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公开(公告)号:US20240364344A1
公开(公告)日:2024-10-31
申请号:US18140359
申请日:2023-04-27
发明人: Rachid Kadri , Michael Chan
IPC分类号: H03K19/173 , H03K19/20 , H03M1/78
CPC分类号: H03K19/173 , H03K19/20 , H03M1/785
摘要: One aspect provides a programmable logic device. The device includes an input circuit for detecting a multi-level input signal and an output circuit. The input circuit includes: an input pin for receiving the multi-level input signal; first and second programmable voltage generators to generate, respectively, first and second multi-level voltage signals; a pair of comparators, each comparator having a first input coupled to the input pin and a second input coupled to a corresponding programmable voltage generator; and a logic gate coupled to the comparators, thereby facilitating the detection of the multi-level input signal based on outputs of the comparators. The output circuit includes a third programmable voltage generator to generate a third multi-level voltage signal, an output pin, and a voltage buffer coupling the third programmable voltage generator to the output pin, thereby facilitating the programmable logic device to output, over the output pin, the third multi-level voltage signal.
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公开(公告)号:US12106810B2
公开(公告)日:2024-10-01
申请号:US18217987
申请日:2023-07-03
发明人: Jialiang Deng , Zhuqin Duan , Lei Shi , Yuesong Pan , Yanlan Liu , Bo Li
CPC分类号: G11C16/26 , G11C16/08 , G11C16/102 , G11C16/14 , H03K19/1737
摘要: A memory device includes N memory planes (N is an integer greater than 1), M asynchronous multi-plane independent (AMPI) read units (M is an integer smaller than or equal to N), a first microcontroller unit (MCU), and a multiplexing circuit coupled to the N memory planes, the first MCU, and the M AMPI read units. Each AMPI read unit is configured to provide an AMPI read control signal for a respective memory plane to control an AMPI read operation on the respective memory plane. The first MCU is configured to provide a non-AMPI read control signal for each memory plane to control a non-AMPI read operation on each memory plane. The multiplexing circuit is configured to, in a non-AMPI read operation, direct a non-AMPI read control signal to each memory plane from the first MCU, and in an AMPI read operation, direct each AMPI read control signal of M AMPI read control signals to the respective memory plane from the corresponding AMPI read unit.
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3.
公开(公告)号:US20240319563A1
公开(公告)日:2024-09-26
申请号:US18577702
申请日:2021-09-07
发明人: Xiaomin CHENG , Zhuli HE , Yunlai ZHU , Han LI , Xiangshui MIAO
IPC分类号: G02F3/02 , G11C13/00 , H03K19/173
CPC分类号: G02F3/022 , G11C13/0004 , H03K19/173
摘要: A Y-branch type phase-change all-optical Boolean logic device comprises a waveguide of a Y-branch structure and phase change function units covered over the waveguide. In the logic implementation method, a light pulse having a large power is employed to perform a write operation on the phase change function unit, so that the phase change function unit is heated to generate a crystallization or amorphization phase change, thereby causing a difference in optical properties under two states; the state of the phase change function unit is read by employing a light pulse having a small power, and the state of its phase change material is not changed. By defining input logic signals respectively and defining three operation steps, an operation mode reconfigurable logic can be implemented, and all 16 binary Boolean logic calculations are implemented in a simple structure by means of step-by-step operation.
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公开(公告)号:US12073912B2
公开(公告)日:2024-08-27
申请号:US17752605
申请日:2022-05-24
发明人: Yutaka Uemura , Yoshiya Komatsu
IPC分类号: G11C7/10 , H03K19/173 , H03K19/20
CPC分类号: G11C7/1039 , G11C7/1063 , G11C7/109 , H03K19/1737 , H03K19/20
摘要: In some examples, command decoders may have multiple command paths. In some examples, command signals from one command path may be provided to another command path from a node located between two latches of the command decoder, such as two latches of a flip-flop. In some examples, the command decoder may include separate flip-flops for different command modes. In some examples, the separate flip-flops may be tristate flip-flops. In some examples, the command decoder may include alternate logic circuits rather than a multiplexer.
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5.
公开(公告)号:US20240283456A1
公开(公告)日:2024-08-22
申请号:US18420801
申请日:2024-01-24
发明人: SHIH-HSIUNG HUANG
IPC分类号: H03K19/173 , H03K17/687
CPC分类号: H03K19/1737 , H03K17/6872
摘要: A multiplying circuit of an operation stage of a pipeline analog-to-digital converter (ADC) has first and second output terminals and is configured to generate first and second output signals according to first and second input signals. The multiplying circuit includes a voltage conversion circuit, first and second transistors, and first and second current sources. The voltage conversion circuit is configured to generate a first intermediate voltage and a second intermediate voltage according to the first input signal and the second input signal. The first transistor has a first terminal coupled to the first output terminal, a second terminal coupled to a power supply voltage, and a first control terminal receiving the first intermediate voltage. The second transistor has a third terminal coupled to the second output terminal, a fourth terminal coupled to the power supply voltage, and a second control terminal receiving the second intermediate voltage.
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公开(公告)号:US12057835B2
公开(公告)日:2024-08-06
申请号:US17315387
申请日:2021-05-10
发明人: Fumiaki Sugiyama
IPC分类号: H03K19/177 , H03K19/173 , H03K19/17748
CPC分类号: H03K19/17748 , H03K19/1733
摘要: A programmable logic circuit device includes: a processor; and plural reconfiguration regions each including a circuit configured by change of connection between elements. The processor is configured to: upon detection of an abnormality while performing processing in a state in which the elements in the reconfiguration regions are connected in accordance with reconfiguration data designating connection between the elements in the reconfiguration regions, acquire reconfiguration data designating such connection between the elements that the processing being performed is not performed; and change connection between the elements in the reconfiguration regions in accordance with the designation by the acquired reconfiguration data.
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公开(公告)号:US12052160B2
公开(公告)日:2024-07-30
申请号:US17650960
申请日:2022-02-14
申请人: EFINIX, INC.
发明人: Marcel Gort , Brett Grady
IPC分类号: H03K19/17728 , H03K19/173 , H04L45/122 , H04L45/42
CPC分类号: H04L45/122 , H03K19/1737 , H03K19/17728 , H04L45/42
摘要: Methods and apparatuses to provide FPGA neighbor output mux direct connections to reduce, and potentially minimize, routing hops are described. Embodiments described herein include the addition of direct connections from one tile to the output muxing of a neighboring tile. An FPGA apparatus includes a plurality of logic block tiles. One or more direct connections extend from one or more logic block tiles of the plurality of logic block tiles to one or more inputs of output multiplexors (muxes) of one or more neighboring logic block tiles. The one or more direct connections are configured to drive one or more wires that start at the one or more neighboring logic block tiles.
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公开(公告)号:US12050483B2
公开(公告)日:2024-07-30
申请号:US17021900
申请日:2020-09-15
申请人: Intel Corporation
发明人: Yossi Ben Simon , Ariel Avital , Arkady Vaisman , Ernest Knoll
IPC分类号: G06F1/04 , G06F1/10 , H03K19/173 , H03K19/20
CPC分类号: G06F1/10 , H03K19/1737 , H03K19/20
摘要: Techniques and mechanisms for determining an amount of skew between two clock signals. In an embodiment, detector circuitry receives a first signal and a signal which indicate (respectively) a NAND combination of clock signals, and a NOR combination of the clock signals. The detector circuitry evaluates a first length of time that the first signal indicates a respective first logic state, and a second length of time that the second signal indicates a respective second logic state. The skew is calculated based on a difference between the first length of time and the second length of time. In another embodiment, one of the first signal or the second signal is generated with a combinatorial logic gate, a transistor of which is relatively large, as compared to another transistor which is to operate based on one of the first signal, the second signal, or the clock signals.
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公开(公告)号:US12027229B2
公开(公告)日:2024-07-02
申请号:US17877954
申请日:2022-07-31
IPC分类号: G11C7/06 , G11C7/10 , G11C7/12 , H03K19/173
CPC分类号: G11C7/062 , G11C7/1069 , G11C7/12 , H03K19/1737
摘要: A semiconductor device includes a ROM, a differential sense amplifier and a multiplexer logic circuit. The ROM has memory cells in rows along word lines and columns along bit lines, and a reference column having reference transistors along a reference bit line. The multiplexer logic circuit couples a selected bit line to a first differential amplifier input and couples the reference bit line to the second differential amplifier input and controls a reference current of the reference bit line to be between a first bit line current of a programmed memory cell and a second bit line current of an unprogrammed memory cell.
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公开(公告)号:US20240170087A1
公开(公告)日:2024-05-23
申请号:US18504078
申请日:2023-11-07
发明人: Ket Chong Yap , Chihhung Liao , Shieh Huan Yen
IPC分类号: G11C29/32 , G11C29/12 , G11C29/20 , H03K19/173 , H03K19/17728
CPC分类号: G11C29/32 , G11C29/1201 , G11C29/20 , H03K19/1737 , H03K19/17728 , G11C2029/1202 , G11C2029/1204 , G11C2029/3202
摘要: A programmable logic device (PLD) supports scan testing of configurable logical blocks using scannable word line (WL) shift register (WLSR) chains to enable writes to configurable memory bits while scan test data is input via a scan chain comprising scannable bit line (BL) shift registers (BLSRs). Input test data may be shifted onto BLs to write data into a configurable memory bit when a corresponding WL associated with the configurable memory bit is asserted. Logic blocks may comprise: latch-based configurable memory bits, scannable WLSRs forming a distinct WLSR chain in shift mode and driving corresponding WLs. Each WL, when asserted, enables writes to a corresponding configurable memory bit. A scannable BLSR receives serial scan test vector input in shift mode and drives a corresponding BL coupled to the configurable memory bit to write data to the configurable memory bit when the associated WL is asserted.
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