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公开(公告)号：US20240361359A1
公开(公告)日：2024-10-31
申请号：US18573982
申请日：2021-09-01
申请人： ROOTECH INC.
发明人： Changyong JEONG , Sungwoon JO , Youngbok BYUN , Googchun CHO , Seongbong CHOI
CPC分类号： G01R15/202 , G01R15/18 , G01R19/0092 , G01R35/005
摘要： Proposed is a high current measuring device for measuring an entire current flowing through a metal bar (10), wherein the metal bar (10) is a rectangle, has a plate-shaped outline, and includes an even number of split slits (11a, 11b) disposed in a widthwise direction at a center of a longitudinal direction so that a branch set 11, which includes branches (in an odd number no smaller than 3) through which the entire current is divided and flows, is provided, a 1-1 notch (12a) and a 1-2 notch (12b) respectively provided by being concaved inward from two longer sides of the rectangle at the front ends of the split slits (11a, 11b), and a 2-1 notch (14a) and a 2-2 notch (14b) respectively provided by being concaved inward from two longer sides of the rectangle at the rear ends of the split slits (11a, 11b).
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2.发明公开公开(公告)号：US20240353460A1
公开(公告)日：2024-10-24
申请号：US18304254
申请日：2023-04-20
发明人： Bessem BACCOUCHE
CPC分类号： G01R29/0892 , G01R35/005
摘要： A method for inline calibration of multiple radio frequency signals fed to the same device under test is provided. Said method comprises the steps of supplying multiple radio frequency signals to the device under test and measuring at least one characteristic of the device under test based on said multiple radio frequency signals, monitoring at least phase and/or amplitude of each of the multiple radio frequency signals during the ongoing supplying to the device under test, producing, based on the monitoring, a monitoring signal indicating the relative phase and/or amplitude of the multiple radio frequency signals, and inline adjusting, based on the thus produced monitoring signal, the corresponding phase and/or the corresponding amplitude of one, more or all of the multiple radio frequency signals while they are supplied to the device under test.
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3.发明公开公开(公告)号：US20240329177A1
公开(公告)日：2024-10-03
申请号：US18621496
申请日：2024-03-29
申请人： Sensitec GmbH
发明人： Sven HAUBOLD , Matthias BRUSIUS , Heiko KNOLL
CPC分类号： G01R35/00 , G01R15/207
摘要： A device for detecting an error-free operation with a magnetic-field-monitored busbar or conductor loop for current measurement based on a magnetic-field-sensitive sensor element. The busbar or conductor loop is formed in a measurement plane of the current sensor and can be sensed at least in a measurement region by the current sensor based on a magnetic-field-sensitive effect. The test conductor loop is arranged in spatial proximity to the conductor loop sensed by the current sensor, the test conductor loop being arranged in a plane which is parallel to the measurement plane of the sensed conductor loop and is adapted to a main current path predetermined by the conductor loop such that a modulated test current introduced into the test conductor loop can be sensed in a magnetic-field-sensitive manner in the measuring region of the current sensor together with a current in the main current path.
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公开(公告)号：US12097017B2
公开(公告)日：2024-09-24
申请号：US17311705
申请日：2018-12-11
发明人： Can Baris Top , Alper Gungor , Serhat Ilbey , Huseyin Emre Guven
IPC分类号： A61B5/0515 , G01R33/00 , G01R33/12 , G01R35/00
CPC分类号： A61B5/0515 , G01R33/0023 , G01R33/1276 , G01R35/005
摘要： A method for electronic calibration of a magnetic particle imaging system is provided by proposing a coded calibration scene that contains multiple nanoparticle samples distributed randomly or pseudo-randomly inside a volume of the coded calibration scene where nanoparticle positions are changed virtually multiple times to create different calibration scenes. Virtual effect is created with current carrying electromagnets surrounding the nanoparticle samples. The method comprises: placing a plurality of nanoparticle samples inside a calibration scene; surrounding the plurality of nanoparticle samples with one or more electromagnets; applying a current to the one or more electromagnets to cause a magnetic field offset at a desired amplitude to virtually move the plurality of nanoparticle samples to a desired position; generating a system matrix with compressed sensing methods by using measurements taken for different current excitations of the one or more electromagnets, wherein the plurality of nanoparticles samples are virtually in different positions.
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公开(公告)号：US12066471B2
公开(公告)日：2024-08-20
申请号：US18236315
申请日：2023-08-21
申请人： Hitachi Energy Ltd
CPC分类号： G01R19/2513 , G01R1/20 , G01R35/00
摘要： Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.
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6.发明公开公开(公告)号：US20240248141A1
公开(公告)日：2024-07-25
申请号：US18415815
申请日：2024-01-18
申请人： Robert Bosch GmbH
发明人： Christian Simonis , Christoph Woll , Ioana Crisan , Shi Li
IPC分类号： G01R31/374 , G01R31/28 , G01R31/367 , G01R31/387 , G01R35/00
CPC分类号： G01R31/374 , G01R31/2829 , G01R31/367 , G01R31/387 , G01R35/00
摘要： A method for determining a current sensor offset of a current sensor (47) in a device battery (41) of a technical device (4). In one example, the method includes measuring the battery current using the current sensor (47); providing (S1) a temporal profile of the battery current; recording (S2) a charge balance of the electrical charge amount flowing into the device battery (41) and out of the device battery (41) over time depending on the temporal profile of the battery current; creating (S2) or adjusting a charge balance model depending on a time-accumulated charge amount; and determining the current sensor offset depending on a local slope of the charge balance model at a specified time.
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公开(公告)号：US20240219505A1
公开(公告)日：2024-07-04
申请号：US18601300
申请日：2024-03-11
发明人： Houston Fortney
CPC分类号： G01R35/005 , G01R19/25 , G01R31/2841 , H03M1/0845 , H03M1/121 , H03M1/188
摘要： An analog signal generating source comprising two or more digital-to-analog converters (DAC) combined to generate one or more frequency components. The analog signal source comprises a first path for generating substantially low frequency signals, the first path comprising a first one of the DACs; and a second path for generating substantially high frequency signals, the second path comprising a second one of the DACs. The analog signal source also comprises a data processor for processing an input signal and providing the processed input signal to the first and second paths; a combining circuit configured to combine outputs of the first and second paths into the source signal; a feedback portion configured to sense the source signal; and a servo loop configured to use the sensed source signal to adjust as need to maintain the source signal to substantially agree with the input signal.
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8.发明公开公开(公告)号：US20240151748A1
公开(公告)日：2024-05-09
申请号：US18502217
申请日：2023-11-06
申请人： Bender GmbH & Co. KG
发明人： Pascal BECKER
CPC分类号： G01R15/183 , G01R19/25 , G01R35/005
摘要： An electric circuit arrangement and to a measuring method for the galvanically separate, AC/DC-sensitive residual-current measurement, the measuring method including registering a residual current (Id) by means of a measuring current transformer having a toroid and precisely one secondary winding; supplying power to the secondary winding and generating a time-modulated, binary measuring signal (V) having a corresponding dwell time (Th, T1) in a first state (S1) and a second state (S2) by means of a driver circuit having an oscillation circuit; evaluating the dwell times (Th, T1) by means of a computing unit and outputting a residual-current measured value (Im, I'm) by a data interface, wherein the driver circuit having the oscillation circuit forms an integral structural unit in the form of a driver module, which is supplied with a shared, unipolar operating voltage (Ub) by a power-supply device together with the computing unit.
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公开(公告)号：US20240125881A1
公开(公告)日：2024-04-18
申请号：US18469826
申请日：2023-09-19
CPC分类号： G01R35/007 , G01R31/2851
摘要： The present disclosure provides a power calibration adapter for wafer probers, the power calibration adapter comprising at least one first landing pad, for releasably contacting a wafer prober tip of the wafer prober, and a power meter interface for each one of the first landing pads that is coupled to the at least one first landing pad and that is configured to couple the at least one first landing pad to a power measurement device. Further, the present disclosure provides a respective Zo measurement application system and a respective method.
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公开(公告)号：US20240085459A1
公开(公告)日：2024-03-14
申请号：US18271915
申请日：2022-01-26
发明人： Benedikt KRAMM , Felix LEBEAU , Jan SATTLER
CPC分类号： G01R1/203 , G01R1/0416 , G01R35/00
摘要： A current-sensing resistor for measuring a current with two connection parts for introducing and discharging the current to be measured includes a resistor element made of a resistor material, a first voltage measurement contact at the first connection part for measuring the voltage at the first connection part, a second voltage measurement contact at the second connection part for voltage measurement at the second connection part, and a cut in the second connection part, the cut surrounding the second voltage measurement contact and preventing current flow across the cut. The resistor also includes a third voltage measurement contact arranged at the second connection part for measuring the voltage at the second connection part, and that the third voltage measurement contact is arranged at the second connection part offset with respect to the main current flow direction transversely to the second voltage measurement contact at the second connection part.
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