The invention relations to a fixture for mounting a cantilever bean probe onto a scanning force microscopy. The fixture comprises a wedge-shaped block, a magnet, a fixture body and a fastening minor bolt; wherein the lower half of the fixture body is a cylinder, and a lug is arranged on one side band of the lower half; an open slot extending up to the inner wall of the cylinder is arranged on the lug. The lug is separated by the open slot into two pieces, wherein a thread hole is arranged on one piece, and an unthreaded hole is arranged on the other. A semicircular platform is arranged in an inner circle on the side of upper half of the fixture body where the lug is arranged. A groove is arranged along the radial direction from the circle center of the semicircular platform; a through groove with central symmetry is arranged at the bottom of the semicircular platform, the through groove is of the same width as that of the wedge-shaped block, as well as of the same thickness as that of the upper bottom-border of the wedge-shaped block. The wedge-shaped block is embedded into the through groove. A narrow slot is arranged on the outer fringe at the border of the upper half and the lower half extending along the lug towards the center of the fixture body. When assembled onto the scanner of a scanning force microscopy, the fixture has the advantages of precise position, excellent reliability and repeatability under long-term frequent usage, easy replacement of the cantilever beam and the probe, and capability of front-rear position adjustment along the direction of the cantilever beam.