The invention discloses a method device for testing the Seebeck coefficient of a film thermoelectric material, relates to a special method or equipment for detecting a thermoelectric semiconductor apparatus or a component of the thermoelectric semiconductor apparatus, and particularly relates to a method and device for testing the Seebeck coefficient of a film thermoelectric semiconductor material. The test device comprises a test end module, a heating module and a data collection module; an adjustable constant current source is adopted to control a strip-shaped ceramic heating plate to control the temperature difference at two ends of a to-be-tested sample; a filiform electrode in linear contact with a to-be-tested sample along the equipotential line direction is arranged on the test end module; a temperature difference electrodynamic potential signal is collected through the filiform electrode and then converted into a digital signal through the data collection module, and the digital signal is transmitted to a computer. By adopting the method disclosed by the invention, a measurement error caused by the material edge effect and bad contact with a sampling point can be avoided, the distance of the filiform electrode, and the position of the strip-shaped ceramic heating plate can be set according to the specification of a to-be-tested sample, and the problem that the existing test module cannot test samples with different specifications and dimensions is solved.