , H01J49/429
Abstract: The invention generally relates to mass spectrometry via frequency tagging.
-
公开(公告)号：US12087567B2
公开(公告)日：2024-09-10
申请号：US18339510
申请日：2023-06-22
Applicant: Thermo Fisher Scientific (Bremen) GmbH
Inventor： Henning Wehrs , Johannes Schwieters , Gerhard Jung
CPC classification number: H01J49/063 , F16K1/2007 , H01J49/005 , H01J49/0077 , H01J49/022 , H01J49/065 , H01J49/067 , H01J49/068 , H01J49/105 , H01J49/421 , H01J49/4215
Abstract: An ion optical arrangement (1) for use in a mass spectrometer comprises electrodes (11, 12, 14) comprising a multipole arrangement defining an ion optical axis, and a voltage source for providing voltages to the electrodes to produce electric fields. The ion optical arrangement is configured for producing a radio frequency electric focusing field for focusing ions on the ion optical axis. The radio frequency electric focusing field has a varying frequency so as to reduce any mass dependence of ion trajectories through the ion optical arrangement. The ion optical arrangement may further be configured for producing a static electric field in response to a DC bias voltage applied to the multipole arrangement. A superimposed varying electric field may be produced by superimposing an AC voltage upon the DC bias voltage.
-
公开(公告)号：US12080535B2
公开(公告)日：2024-09-03
申请号：US16886288
申请日：2020-05-28
Applicant: Thermo Finnigan LLC
Inventor： Jesse D. Canterbury , Graeme C. McAlister
CPC classification number: H01J49/022 , H01J49/005 , H01J49/065 , H01J49/067 , H01J49/10 , H01J49/4225
Abstract: A mass spectrometer system, comprises: an ion source; a first and a second multipole apparatus; one or more ion gates or ion lenses between the first and second multipole apparatuses; at least one power supply configured to provide voltages to electrodes of the ion source, the mass analyzer, the first and second multipole apparatuses and the one or more ion gates or ion lenses; and a computer or electronic controller electrically coupled to the at least one power supply, wherein the computer or electronic controller comprises computer-readable instructions that are operable to cause the at least one power supply to supply voltages to the electrodes that cause transfer of ions from the first multipole apparatus to the second multipole apparatus, wherein a duration of a time allotted for completion of the transfer of the ions is dependent upon one or more properties of the ions being transferred.
-
公开(公告)号：US20240274429A1
公开(公告)日：2024-08-15
申请号：US18568417
申请日：2022-06-09
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Eric Thomas DZIEKONSKI
CPC classification number: H01J49/4245 , H01J49/0009 , H01J49/0031 , H01J49/027 , H01J49/065 , H01J49/4255 , H01J49/426
Abstract: Systems and methods described herein provide for the injection of ions into an ELIT at a variety of kinetic energies such that the ions turn around at various locations. In certain aspects, such systems and methods for operating an ELIT may reduce ion density at the turning points to reduce the impact of the space charge effect. Various aspects of the present teachings also provide for the design or optimization of the ELIT electrode spacing and/or injection potentials to reduce the impact of the space charge effect. In some related aspects, the ELIT may additionally provide time-focusing of the various ion groups at the detector as they oscillate along their respective path lengths.
-
公开(公告)号：US12057306B2
公开(公告)日：2024-08-06
申请号：US17312900
申请日：2019-12-09
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Eric Thomas Dziekonski
CPC classification number: H01J49/4245 , H01J49/065 , H01J49/027
Abstract: An ELIT includes voltage sources (1101), switches (1102), a first set of electrode plates (1110) aligned along a central axis, and a second set of electrode plates (1120) aligned along the central axis with the first set. A first group of plates (310, 320; 810, 820) of the first set and the second set is positioned to trap ions within a first path length (340, 940). A second group of plates (410, 420) of the first set and the second set is positioned to trap ions within a shorter second path length (440, 1040). The switches select the first path length by applying voltages from the voltage sources to the first set and the second set that cause the first group of plates to trap ions within the first path length. Alternatively, the switches can select the second path length by applying voltages that cause the second group of plates to trap ions within the second path length.
-
-
-
-
-
-
-
-
-
Search Results
1731
records
(took 0.047 seconds)
