-
公开(公告)号:US12133372B2
公开(公告)日:2024-10-29
申请号:US17683562
申请日:2022-03-01
发明人: Yooseok Yang , Jongwook Park
摘要: A pumping capacitor is provided. The pumping capacitor includes: first, second, third and fourth electrodes that are separately formed on a substrate; a first pumping capacitor group, wherein i first cell capacitors have lower electrodes formed on the first pad electrode and upper electrodes connected to a plate electrode, and (n−i) first cell capacitors have lower electrodes formed on the second pad electrode and upper electrodes connected to the plate electrode; and a second pumping capacitor group, wherein i second cell capacitors have lower electrodes formed on the fourth pad electrode and upper electrodes connected to the plate electrode, and (n−i) second cell capacitors have lower electrodes formed on the third pad electrode and upper electrodes connected to the plate electrode. The first pumping capacitor group and the second pumping capacitor group are connected in series, and the second pad electrode and the third pad electrode are floated.
-
公开(公告)号:US20240347120A1
公开(公告)日:2024-10-17
申请号:US18362804
申请日:2023-07-31
发明人: SHIV HARIT MATHUR , Sai Ravi Teja KONAKALLA , Niravkumar Natwarbhai PATEL , Utkarsh SRIVASTAVA , Gopikrishna SIDDULA
CPC分类号: G11C29/021 , G11C5/147 , G11C7/1096 , G11C29/022
摘要: Embodiments of the present technology provide memory cards intelligently designed to provide protection when mistakenly inserted into non-memory card hosts. Embodiments achieve such protection with less footprint/circuitry than existing fail-safe solutions, and without electrical overstress-causing offset voltages characteristic of existing fail-safe solutions. To realize these advantages, a memory card of the present technology includes a fail-safe reference voltage supply circuit that operates in a “fail-safe mode” by default, and exits and re-enters the fail-safe mode in response to voltage mode driver output enable (OE) signals.
-
公开(公告)号:US20240312494A1
公开(公告)日:2024-09-19
申请号:US18675997
申请日:2024-05-28
发明人: Shuai Xu , Michele Piccardi , Arvind Muralidharan , June Lee , Qisong Lin , Scott A. Stoller , Jun Shen
IPC分类号: G11C5/14
摘要: In a memory sub-system, causing a standby circuit associated with a memory device to enter into a low power mode. In the low power mode, causing a reference voltage to be supplied to a voltage regulator, wherein the reference voltage causes the voltage regulator to supply a standby current level to the memory device, where the standby current level is lower than a current level supplied when the memory device is in an active mode.
-
公开(公告)号:US12094559B2
公开(公告)日:2024-09-17
申请号:US18072014
申请日:2022-11-30
发明人: Zhe-Yi Lin
IPC分类号: G11C5/14
CPC分类号: G11C5/148
摘要: A voltage detecting circuit for a non-volatile memory is provided. When a standby signal is not asserted, a power supply unit of the non-volatile memory provides an array voltage to a first node. The voltage detecting circuit includes an initial voltage generator, a capacitor, a latch and a combinational logic circuit. The initial voltage generator receives an inverted standby signal and an enable signal. An output terminal of the initial voltage generator is connected with a second node. The capacitor is coupled between the first node and the second node. An input terminal of the latch is connected with the second node. An output terminal of the latch is connected with a third node. An input terminal of the combinational logic circuit is connected with the third node. An output terminal of the combinational logic circuit generates the enable signal.
-
公开(公告)号:US12094558B2
公开(公告)日:2024-09-17
申请号:US18318264
申请日:2023-05-16
发明人: Perng-Fei Yuh , Meng-Sheng Chang , Tung-Cheng Chang , Yih Wang
CPC分类号: G11C5/147 , G11C7/1084 , G11C17/165 , G11C17/18
摘要: One aspect of this description relates to a memory array. The memory array includes a plurality of N-stack pass gates, a plurality of enable lines, a plurality of NMOS stacks, a plurality of word lines, and a matrix of resistive elements. Each N-stack pass gate includes a stage-1 PMOS core device and a stage-N PMOS core device in series. Each stage-1 PMOS is coupled to a voltage supply. Each enable line drives a stack pass gate. Each N-stack selector includes a plurality of NMOS stacks. Each NMOS stack includes a stage-1 NMOS core device and a stage-N NMOS core device in series. Each stage-1 NMOS core device is coupled to a ground rail. Each word line is driving a stack selector. Each resistive element is coupled between a stack pass gate and a stack selector. Each voltage supply is greater than a breakdown voltage for each of the core devices.
-
公开(公告)号:US12093110B2
公开(公告)日:2024-09-17
申请号:US17940769
申请日:2022-09-08
发明人: Weibing Shang , Enpeng Gao
IPC分类号: G06F1/324 , G06F1/3234 , G06F1/3296 , G11C5/14 , G11C11/4074
CPC分类号: G06F1/324 , G06F1/3275 , G06F1/3296 , G11C5/148 , G11C11/4074
摘要: The present invention provides a power control circuit and control method. The power control circuit includes: a control module configured to control, according to an activation command, a memory bank of a plurality of memory banks to perform an operation; a power management module configured to wake up a local power supply for the memory bank according to a clock enable signal; and a power control module communicatively coupled with the power management module and configured to: send the clock enable signal to the power management module of the memory bank corresponding to the activation command in a power-saving mode; and send the clock enable signal to power management modules of the plurality of memory banks in a non-power-saving mode, where the power-saving mode indicates that a system clock is in a low-frequency state.
-
公开(公告)号:US12081113B2
公开(公告)日:2024-09-03
申请号:US17554839
申请日:2021-12-17
发明人: Matthew David Rowley
CPC分类号: H02M1/32 , G06F1/305 , G11C5/14 , H01L23/49838 , H01L23/50 , H02M1/322 , H02M3/33507
摘要: A memory system having a non-volatile memory and a power management integrated circuit (PMIC) that has a voltage regulator to apply a voltage on the non-volatile memory during normal operations. During a shutdown process, the PMIC has a bleeder that is activated to reduce the voltage applied on the non-volatile memory to a level that is below a programmable threshold, before allowing the memory system to restart again. During the bleeding operation, a comparator of the PMIC compares the voltage applied to the non-volatile memory and the threshold to determine whether the shutdown process can be terminated for a restart.
-
公开(公告)号:US12080372B2
公开(公告)日:2024-09-03
申请号:US18064048
申请日:2022-12-09
发明人: He-Zhou Wan , Xiuli Yang , Ming-En Bu , Mengxiang Xu , Zong-Liang Cao
IPC分类号: G11C5/14
CPC分类号: G11C5/148
摘要: A device includes a first virtual power line coupled to a power supply through a first group of transistor switches, and a second virtual power line configured to receive the power supply through a second group of transistor switches. The device also includes a delay circuit coupled between the gate terminals of the first group of transistor switches and the gate terminals in the second group of transistor switches. The device further includes a wakeup detector and a plurality of main input-output (MIO) controllers. The wakeup detector is configured to generate a trigger signal after receiving a signal from the output of the delay circuit. The plurality of MIO controllers is coupled to the power supply through a group of wakeup switches and through a group of function switches. The gate terminals in the group of wakeup switches are configured to receive the trigger signal.
-
9.
公开(公告)号:US12079022B2
公开(公告)日:2024-09-03
申请号:US18493796
申请日:2023-10-24
申请人: Apple Inc.
IPC分类号: G05F3/26 , G05F3/20 , G11C5/14 , G11C11/4074
CPC分类号: G05F3/26 , G05F3/205 , G11C5/147 , G11C11/4074
摘要: A power detect circuit is disclosed. A power detect circuit includes a voltage multiplier that receives an external supply voltage and generates a second supply voltage that is greater than the former. A voltage regulator is coupled to receive the second supply voltage and outputs a regulated supply voltage. A bandgap circuit is coupled to receive the second supply voltage when a first switch is closed, and the regulated supply voltage when a second switch is closed. The bandgap circuit generates a reference voltage for the voltage regulator, as well as one or more output voltages. A comparator circuit is coupled to receive the one or more output voltages from the bandgap circuit, and may compare these one or more output voltages to the regulated supply voltage.
-
公开(公告)号:US20240290376A1
公开(公告)日:2024-08-29
申请号:US18506202
申请日:2023-11-10
发明人: Wenlun Zhang , Hiroki Fujisawa , Shinichi Miyatake , Yuan He
IPC分类号: G11C11/4091 , G11C5/14 , G11C11/4096
CPC分类号: G11C11/4091 , G11C5/147 , G11C11/4096
摘要: Sense amplifiers for memory devices may include threshold voltage compensation circuitry configured to compensate a threshold voltage offset of a portion of the sense amplifier. Additionally, the sense amplifiers also perform pre-sensing of the portion of the sense amplifier. Moreover, the sense amplifier is configured to perform main sensing and latching in a phase after pre-sensing the portion of the sense amplifier.
-
-
-
-
-
-
-
-
-