Surface finish stylus
    1.
    发明授权

    公开(公告)号:US12018938B2

    公开(公告)日:2024-06-25

    申请号:US17044356

    申请日:2019-04-23

    申请人: RENISHAW PLC

    摘要: A surface finish stylus is described that includes an elongate stylus shaft and a contact element protruding from the elongate shaft for contacting a surface to be measured. The contact element is deformable and the stylus shaft includes a clamp for retaining the contact element, the contact element being deformed by the clamp. The contact element may comprise a metal, such as chromium steel or nitinol. The contact element includes one or more regions of weakness to cause a required deformation when retained by the clamp. The surface finish stylus may be used with a surface finish measurement probe or the like.

    Fuser rollers
    2.
    发明授权

    公开(公告)号:US11385575B2

    公开(公告)日:2022-07-12

    申请号:US17256671

    申请日:2018-11-02

    IPC分类号: G03G15/20 G03G15/00 G01B7/34

    摘要: An example print apparatus is described as including a fuser roller, a pressure device that generates wear on a section of the fuser roller surface, and a wear detection engine that identifies a degree of wear on the surface of the fuser roller. An example fuser roller may include a tube, a heating element, and a plurality of layers having a detectable pattern. An example print apparatus may include a wear detection engine having an emitter, a detector, and a controller that identifies a wear pattern based on data provided by the detector in response to activation of the emitter and determines a degree of wear based on the identified wear pattern.

    SURFACE FINISH STYLUS
    3.
    发明申请

    公开(公告)号:US20210033379A1

    公开(公告)日:2021-02-04

    申请号:US17041864

    申请日:2019-04-23

    申请人: RENISHAW PLC

    IPC分类号: G01B7/34 G01B21/04

    摘要: A surface finish stylus and associated methods for a multi-directional scanning probe the stylus having an elongate stylus shaft having a longitudinal axis and one or more contact elements protruding from the elongate shaft for contacting a surface to be measured. The one or more contact elements are configured to enable measurement of surface finish during motion of the stylus shaft relative to a surface along a measurement direction that is non-parallel to the longitudinal axis. The multi-directional scanning probe may be carried by a coordinate measuring machine or machine tool.

    Form measuring apparatus
    4.
    发明授权

    公开(公告)号:US10900765B2

    公开(公告)日:2021-01-26

    申请号:US16207706

    申请日:2018-12-03

    摘要: A form measuring apparatus includes a base; an arm capable of swinging relative to the base; a coupler coupling the base and the arm, and having a deformation region that is capable of elastic deformation between the base and the arm; and a distortion detector installed in the deformation region. In the form measuring apparatus, a stylus is mounted to the arm and can slide along a surface of a work piece.

    METHOD FOR SHAPE ERROR IN-SITU MEASUREMENT OF TORUSES

    公开(公告)号:US20190178642A1

    公开(公告)日:2019-06-13

    申请号:US16321991

    申请日:2017-05-03

    IPC分类号: G01B21/30 G01B7/34 G01B5/28

    摘要: The present invention provides a method for shape error in-situ measurement of toruses, and is realized based on a system for shape error in-situ measurement of large-scale toruses. The system for in-situ measurement comprises an attitude adjusting part, a rotating part and a measuring part. The attitude adjusting part comprises an attitude adjusting platform, an attitude adjusting platform motor and an adapter panel; the rotating part comprises a rotating index plate base and a high-precision rotating index plate; and the measuring part comprises a sensor clamp, sensor holders, contact sensors and associated equipment. The present invention realizes the application of the three-point method in shape error measurement of the torus, also realizes algorithm improvement of the three-point method in realizing shape error in-situ measurement of the torus, can realize shape error in-situ measurement of the torus, can greatly reduce the processing time of the part and can reduce the influence of repeated clamping on part precision.

    Measuring System With A Ball Bearing Guide Unit For A Measuring Instrument

    公开(公告)号:US20190003819A1

    公开(公告)日:2019-01-03

    申请号:US16013711

    申请日:2018-06-20

    摘要: A measuring system (15) includes a measuring arm receiving unit (18) mounted on the housing (49) or on an axial pin (30) connected to the housing (49) for conjoint rotation so as to be rotatable or pivotable about the axis of rotation (D). A measuring arm (16) can be arranged on the measuring arm receiving unit (18). A motor unit (24) generates a motor torque about the axis of rotation (D) on the measuring arm receiving unit (18). The measuring arm unit (18) is mounted by a ball bearing guide unit (39) to be rotatable about the axis of rotation (D) in the peripheral direction and displaceably along the axis of rotation (D) in the axial direction A. An axial position of the measuring arm unit (18) in the axial direction is defined with the aid of a magnetic axial bearing device (46) and is maintained during operation.

    Bidirectional displacement detector

    公开(公告)号:US09719769B2

    公开(公告)日:2017-08-01

    申请号:US15207356

    申请日:2016-07-11

    发明人: Ryo Takanashi

    摘要: A bidirectional displacement detector according to the present invention includes: a displacement detector which includes a first detection element and a second detection element; a base at which the first detection element is provided; an arm which is coupled to the base so as to be rotatable around an arm rotation axis extending in a horizontal direction, and at which the second detection element is provided; and a probe which is coupled to the base so as to be rotatable around a probe rotation axis perpendicular to the arm rotation axis. The probe has a contact part provided at a position away from the probe rotation axis, and a pair of abutment parts which is disposed along a direction of the arm rotation axis and on both sides with the probe rotation axis interposed therebetween and comes into contact with the arm so as to be able to be separated from the arm. Each of the pair of abutment parts is in contact with the arm from the lower side thereof and is biased upward.

    COMPUTER PRODUCT, UNEVENNESS ANALYSIS METHOD, AND UNEVENNESS ANALYZER
    9.
    发明申请
    COMPUTER PRODUCT, UNEVENNESS ANALYSIS METHOD, AND UNEVENNESS ANALYZER 审中-公开
    计算机产品,未知分析方法和无损分析仪

    公开(公告)号:US20160244066A1

    公开(公告)日:2016-08-25

    申请号:US15147026

    申请日:2016-05-05

    申请人: FUJITSU LIMITED

    IPC分类号: B60W40/06 G01B7/34 G01P15/00

    摘要: A non-transitory, computer-readable recording medium stores therein an unevenness analysis program that causes a computer to perform based on an analysis parameter, analysis of motion data of a mobile object and analysis of unevenness of a road surface traveled by the mobile object. The unevenness analysis program causes the computer to execute a process including identifying based on a motion status of the mobile object indicated by the motion data, which includes at least longitudinal acceleration of the mobile object, first motion data that indicates one of an accelerating state and a decelerating state of the mobile object; and executing with respect to the identified first motion data indicating one of an accelerating state and a decelerating state, a comparison with second motion data not indicating one of an accelerating state and a decelerating state, and detection of unevenness of the road surface by a reduced sensitivity.

    摘要翻译: 非暂时的计算机可读记录介质中存储有使计算机基于分析参数执行的不平衡分析程序,移动对象的运动数据的分析以及移动对象所行驶的路面的不均匀性的分析。 不平坦度分析程序使计算机执行包括基于由运动数据指示的移动对象的运动状态进行识别的处理,运动数据至少包括移动对象的纵向加速度,指示加速状态之一的第一运动数据和 移动物体的减速状态; 并且相对于指示加速状态和减速状态之一的所识别的第一运动数据执行与不指示加速状态和减速状态之一的第二运动数据的比较,以及通过减少的路面的不均匀性的检测 灵敏度。

    Charged probe and electric fields measurement method thereof
    10.
    发明授权
    Charged probe and electric fields measurement method thereof 有权
    带电探头及电场测量方法

    公开(公告)号:US08726411B1

    公开(公告)日:2014-05-13

    申请号:US13920797

    申请日:2013-06-18

    CPC分类号: G01Q70/14 G01Q60/30 G01Q60/38

    摘要: A charged probe and an electric field measuring method are provided. The probe can be charged with single electricity on single nano particle attached on the top of the probe tip being a charged probe and the probe is applicable for measuring the electric fields of object in the nano scale. The probe comprises an insulating tip base, a cantilever and a single nano-particle. The cantilever is arranged for supporting the insulating tip base and the single nano-particle is configured on the erosion plane. After conducting contact electrification method to charge the electric nano particle, the single nano-particle will be charged with fixed number of single electrical charge. Then, the amount of the fixed number of single electrical charge is calculated by the virtual image charge calculation method. The charged probe can be used to measure the electric fields distribution by tapping mode or f-d curve measurement.

    摘要翻译: 提供了带电探针和电场测量方法。 探针可以在单个纳米颗粒上充电,单个纳米颗粒附着在作为带电探针的探针尖端上,探头可用于测量纳米级物体的电场。 探针包括绝缘尖端基座,悬臂和单个纳米粒子。 悬臂布置用于支撑绝缘尖端基座,单个纳米颗粒构造在侵蚀平面上。 在接触电化法对电纳米颗粒进行充电之后,单个纳米颗粒将以固定数量的单电荷充电。 然后,通过虚拟图像电荷计算方法计算固定数量的单个电荷的量。 带电探头可用于通过敲击模式或f-d曲线测量来测量电场分布。