ELECTRON DIFFRACTION HOLOGRAPHY
    2.
    发明申请

    公开(公告)号:US20210302333A1

    公开(公告)日:2021-09-30

    申请号:US16835129

    申请日:2020-03-30

    申请人: FEI Company

    IPC分类号: G01N23/207 G03H5/00 G01N33/38

    摘要: Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

    Radiation phase-contrast imaging device

    公开(公告)号:US10365235B2

    公开(公告)日:2019-07-30

    申请号:US15538622

    申请日:2015-11-20

    摘要: Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.

    Grating device for phase contrast and/or dark-field imaging of a movable object

    公开(公告)号:US09895117B2

    公开(公告)日:2018-02-20

    申请号:US15310933

    申请日:2015-10-01

    IPC分类号: G03H5/00 A61B6/00

    摘要: The invention relates to a grating device for phase contrast and/or dark-field imaging of a movable object, an interferometer unit, a phase contrast and/or dark-field imaging system, a phase contrast and/or dark-field imaging method, a computer program element for controlling such device and a computer readable medium having stored such computer program element. The grating device comprises a grating unit, an actuation unit, a motion detecting unit, and a control unit. The actuation unit is configured to position the grating unit in different sampling positions relative to the moveable object. The motion detecting unit is configured to detect a motion of the movable object. The detected motion of the moveable object may be a repetitive motion. The control unit is configured to control the actuation unit to position the grating unit in the different sampling positions based on the detected motion of the movable object.