Complemented ion funnel for mass spectrometer

    公开(公告)号:US12125692B2

    公开(公告)日:2024-10-22

    申请号:US17345549

    申请日:2021-06-11

    IPC分类号: H01J49/06 H01J49/00 H01J49/24

    摘要: A mass spectrometry method comprises: (1) introducing ions and gas into an first electrode section of an ion transport apparatus through a slot of an ion transfer tube, the ion tunnel section comprising a first longitudinal axis that is contained within a slot plane of the ion transfer tube, the first longitudinal axis not intersecting an outlet of the ion transfer tube, wherein the apparatus further comprises: (a) a second electrode section configured to receive the ions from the first electrode section and comprising a second longitudinal axis that is not coincident with the first longitudinal axis; and (b) an ion outlet aperture; (2) providing voltages to electrodes of the ion transport apparatus that urge the ions to migrate towards the first longitudinal axis within the first electrode section; and (3) exhausting gas through a port that is offset from the ion outlet aperture.

    INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY

    公开(公告)号:US20240347331A1

    公开(公告)日:2024-10-17

    申请号:US18682218

    申请日:2022-08-10

    IPC分类号: H01J49/00

    CPC分类号: H01J49/0045

    摘要: Methods for correlating a product ion in a mass spectrum to a precursor ion are disclosed herein, comprising determining a precursor ion ml z corresponding to the product ion as an m/z at which the product ion appears in a maximum amount of the series of mass spectra. Methods also can comprise obtaining a series of mass spectra for a sample across a mass range, each of the series of mass spectra having a precursor ion transmission window defined by a width (W) that overlaps with that of at least two of the series of mass spectra by a step size (S).

    Mass Spectrometer and Mass Spectrometry Method

    公开(公告)号:US20240347328A1

    公开(公告)日:2024-10-17

    申请号:US18294930

    申请日:2022-03-25

    IPC分类号: H01J49/00 H01J49/04

    摘要: The method of operating a mass spectrometer includes: introducing precursor ions into a reaction chamber; generating radicals by generating plasma by supplying source gas and radio-frequency power to a radical generation chamber for a predetermined period by transmitting a predetermined control signal to a source gas supply part and a radio-frequency power supply part; generating product ions by introducing the radicals into the reaction chamber; measuring an intensity of light having a wavelength band including a wavelength of light emitted from the plasma inside the radical generation chamber; and determining and notifying an abnormality of the mass spectrometer on a basis of a fact that the intensity of the light exceeds a predetermined abnormality determination threshold value during a period other than the predetermined period.

    CHARGED PARTICLE SPECTROMETER
    10.
    发明公开

    公开(公告)号:US20240331993A1

    公开(公告)日:2024-10-03

    申请号:US18693037

    申请日:2022-09-07

    发明人: Patrik KARLSSON

    摘要: A charged particle spectrometer is described, which comprises an imaging energy analyser and an electrostatic lens system, having a first deflector and optionally a second deflector operable to cause deflection of the charged particles in a coordinate direction a first and, if applicable, also a second time before the entrance into the imaging energy analyser. The spectrometer also comprises a control unit which is configured to control the nominal spatial position of the electrostatic lens system and to control the scanning in an angular mode of the spectrometer using a lens table. A computer program for controlling the control unit is also described.