The invention relates to a comprehensive test sample rod for double-shaft tilting in-situ force and electric property of a transmission electron microscope, belonging to the researching field of in-situ measurement of transmission electron microscope accessories and nanometer materials. The comprehensive test sample rod comprises a self-designed transmission electron microscope sample rod, a force/electric property sensor, a pressing sheet, a front end of sample rod and a sensor carrier, wherein the force/electric property sensor is fixed on the sensor carrier at the front end of sample rod through the pressing sheet; the sensor carrier is connected to the front end of sample rod through rotating shafts located on two sides and can rotate around the two rotating shafts in a plane verticalto the front end of sample rod (namely rotating for +/-30 degrees around Y shafts); and electrodes of the force/electric property sensor are connected to the electrodes on the two sides of the front end of the sample rod through the pressing sheet and are connected to an external test device through leads in the sample rod, thereby realizing the in-plane loading (in a sensor plane) of a force/electric signal and the feedback real-time monitoring. The comprehensive test sample rod can be used for tilting a searching sample to be under a low-index positive belt shaft, thereby realizing in-situ atomic scale observation while acquiring force/electric comprehensive property parameters.