The invention discloses a torsion ring for microwave device testing, and relates to the technical field of semiconductor device testing. The cross section of the outer ring wall of the torsion ring is circular. The cross section of the inner ring wall of the torsion ring is hexagonal. The inner ring wall and the outer ring wall of the torsion ring are matched with microwave device testing clamp input and output coaxial connector terminals in appearance and size. The torsion ring is made of polytetrafluoroethylene materials. Due to the fact that the polytetrafluoroethylene torsion ring with a reticulate structure is adopted, the problem that a testing clamp is not in tight connection in the testing process is successfully solved, the device testing stability, accuracy and non-destruction are ensured, the manufacturing cost is low, the torsion ring is easy to obtain, and it is ensured that related scientific research and production can be smoothly carried out.