利索-全球专利检索

  1. 登录
  2. 注册
发明授权
CN104272094B 缺陷判定装置、放射线摄像系统及缺陷判定方法 有权

缺陷判定装置、放射线摄像系统及缺陷判定方法
摘要：
本发明提供一种缺陷判定装置、放射线摄像系统及缺陷判定方法。图像处理装置(20)根据由对透过了作为被检查对象物的产品的放射线进行检测的放射线摄像装置得到的检测图像数据，判定产品有无缺陷。图像处理装置(20)基于由预先存储在DB存储部(36)中的特征数据所表示的产品特征的形状，确定检测图像数据中的产品特征的位置，将已确定的检测图像数据中的产品特征作为基准来提取候补缺陷，并基于由预先存储在DB存储部(36)中的缺陷特性DB所表示的产品缺陷的特性量和候补缺陷的特性量，判定产品有无缺陷。
摘要（英）：

With an image processing device, a presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device, a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a storage portion in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by a defect characteristic stored in the storage portion in advance and characteristic quantities of the defect candidates.

公开/授权文献
0/0