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发明授权
CN103189956B 延长离子源寿命的方法 有权 复审申请

延长离子源寿命的方法
摘要：
本发明部分地涉及防止或减少在半导体及微电子制造中使用的离子注入机的离子源组件中形成及/或积聚沉积物的方法。所述离子源组件包括电离室及一个或一个以上含于所述电离室内的组件。所述方法涉及将掺杂剂气体引入所述电离室中，其中，所述掺杂剂气体具有足以防止或减少在电离期间形成氟离子/氟自由基的组成。随后在足以防止或减少在所述电离室的内部及/或在所述一个或一个以上含于所述电离室内的组件上形成及/或积聚沉积物的条件下使所述掺杂剂气体电离。所述沉积物不利地影响所述离子注入机的正常操作，从而造成频繁停工时间且减少工具利用。
摘要（英）：

This invention relates in part to a method for preventing or reducing the formation and/or accumulation of deposits in an ion source component of an ion implanter used in semiconductor and microelectronic manufacturing. The ion source component includes an ionization chamber and one or more components contained within the ionization chamber. The method involves introducing into the ionization chamber a dopant gas, wherein the dopant gas has a composition sufficient to prevent or reduce the formation of fluorine ions/radicals during ionization. The dopant gas is then ionized under conditions sufficient to prevent or reduce the formation and/or accumulation of deposits on the interior of the ionization chamber and/or on the one or more components contained within the ionization chamber. The deposits adversely impact the normal operation of the ion implanter causing frequent down time and reducing tool utilization.

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