Provided is to manage distribution of a product equipped with a component using dissimilarity on a surface of the component caused by differences between parameters in a manufacturing device and a manufacturing step. In the present invention, clustering a distribution information log database in which an image feature of a pattern formed on a surface of a component is related with at least one of product information regarding a product equipped with the component and distribution information regarding distribution of the product, based on the image feature; and analyzing, using statistical processing, one or both of the distribution information and product information related with the image feature belonging to each group obtained by the clustering.