The present invention discloses a YE on-line detection management and control method. The method comprises the steps of sampling the semiconductor products passing the production equipment according to a set YE sampling rate, determining the equipment defect risk grade by an equipment defect risk grade quantification assessment means, deciding the YE on-line defect detection priorities of the sampled semiconductor products according to the equipment defect risk grade to carry out the subsequent equipment defect detection, then adjusting a YE sampling rate, the YE on-line defect detection priorities, an equipment defect risk grade quantification assessment parameter, a production equipment defect detection rate according to the good and bad equipment defect detection results. The YE on-line detection management and control method of the present invention optimizes the YE sampling rate, the YE on-line defect detection priorities, the equipment defect risk grade quantification assessment parameter and the production equipment defect detection rate in the YE on-line defect detection according to each time of detection result, thereby improving the detection efficiency of a YE on-line detection board, and reducing the defect risk of a production board.