The present invention provides a semiconductor device configured to restrain cost up and generation of malfunction with high reliability. The semiconductor device includes: a first electrode; a second electrode; a first semiconductor region of a first conductive type arranged between the first electrode and the second electrode; a second semiconductor region of a second conductive type arranged between the first semiconductor region and the second electrode; a third semiconductor region of a first conductive type between the second semiconductor device and the second electrode, the third semiconductor region having impurity concentration higher than the impurity concentration of the first semiconductor region; a third electrode connected to the third semiconductor region, the second semiconductor region and the first semiconductor region; and a capacitance element portion having a fourth electrode electrically connected to the second electrode, a fifth electrode electrically connected to the third electrode, and a second insulating film arranged between the fourth electrode and the fifth electrode.