A STACKED-DIE ELECTRONICS PACKAGE WITH PLANAR AND THREE-DIMENSIONAL INDUCTOR ELEMENTS
    2.
    发明申请
    A STACKED-DIE ELECTRONICS PACKAGE WITH PLANAR AND THREE-DIMENSIONAL INDUCTOR ELEMENTS 审中-公开
    具有平面和三维电感元件的堆叠式电子封装

    公开(公告)号:WO2008008587A2

    公开(公告)日:2008-01-17

    申请号:PCT/US2007071079

    申请日:2007-06-13

    Inventor: LAM KEN M

    Abstract: An apparatus and a method for producing three- dimensional integrated circuit packages. In one embodiment, an electronics package (200) with at least two dice (207, 209) are stacked one atop another is disclosed. A top die (209) is of smaller size compared with a bottom die (207) such that after a die attach operation, wire-bond pads of the bottom die will be exposed for a subsequent wire bonding operation. The bottom die (207) contains contact pads (211) on the front side that couple with one or more passive components (213) fabricated on the back side of the top die (209) to complete the circuit. In another exemplary embodiment, a method to form one or more three-dimensional passive components in a stacked-die package is disclosed wherein partial inductor elements are fabricated on the front side of the bottom die and the back side of the top die. The top and bottom elements are coupled together completing the passive component.

    Abstract translation: 一种用于生产三维集成电路封装的装置和方法。 在一个实施例中,公开了具有至少两个骰子(207,209)的电子封装(200)。 与底模(207)相比,顶模(209)尺寸较小,使得在芯片附接操作之后,底模的引线接合焊盘将被暴露以用于随后的引线接合操作。 底模(207)包括在前侧上的与在顶模(209)的背面上制造的一个或多个无源元件(213)耦合以便完成电路的接触焊盘(211)。 在另一个示例性实施例中,公开了一种在堆叠管芯封装中形成一个或多个三维无源部件的方法,其中部分电感器元件制造在底模的前侧和顶模的背面。 顶部和底部元件联接在一起,完成无源部件。

    MULTI-COMPONENT PACKAGE WITH BOTH TOP AND BOTTOM SIDE CONNECTION PADS FOR THREE-DIMENSIONAL PACKAGING
    7.
    发明申请
    MULTI-COMPONENT PACKAGE WITH BOTH TOP AND BOTTOM SIDE CONNECTION PADS FOR THREE-DIMENSIONAL PACKAGING 审中-公开
    具有两个顶部的双组分封装和用于三维包装的底部侧连接垫

    公开(公告)号:WO2008057739A3

    公开(公告)日:2008-07-10

    申请号:PCT/US2007082002

    申请日:2007-10-19

    Inventor: LAM KEN M

    Abstract: An apparatus and a method for packaging semiconductor devices. The apparatus is a three- dimensional electronic package comprising one or more electronic components (305, 307, 355, 357), a plurality of electrical contact pads (333, 335), and a plurality of electrically conductive three-dimensional plugs (315) formed through an encapsulant (311, 361). Specific ones of the plurality of electrical contact pads (333, 335) are electrically coupled to the one or more electronic components (305, 307, 355, 357) on an uppermost surface of the plurality of electrical contact pads (333, 335). The encapsulant (311, 361) is formed over and covers the one or more electronic devices (305, 307, 355, 357). The plurality of three-dimensional plugs (315) have a first end extending from at least the uppermost portion of one or more of the plurality of electrical contact pads (333, 335) and a second end extending substantially to an uppermost surface of the encapsulant (311, 361).

    Abstract translation: 一种用于封装半导体器件的装置和方法。 该装置是包括一个或多个电子部件(305,307,355,357),多个电接触焊盘(333,335)和多个导电三维插头(315)的三维电子封装件, 通过密封剂(311,361)形成。 多个电接触焊盘(333,335)中的特定的电接触焊盘电耦合到多个电接触焊盘(333,335)的最上表面上的一个或多个电子部件(305,307,355,357)。 密封剂(311,361)形成在一个或多个电子设备(305,307,355,357)之上并且覆盖该一个或多个电子设备。 多个三维插头(315)具有从多个电接触焊盘(333,335)中的一个或多个的至少最上部延伸的第一端和基本上延伸到密封剂的最上表面的第二端 (311,361)。

    A LOW PROFILE CARRIER FOR NON-WAFER FORM DEVICE TESTING
    9.
    发明申请
    A LOW PROFILE CARRIER FOR NON-WAFER FORM DEVICE TESTING 审中-公开
    一种用于非晶片器件测试的低性能载体

    公开(公告)号:WO2005034178A2

    公开(公告)日:2005-04-14

    申请号:PCT/US2004028495

    申请日:2004-09-02

    Applicant: ATMEL CORP

    CPC classification number: H01L21/68778 G01R1/0483 H01L21/67346 H01L21/68785

    Abstract: The present invention allows non-wafer form devices to be tested on a standard automatic wafer-probe tester or other automated test or measurement device commonly employed in semiconductor or allied industries (e.g., flat panel display, data storage, or the like) processes. The present invention accomplishes this by providing a low-profile carrier (100) for temporarily mounting a non-wafer form device. The low-profile carrier (100) holds the non-wafer form device (e.g., an integrated circuit chip, a thin film head structure, one or more molded array packages, etc.) magnetically into recesses (105, 107) which are machined or otherwise formed in the low-profile carrier (100).

    Abstract translation: 本发明允许在标准自动晶片 - 探针测试器或半导体或相关行业(例如,平板显示器,数据存储等)过程中常用的其他自动化测试或测量设备上测试非晶片形式的器件。 本发明通过提供用于临时安装非晶片形式装置的低轮廓载体(100)来实现这一点。 低轮廓载体(100)将非晶片形成装置(例如集成电路芯片,薄膜头结构,一个或多个模制阵列封装等)磁性地保持在机加工的凹部(105,107)中 或以其他方式形成在薄型载体(100)中。

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