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    Method of perceiving position and pose of hydraulic support group based on multi-point ranging
    1.
    发明授权
    Method of perceiving position and pose of hydraulic support group based on multi-point ranging 有权

    公开(公告)号：US12196837B2

    公开(公告)日：2025-01-14

    申请号：US18515444

    申请日：2023-11-21

    Applicant: SHANDONG UNIVERSITY OF SCIENCE AND TECHNOLOGY ,  SHANDONG YUFEI TRANSMISSION TECHNOLOGY CO., LTD

    Inventor： Wenhong Li ,  Yi Zhang ,  Fansheng Meng ,  Tianyu Zhu ,  Hongmei Tang ,  Luqun Zhu ,  Jianyu Guo ,  Wenlong Zhang ,  Xixin Liu

    IPC: G01S11/02 ,  F15B15/28 ,  G01B21/04 ,  G01F17/00 ,  G01S5/02 ,  G01B11/27 ,  G01B15/00

    Abstract: The present disclosure provides a method of perceiving a position and pose of a hydraulic support group based on multi-point ranging and belongs to the field of test or measurement technologies unlisted in other categories. The method uses a hydraulic support group. The hydraulic support group includes multiple juxtaposed hydraulic supports. The method includes: with a plane above a base as a reference plane, establishing a reference coordinate system; perceiving a relative position of the base and a canopy of the hydraulic supports and perceiving a position and pose of a single hydraulic support; when the hydraulic supports have axial offset and roll phenomenon, performing offset amount calculation; based on the perception of the position and pose of single hydraulic supports, performing perception on the position and pose of the hydraulic support group. In the present disclosure, the measurement devices achieve conversion of pure distance information into three-dimensional pose information of an object in time and space by using logical combination of several real-time ranging terminals, leading to simple structure; there is no interference between measurement devices, and there is wireless connection between a signal transmitting device and a signal receiving device, resulting in no rendezvous point and being free from impact of frictional force.

    Method to Control Gap for Sheet Manufacturing Measurement Processes
    2.
    发明申请
    Method to Control Gap for Sheet Manufacturing Measurement Processes 有权

    公开(公告)号：US20240426604A1

    公开(公告)日：2024-12-26

    申请号：US18212434

    申请日：2023-06-21

    Applicant: Honeywell International Inc.

    Inventor： Greg Reynen

    IPC: G01B15/00 ,  G01B21/16 ,  G01N23/20025

    Abstract: Sensors used in sheet manufacturing environments can be sensitive to the gap between the scanner heads. Nuclear gauges measure both the sheet product and gas in the column between the scanner heads. The gap distance can affect the measurement in a linear or non-linear fashion depending on the sensing principle High frequency vibrations can cause the sensor devices therein to move. Techniques for controlling the sensor gap between operative surfaces on dual scanner heads during measurement operation employs a closed-loop control where piezoelectric actuators are used to maintain a constant gap throughout the scan by closing the error signal on the gap measurement sensor. A system for measuring a property of a continuous sheet includes dual scanner heads housing radiation emitters and receivers. Gap measurement signals energize the actuators that adjust the position of one or both sensor devices to maintain the gap at a desired distance.

    Device feature specific edge placement error (EPE)
    3.
    发明授权
    Device feature specific edge placement error (EPE) 有权

    公开(公告)号：US12092966B2

    公开(公告)日：2024-09-17

    申请号：US18386846

    申请日：2023-11-03

    Applicant: KLA Corporation

    Inventor： Amnon Manassen ,  Nadav Gutman ,  Frank Laske ,  Andrei V. Shchegrov

    IPC: G01B15/00 ,  G01B11/27 ,  G03F7/00

    CPC classification number: G03F7/706845 ,  G01B11/272 ,  G01B15/00 ,  G03F7/70655 ,  G01B2210/56

    Abstract: A system and method are disclosed for generating metrology measurements with second sub-system such as an optical sub-system. The method may include performing a training and a run-time operation. The training may include receiving first metrology data for device features from the first metrology sub-system (e.g., optical); generating first metrology measurements (e.g., critical dimensions, etc.); binning the device features into two or more device bins based on the first metrology measurements; and identifying representative metrology targets for the two or more device bins based on distributions of the first metrology measurements. The run-time operation may include receiving run-time metrology data (e.g., optical) of the representative metrology targets; and generating run-time metrology measurements based on the run-time metrology data.

    DETERMINING A POSITION OF A TREATMENT INSTRUMENT TO PERFORM A TREATMENT ON AN OBJECT
    5.
    发明公开
    DETERMINING A POSITION OF A TREATMENT INSTRUMENT TO PERFORM A TREATMENT ON AN OBJECT 审中-公开

    公开(公告)号：US20240210169A1

    公开(公告)日：2024-06-27

    申请号：US18523489

    申请日：2023-11-29

    Applicant: Siemens Healthcare GmbH

    Inventor： Alois Regensburger ,  Daniel Ploss

    IPC: G01B15/00

    CPC classification number: G01B15/00

    Abstract: An X-ray device is provided that includes: an X-ray source configured to provide the X-ray radiation; an X-ray detection unit configured to detect secondary X-ray radiation at least partially transmitted through the object and/or at least partially dispersed by the object, and to provide at least one detector signal as a function of the detected secondary X-ray radiation; and an X-ray analyzer unit configured to analyze the at least one detector signal in order to determine a structure of the object at least in part. The X-ray detection unit is further configured to receive a radio signal, e.g., from a transmitter unit of the treatment instrument positioned in a predefined area of the object and, as a function of the detected radio signal, to provide at least one received signal or analysis by a radio analyzer unit to determine a position of the treatment instrument in relation to the object.

    SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURES OF A BONDED SAMPLE
    7.
    发明公开
    SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURES OF A BONDED SAMPLE 审中-公开

    公开(公告)号：US20240093985A1

    公开(公告)日：2024-03-21

    申请号：US17946935

    申请日：2022-09-16

    Applicant: KLA Corporation

    Inventor： Nimrod Shuall ,  Jordan Pio ,  Frank Laske ,  Stefan Eyring ,  Ohad Bachar

    IPC: G01B11/27 ,  G01B15/00

    CPC classification number: G01B11/27 ,  G01B15/00

    Abstract: Systems and methods for acquiring measurements of structures of a bonded sample are disclosed. Such systems and methods may include determining a first registration measurement of a first registration structure and a first interface target structure of a first sample, and a second registration measurement of a second sample prior to coupling the samples together. Such systems and methods may include, after such a coupling of the samples, determining a third registration measurement of the coupled sample at least partially by measuring the first registration structure through the top face of the first sample. Such systems and methods may include acquiring an overlay measurement based on the first registration measurement, the second registration measurement, and the third registration measurement. Such systems and methods may include adjusting an inter-sample coupling recipe based on the overlay measurement, where the inter-sample coupling recipe may include a final bonding recipe.

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