The invention relates to a shape memory effect-based in-situ uniaxial tensile deformation device for a transmission electron microscope; the in-situ dynamic recording can be carried out on microstructure evolution in the nanometer material deformation process by utilizing the shape memory effect-based in-situ uniaxial tensile deformation device and combining the microstructure analysis of the transmission electron microscope; the shape memory effect-based in-situ uniaxial tensile deformation device belongs to the field of nanometer material mechanical property-microstructure integration in-situ representation. The tensile deformation device consists of a driving device, a support device and a tension-pressure conversion device. The driving force of the tensile deformation device is provided with a memory alloy spring; the support device is a metal ring; the tension-pressure conversion device is obtained by a microfabrication technique; the pressure which is applied to the conversion device by the memory alloy spring is converted into the drawing force for a sample. The in-plane loading for the material within the specific temperature range can be realized by regulating and controlling the beginning temperature and the end temperature of memory alloy martensite phase transformation. The biaxial tilting rotation function of a sample rod of the transmission electron microscope is not influenced by the tensile deformation device, so that in-situ dynamic observation for the microstructure evolution in the deformation process at the atomic scale can be realized.