The invention discloses a system for acquiring trap parameters of solid dielectric material. The system comprises a constant temperature box, a three-electrode corona charging system, a surface potential measurement system, a rotary support system and a temperature control system; the three-electrode corona charging system, the surface potential measurement system, the rotary support system and the temperature control system are arranged within the constant temperature box. The three-electrode corona charging system comprises a plurality of needle electrodes and a meal disc electrode; the needle electrodes are coaxially arranged from top to bottom; the metal disc electrode is grounded. The surface potential measurement system comprises a capacitive static probe disposed on an adjustable insulating holder. The rotary support system comprises an insulating support; a metal turnplate and a metal heating box are arranged on the upper surface of an aluminum plate. The temperature control system comprises a first heater and a second heater. The system is applicable to the acquisition of parameters, such as trap level and trap density, of the solid dielectric material and has the advantages of wide range of application, high measurement precision and simplicity and convenience in operation, and an effective analysis method is provided for the research on surface electrification of the solid dielectric material, surface flashover and the like.