公开(公告)号：WO2009052475A1

公开(公告)日：2009-04-23

申请号：PCT/US2008/080449

申请日：2008-10-20

Applicant: U.S.A. AS REPRESENTATED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION ,  PARK, Yeonjoon ,  CHOI, Sang, H. ,  KING, Glen, C. ,  ELLIOTT, James, R.

Inventor： PARK, Yeonjoon ,  CHOI, Sang, H. ,  KING, Glen, C. ,  ELLIOTT, James, R.

IPC: G01N23/20

CPC classification number: G01N23/207

Abstract: A method provides X-ray diffraction data suitable for integral detection of a twin defect in a strained or lattice-matched epitaxial material made from components having crystal structures having symmetry belonging to different space groups. The material is mounted in an X-ray diffraction (XRD) system. In one embodiment, the XRD system's goniometer angle Ω is set equal to {ΘB - β) where ΘB is a Bragg angle for a designated crystal plane of the alloy that is disposed at a non-perpendicular orientation with respect to the (111) crystal plane, and β is the angle between the designated crystal plane and a (111) crystal plane of one of the epitaxial components. The XRD system's detector angle is set equal to (ΘB ~ β). The material can be rotated through an angle of azimuthal rotation φ about the axis aligned with the material. Using the detector, the intensity of the X-ray diffraction is recorded at least at the angle at which the twin defect occurs.

Abstract translation: 一种方法提供了适用于由具有属于不同空间群的对称性的晶体结构的组分制成的应变或晶格匹配的外延材料中的双缺陷的积分检测的X射线衍射数据。 该材料安装在X射线衍射（XRD）系统中。 在一个实施例中，XRD系统的测角器角度O设定为等于{TB-β），其中TB是相对于（111）晶体以非垂直取向设置的合金的指定晶面的布拉格角 平面，ß是指定晶面与外延元件之一的（111）晶面之间的角度。 XRD系统的检测器角度设置为等于（TB〜ß）。 材料可以围绕与材料对准的轴旋转方位角f的角度。 使用检测器，至少以发生双瑕疵的角度记录X射线衍射的强度。

公开(公告)号：WO2009051836A1

公开(公告)日：2009-04-23

申请号：PCT/US2008/011930

申请日：2008-10-20

Applicant: U.S.A. AS REPRESENTATED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION ,  CHOI, Sang, H. ,  PARK, Yeonjoon ,  KING, Glen, C. ,  ELLIOTT, James, R.

Inventor： CHOI, Sang, H. ,  PARK, Yeonjoon ,  KING, Glen, C. ,  ELLIOTT, James, R.

IPC: H01L21/02 ,  H01L31/117

CPC classification number: G01N23/207

Abstract: Growth conditions are developed, based on a temperature-dependent alignment model, to enable formation of cubic group IV, group II-V and group II-VI crystals in the [111] orientation on the basal (0001) plane of trigonal crystal substrates, controlled such that the volume percentage of primary twin crystal is reduced from about 40% to about 0.3%, compared to the majority single crystal. The control of stacking faults in this and other embodiments can yield single crystalline semiconductors based on these materials that are substantially without defects, or improved thermoelectric materials with twinned crystals for phonon scattering while maintaining electrical integrity. These methods can selectively yield a cubic-on-trigonal epitaxial semiconductor material in which the cubic layer is substantially either directly aligned, or 60 degrees-rotated from, the underlying trigonal material.

Abstract translation: 开发基于温度依赖性取向模型的生长条件，以使得能够在三面晶体基底的（0001）面上形成[111]取向的立方体IV族，II-V族和II-VI族晶体， 控制使得与多数单晶相比，原生双晶的体积百分比从约40％降低至约0.3％。 本实施例和其它实施例中堆垛层错的控制可以产生基本上没有缺陷的这些材料的单晶半导体，或者具有用于声子散射的具有孪晶晶体的改进的热电材料，同时保持电气完整性。 这些方法可以选择性地产生立方晶三面体外延半导体材料，其中立方体层基本上与下面的三角形材料直接对准或者60度旋转。

公开(公告)号：WO2008105900A3

公开(公告)日：2008-12-31

申请号：PCT/US2007073022

申请日：2007-07-09

Applicant: NASA ,  CHOI SANG H ,  PARK YEONJOON

Inventor： CHOI SANG H ,  PARK YEONJOON

IPC: G01J3/30

CPC classification number: G01J3/4406 ,  G01J3/02 ,  G01J3/0229 ,  G01N21/6402 ,  G01N21/6456

Abstract: An optical method and system sense and identify a foreign particle in a gaseous environment. A light source generates light. An electrically-conductive sheet has an array of holes formed through the sheet. Each hole has a diameter that is less than one quarter of the light's wavelength. The sheet is positioned relative to the light source such that the light is incident on one face of the sheet. An optical detector is positioned adjacent the sheet's opposing face and is spaced apart therefrom such that a gaseous environment is adapted to be disposed therebetween. Alterations in the light pattern detected by the optical detector indicate the presence of a foreign particle in the holes or on the sheet, while a laser induced fluorescence (LIF) signature associated with the foreign particle indicates the identity of the foreign particle.

Abstract translation: 光学方法和系统在气体环境中感知并识别异物。 光源产生光。 导电片具有穿过该片形成的孔阵列。 每个孔的直径都小于光波长的四分之一。 片材相对于光源定位，使得光线入射到片材的一个面上。 光学检测器设置在片材的相对面附近并且与其隔开，使得气体环境适于设置在其间。 由光学检测器检测到的光图案的变化表明在孔或片上存在异物，而与外来粒子相关的激光诱导荧光（LIF）标记表明异物的身份。