Abstract:
An apparatus and a method for producing passive components on an integrated circuit device (100). The integrated circuit device (100) has post wafer fabrication integrated passive components (107) situated on the opposite substrate side (105) of the device's integrated circuitry (103). Electrical contact pads (109) of the passive components (107) are configured to be coupled to the electronics package contact pads to complete the electronic package.
Abstract:
An apparatus and a method for producing three- dimensional integrated circuit packages. In one embodiment, an electronics package (200) with at least two dice (207, 209) are stacked one atop another is disclosed. A top die (209) is of smaller size compared with a bottom die (207) such that after a die attach operation, wire-bond pads of the bottom die will be exposed for a subsequent wire bonding operation. The bottom die (207) contains contact pads (211) on the front side that couple with one or more passive components (213) fabricated on the back side of the top die (209) to complete the circuit. In another exemplary embodiment, a method to form one or more three-dimensional passive components in a stacked-die package is disclosed wherein partial inductor elements are fabricated on the front side of the bottom die and the back side of the top die. The top and bottom elements are coupled together completing the passive component.
Abstract:
An apparatus and a method for packaging semiconductor devices (205, 207). Disclosed are multi- die packaging apparatuses (200) and techniques, especially useful for integrated circuit dice (207) involving insulative substrates (225), such as silicon- on-insulator (SOI), where grounding of a base layer (225) is not reasonably practical. Disclosed is a means for effectively grounding all layers of an integrated circuit device (205, 207) regardless of whether the device (205, 207) makes direct contact with a die-attach paddle (201).
Abstract:
An apparatus and a method for packaging semi-conductor devices. The apparatus is applicable to many types of contemporary packaging schemes that utilize a sacrificial metal base strip. Tunnels (213) formed through an encapsulation area (215) surrounding the device (207) and associated bond wires (211) are filled with a metallic conductor by, for example, electroplating, and extend bottom contact pads (205) to an uppermost portion of the encapsulated area (215) . The sacrificial metal base strip (201) serves as a plating bus and is etch-removed after plating. The filled tunnels (213) allow components to be stacked in a three-dimensional configuration.
Abstract:
An apparatus and a method for packaging semiconductor devices. The apparatus includes a substrate strip component (201A-201E) of a leadless three-dimensional stackable semiconductor package (300) having mounting contacts on, for example, four peripheral edges. The substrate strip may either be fabricated for mounting a single electrical component (e.g., an integrated circuit die 209) or a plurality of substrate strips may be laid out in an X-Y matrix pattern which may later be singulated (215) into individual package strip for leadless packages. Three-dimensional stacking (350) is achieved by a bonding area (301) on an uppermost portion of the sidewall (203). The sidewall of the strip is high enough to enclose an encapsulant (213) covering a later mounted integrated circuit die and associated bonding wires (211).
Abstract:
An electronic multi -component package (74, 75) is assembled by placing multiple electronic components (30) within multiple openings (16) of a package substrate (12), then depositing and curing adhesive filler (34) in gaps between the components and the inner peripheries of the openings. Circuit features (38, 42), including conductive interconnects, are formed by thin-film photolithography over both front and back surfaces (22F, 22B) of the package substrate. Preformed conductive vias (18) through the package substrate provide electrical connection between circuit features on opposite substrate surfaces. Additional electronic components (50, 54, 58) may be attached (52, 56, 60) to conductive lands on at least one side of the package. The circuit features also include contact pads (66) for external package connections, such as in a ball-grid-array or equivalent structure.
Abstract:
An apparatus and a method for packaging semiconductor devices. The apparatus is a three- dimensional electronic package comprising one or more electronic components (305, 307, 355, 357), a plurality of electrical contact pads (333, 335), and a plurality of electrically conductive three-dimensional plugs (315) formed through an encapsulant (311, 361). Specific ones of the plurality of electrical contact pads (333, 335) are electrically coupled to the one or more electronic components (305, 307, 355, 357) on an uppermost surface of the plurality of electrical contact pads (333, 335). The encapsulant (311, 361) is formed over and covers the one or more electronic devices (305, 307, 355, 357). The plurality of three-dimensional plugs (315) have a first end extending from at least the uppermost portion of one or more of the plurality of electrical contact pads (333, 335) and a second end extending substantially to an uppermost surface of the encapsulant (311, 361).
Abstract:
An electrical package for an integrated circuit die (101) which comprises a die-attach paddle (201) for mounting the integrated circuit die (101). The die-attach paddle (201) has at least one down-set area located on a periphery of the die-attach paddle (201). The down-set area has an upper surface and a lower surface, with the upper surface configured to electrically couple a first end of a first electrically conductive lead wire (301). A second end of the first electrically conductive lead wire (301) is bonded to the integrated circuit die (101). The upper surface is further configured to electrically couple a first end of a second electrically conductive lead wire (303) and a second end of the second electrically conductive lead wire (303) is bonded to a lead finger (203) of the electrical package.
Abstract:
The present invention allows non-wafer form devices to be tested on a standard automatic wafer-probe tester or other automated test or measurement device commonly employed in semiconductor or allied industries (e.g., flat panel display, data storage, or the like) processes. The present invention accomplishes this by providing a low-profile carrier (100) for temporarily mounting a non-wafer form device. The low-profile carrier (100) holds the non-wafer form device (e.g., an integrated circuit chip, a thin film head structure, one or more molded array packages, etc.) magnetically into recesses (105, 107) which are machined or otherwise formed in the low-profile carrier (100).
Abstract:
A method of forming an integrated circuit package at the wafer level. The integrated circuit package occupies a minimum amount of space on an end-use printed circuit board. Solder bumps (30), or conductive adhesive, is deposited on the metallized wirebond pads (23) on the top surface of a silicon wafer (21). An underfill-flux material (27) is deposited over the wafer (21) and the solder bumps (30). A pre-fabricated interposer substrate (31), made of a metal circuitry (34) and a dielectric base (32), has a plurality of metallized through-holes (38) which are aligned with the solder bumps (30). The wafer/interposer assembly is reflowed, or cured, to form the electrical connection between the circuitry on the interposer layer (34) and the circuitry on the wafer. Solder balls (50) are then placed on the metal pad openings on the interposer substrate and are reflowed to form a wafer-level BGA structure. The wafer-level BGA structure is then cut into individual BGA chip packages.